{"id":"https://openalex.org/W1602900731","doi":"https://doi.org/10.1109/test.2004.1387419","title":"Security vs. test quality: can we really only have one at a time?","display_name":"Security vs. test quality: can we really only have one at a time?","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W1602900731","doi":"https://doi.org/10.1109/test.2004.1387419","mag":"1602900731"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387419","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387419","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044629739","display_name":"Erik Jan Marinissen","orcid":"https://orcid.org/0000-0002-5058-8303"},"institutions":[{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"E.J. Marinissen","raw_affiliation_strings":["Philips Research, Eindhoven, Netherlands","Erik Jan Marinissen#TAB#"],"affiliations":[{"raw_affiliation_string":"Philips Research, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I4210122849"]},{"raw_affiliation_string":"Erik Jan Marinissen#TAB#","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5044629739"],"corresponding_institution_ids":["https://openalex.org/I4210122849"],"apc_list":null,"apc_paid":null,"fwci":0.2638,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.56651565,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1411","last_page":"1411"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.850600004196167,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.850600004196167,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.7815999984741211,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.7392593622207642},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6850830316543579},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.6757792234420776},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.530906081199646},{"id":"https://openalex.org/keywords/copying","display_name":"Copying","score":0.5091459155082703},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.47613146901130676},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.44187384843826294},{"id":"https://openalex.org/keywords/controllability","display_name":"Controllability","score":0.43746957182884216},{"id":"https://openalex.org/keywords/emulation","display_name":"Emulation","score":0.41295385360717773},{"id":"https://openalex.org/keywords/data-integrity","display_name":"Data integrity","score":0.41026565432548523},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.3124142289161682},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15187332034111023},{"id":"https://openalex.org/keywords/law","display_name":"Law","score":0.12006744742393494}],"concepts":[{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.7392593622207642},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6850830316543579},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.6757792234420776},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.530906081199646},{"id":"https://openalex.org/C2779151265","wikidata":"https://www.wikidata.org/wiki/Q1156791","display_name":"Copying","level":2,"score":0.5091459155082703},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.47613146901130676},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.44187384843826294},{"id":"https://openalex.org/C48209547","wikidata":"https://www.wikidata.org/wiki/Q1331104","display_name":"Controllability","level":2,"score":0.43746957182884216},{"id":"https://openalex.org/C149810388","wikidata":"https://www.wikidata.org/wiki/Q5374873","display_name":"Emulation","level":2,"score":0.41295385360717773},{"id":"https://openalex.org/C33762810","wikidata":"https://www.wikidata.org/wiki/Q461671","display_name":"Data integrity","level":2,"score":0.41026565432548523},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.3124142289161682},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15187332034111023},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.12006744742393494},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/test.2004.1387419","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387419","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},{"id":"pmh:877064","is_oa":false,"landing_page_url":"http://library.tue.nl/csp/dare/LinkToRepository.csp?recordnumber=877064","pdf_url":null,"source":{"id":"https://openalex.org/S4406923046","display_name":"TU/e Research Portal (Eindhoven University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISBN:0-7803-8580-2","raw_type":"Part of book or chapter of book"},{"id":"pmh:oai:library.tue.nl:872266","is_oa":false,"landing_page_url":"http://repository.tue.nl/872266","pdf_url":null,"source":{"id":"https://openalex.org/S4406923046","display_name":"TU/e Research Portal (Eindhoven University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISBN:0-7803-8580-2","raw_type":"Part of book or chapter of book"},{"id":"pmh:oai:library.tue.nl:877064","is_oa":false,"landing_page_url":"http://repository.tue.nl/877064","pdf_url":null,"source":{"id":"https://openalex.org/S4406923046","display_name":"TU/e Research Portal (Eindhoven University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISBN:0-7803-8580-2","raw_type":"Part of book or chapter of book"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.550000011920929,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2150046587","https://openalex.org/W2142405811","https://openalex.org/W2114980936","https://openalex.org/W2164493372","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2164349885","https://openalex.org/W1768820276"],"abstract_inverted_index":{"Summary":[0],"form":[1],"only":[2,124],"given.":[3],"Increasingly,":[4],"chips":[5,140],"are":[6,182],"being":[7],"utilized":[8],"in":[9,45,67,151],"applications":[10],"where":[11],"security":[12],"is":[13,23,31,71,96,131],"a":[14,127],"key":[15],"aspect:":[16],"banking,":[17],"price":[18],"tagging,":[19],"pay-tv,":[20],"etc.":[21],"Security":[22,33],"important,":[24],"as":[25,35,43,56],"privacy,":[26],"personal":[27,149],"integrity,":[28],"and":[29,38,89,106,108,120,170,179],"money":[30,147],"involved.":[32],"requires":[34],"little":[36],"observability":[37,90,107],"controllability":[39,88,105],"of":[40,61,91,138],"on-chip":[41,92],"data":[42,150],"possible,":[44],"order":[46],"to":[47,98,101],"withstand":[48],"even":[49],"advanced":[50],"high-tech":[51],"hackers.":[52],"In":[53,153],"addition,":[54],"we":[55,122,143,157],"IC":[57],"design":[58,69],"community":[59],"want":[60],"course":[62],"that":[63,130],"our":[64,145],"intellectual":[65],"property":[66],"the":[68,82,103,132,135,162],"itself":[70],"protected":[72],"from":[73,161,168],"copying":[74],"by":[75],"others.":[76],"Good":[77],"manufacturing":[78],"test":[79,112,171],"quality":[80,137],"on":[81,86,141],"other":[83],"hand":[84],"depends":[85],"good":[87],"data.":[93],"Design-for-testability":[94],"hardware":[95],"added":[97],"most":[99],"ICs":[100],"enhance":[102],"internal":[104],"hence":[109],"enable":[110],"high":[111],"quality.":[113],"Are":[114],"these":[115],"two":[116],"aspects":[117],"indeed":[118],"contradictory,":[119],"can":[121],"have":[123],"one":[125],"at":[126],"time?":[128],"If":[129],"case,":[133],"isn't":[134],"product":[136],"secure":[139,163],"which":[142],"store":[144],"virtual":[146],"or":[148],"jeopardy?":[152],"this":[154,177],"panel":[155],"session,":[156],"discuss":[158],"with":[159],"representatives":[160],"industry":[164],"(who":[165],"typically":[166],"hide":[167],"publicity)":[169],"solution":[172],"providers":[173],"how":[174],"they":[175],"untie":[176],"knot,":[178],"what":[180],"challenges":[181],"still":[183],"ahead.":[184]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}