{"id":"https://openalex.org/W1568604794","doi":"https://doi.org/10.1109/test.2004.1387423","title":"Testing a secure device: high coverage with very low observability","display_name":"Testing a secure device: high coverage with very low observability","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W1568604794","doi":"https://doi.org/10.1109/test.2004.1387423","mag":"1568604794"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387423","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387423","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024488379","display_name":"L. Sourgen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"L. Sourgen","raw_affiliation_strings":["STMicroelectronics, France","STMicroelectron., France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectron., France","institution_ids":["https://openalex.org/I4210104693"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5024488379"],"corresponding_institution_ids":["https://openalex.org/I4210104693"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06558248,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1415","last_page":"1415"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9628999829292297,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9628999829292297,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9272000193595886,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9165999889373779,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/firmware","display_name":"Firmware","score":0.8967594504356384},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.7649335861206055},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.7317121028900146},{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.7217466235160828},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7083219289779663},{"id":"https://openalex.org/keywords/information-leakage","display_name":"Information leakage","score":0.6159366965293884},{"id":"https://openalex.org/keywords/smart-card","display_name":"Smart card","score":0.6123467683792114},{"id":"https://openalex.org/keywords/advanced-encryption-standard","display_name":"Advanced Encryption Standard","score":0.5516600608825684},{"id":"https://openalex.org/keywords/implementation","display_name":"Implementation","score":0.5299609303474426},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4460742771625519},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4379420578479767},{"id":"https://openalex.org/keywords/encryption","display_name":"Encryption","score":0.3191933035850525},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.2895260751247406},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.21181857585906982}],"concepts":[{"id":"https://openalex.org/C67212190","wikidata":"https://www.wikidata.org/wiki/Q104851","display_name":"Firmware","level":2,"score":0.8967594504356384},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.7649335861206055},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.7317121028900146},{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.7217466235160828},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7083219289779663},{"id":"https://openalex.org/C2779201187","wikidata":"https://www.wikidata.org/wiki/Q2775060","display_name":"Information leakage","level":2,"score":0.6159366965293884},{"id":"https://openalex.org/C110406131","wikidata":"https://www.wikidata.org/wiki/Q41349","display_name":"Smart card","level":2,"score":0.6123467683792114},{"id":"https://openalex.org/C94520183","wikidata":"https://www.wikidata.org/wiki/Q190746","display_name":"Advanced Encryption Standard","level":3,"score":0.5516600608825684},{"id":"https://openalex.org/C26713055","wikidata":"https://www.wikidata.org/wiki/Q245962","display_name":"Implementation","level":2,"score":0.5299609303474426},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4460742771625519},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4379420578479767},{"id":"https://openalex.org/C148730421","wikidata":"https://www.wikidata.org/wiki/Q141090","display_name":"Encryption","level":2,"score":0.3191933035850525},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.2895260751247406},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.21181857585906982},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1387423","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387423","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2046459260","https://openalex.org/W2765830098","https://openalex.org/W2967463586","https://openalex.org/W2074679142","https://openalex.org/W1971989957","https://openalex.org/W2517338020","https://openalex.org/W3157641275","https://openalex.org/W4312300846","https://openalex.org/W2810250611","https://openalex.org/W2892344663"],"abstract_inverted_index":{"Secure":[0,72],"microcontrollers":[1],"used":[2],"in":[3],"smart":[4],"card,":[5],"are":[6,48,61],"small,":[7],"cost":[8],"effective,":[9],"system":[10],"on":[11,50,67],"chip":[12],"including":[13],"a":[14,36],"mixtures":[15],"of":[16,52],"standard":[17,53],"CPU,":[18],"memories":[19],"and":[20,57,69],"dedicated":[21,79],"functions":[22],"added":[23],"to":[24,43],"protect":[25],"the":[26,33],"circuits":[27],"against":[28],"leakage":[29],"or":[30,77],"tampering.":[31],"Testing":[32],"device":[34],"require":[35],"high":[37],"coverage":[38],"while":[39],"offering":[40],"no":[41],"access":[42],"internal":[44],"information.":[45],"Today":[46],"solutions":[47],"based":[49,66],"combination":[51],"structural":[54],"testing":[55],"(scan)":[56],"functional":[58],"testing.":[59],"Both":[60],"usually":[62],"using":[63],"BIST":[64],"solutions,":[65],"hardware":[68],"firmware":[70],"implementations.":[71],"devices":[73],"includes":[74],"special":[75],"antileakage":[76],"antitampering":[78],"functions.":[80]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}