{"id":"https://openalex.org/W2160026778","doi":"https://doi.org/10.1109/test.2004.1387413","title":"Testing high resolution ADCs with low resolution/accuracy deterministic dynamic element matched DACs","display_name":"Testing high resolution ADCs with low resolution/accuracy deterministic dynamic element matched DACs","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W2160026778","doi":"https://doi.org/10.1109/test.2004.1387413","mag":"2160026778"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387413","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387413","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063888012","display_name":"Hanjun Jiang","orcid":"https://orcid.org/0000-0003-4911-0748"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Hanjun Jiang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075927830","display_name":"B. Olleta","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. Olleta","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101873076","display_name":"Degang Chen","orcid":"https://orcid.org/0000-0002-5938-6329"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Degang Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108357375","display_name":"R.L. Geiger","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R.L. Geiger","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5063888012"],"corresponding_institution_ids":["https://openalex.org/I173911158"],"apc_list":null,"apc_paid":null,"fwci":0.582,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.71871521,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1379","last_page":"1388"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.7654687166213989},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.643889307975769},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6197859644889832},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6179288029670715},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.46282535791397095},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4447779059410095},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2174314558506012},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08650898933410645},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08589747548103333}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.7654687166213989},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.643889307975769},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6197859644889832},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6179288029670715},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.46282535791397095},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4447779059410095},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2174314558506012},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08650898933410645},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08589747548103333},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1387413","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387413","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W1509148781","https://openalex.org/W1550816954","https://openalex.org/W1555875285","https://openalex.org/W1594101521","https://openalex.org/W1604098070","https://openalex.org/W1960305169","https://openalex.org/W1973094521","https://openalex.org/W1998284495","https://openalex.org/W2012846466","https://openalex.org/W2046213720","https://openalex.org/W2070986562","https://openalex.org/W2084128131","https://openalex.org/W2100884184","https://openalex.org/W2103367702","https://openalex.org/W2117768990","https://openalex.org/W2121500293","https://openalex.org/W2124912253","https://openalex.org/W2125626824","https://openalex.org/W2136327241","https://openalex.org/W2137446533","https://openalex.org/W2138745870","https://openalex.org/W2154916972","https://openalex.org/W2157024459","https://openalex.org/W2157049251","https://openalex.org/W2158234915","https://openalex.org/W2159024757","https://openalex.org/W2159067451","https://openalex.org/W2169349592","https://openalex.org/W2170274989","https://openalex.org/W2174745674","https://openalex.org/W2225956229","https://openalex.org/W2537264164","https://openalex.org/W3103339143","https://openalex.org/W4249261768","https://openalex.org/W6671256958","https://openalex.org/W6677689954","https://openalex.org/W6683178885"],"related_works":["https://openalex.org/W2023858428","https://openalex.org/W4247324130","https://openalex.org/W2538259895","https://openalex.org/W2126963364","https://openalex.org/W4400804331","https://openalex.org/W2218509615","https://openalex.org/W2051287254","https://openalex.org/W171113498","https://openalex.org/W2124661899","https://openalex.org/W2168668096"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,31],"deterministic":[4],"dynamic":[5],"element":[6],"matching":[7],"(DDEM)":[8],"approach":[9],"which":[10],"is":[11,57],"applied":[12],"to":[13,17,37,59],"low":[14],"precision":[15],"DACs":[16],"generate":[18],"stimulus":[19],"signals":[20],"for":[21,81],"ADC":[22,42],"testing.":[23],"Both":[24],"simulation":[25],"results":[26,29,65],"and":[27,87],"experimental":[28],"from":[30],"fabricated":[32],"DDEM":[33,48,76],"DAC":[34,49],"are":[35],"presented":[36],"verify":[38],"the":[39,63,68],"performance.":[40],"The":[41,75],"testing":[43],"performance":[44],"of":[45],"an":[46],"8-bit":[47],"(linearity":[50],"less":[51],"than":[52,62],"5":[53],"bits":[54],"without":[55],"DDEM)":[56],"comparable":[58],"or":[60],"better":[61],"best":[64],"reported":[66],"in":[67,83],"literature":[69],"using":[70],"on-chip":[71],"linear":[72],"ramp":[73],"generators.":[74],"technique":[77],"offers":[78],"great":[79],"potential":[80],"use":[82],"both":[84],"production":[85],"test":[86],"built-in-self-test(BIST)":[88],"environments.":[89]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}