{"id":"https://openalex.org/W1623544522","doi":"https://doi.org/10.1109/test.2004.1387406","title":"Jitter generation and measurement for test of multi-Gbps serial IO","display_name":"Jitter generation and measurement for test of multi-Gbps serial IO","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W1623544522","doi":"https://doi.org/10.1109/test.2004.1387406","mag":"1623544522"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387406","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387406","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109341425","display_name":"S. Tabatabaei","orcid":"https://orcid.org/0009-0007-2632-9364"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"S. Tabatabaei","raw_affiliation_strings":["Guide Technology, Sunnyvale, CA, USA","Guide Technol., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Guide Technology, Sunnyvale, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Guide Technol., Sunnyvale, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060483778","display_name":"Man-Ki Lee","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Lee","raw_affiliation_strings":["Guide Technology, Sunnyvale, CA, USA","Guide Technol., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Guide Technology, Sunnyvale, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Guide Technol., Sunnyvale, CA, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002466572","display_name":"F. Ben-Zeev","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"F. Ben-Zeev","raw_affiliation_strings":["Guide Technology, Sunnyvale, CA, USA","Guide Technol., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Guide Technology, Sunnyvale, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Guide Technol., Sunnyvale, CA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5109341425"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.7785,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.84301333,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1313","last_page":"1321"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9743272662162781},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7321697473526001},{"id":"https://openalex.org/keywords/oscilloscope","display_name":"Oscilloscope","score":0.7297560572624207},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5177128314971924},{"id":"https://openalex.org/keywords/serial-communication","display_name":"Serial communication","score":0.4949111342430115},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.46709248423576355},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4348128139972687},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.40528392791748047},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3589387536048889},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.20861190557479858},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12160217761993408},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1035328209400177}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9743272662162781},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7321697473526001},{"id":"https://openalex.org/C184026988","wikidata":"https://www.wikidata.org/wiki/Q174320","display_name":"Oscilloscope","level":3,"score":0.7297560572624207},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5177128314971924},{"id":"https://openalex.org/C51707140","wikidata":"https://www.wikidata.org/wiki/Q518280","display_name":"Serial communication","level":2,"score":0.4949111342430115},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.46709248423576355},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4348128139972687},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.40528392791748047},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3589387536048889},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.20861190557479858},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12160217761993408},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1035328209400177}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1387406","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387406","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1485868897","https://openalex.org/W1600620169","https://openalex.org/W1870817321","https://openalex.org/W2124283149","https://openalex.org/W2126574816","https://openalex.org/W2162364319","https://openalex.org/W2169790941"],"related_works":["https://openalex.org/W1972598373","https://openalex.org/W2364019159","https://openalex.org/W1489049788","https://openalex.org/W2243648136","https://openalex.org/W2370764016","https://openalex.org/W4387485749","https://openalex.org/W2387262487","https://openalex.org/W2073837942","https://openalex.org/W3042000528","https://openalex.org/W2047925921"],"abstract_inverted_index":{"The":[0],"advent":[1],"of":[2,33,71,88,133],"serial":[3],"communication":[4],"links":[5],"in":[6,13,38,79],"chip-to-chip":[7],"and":[8,18,25,35,40,57,77,94,103,117,122],"system-to-system":[9],"applications":[10,72],"has":[11],"resulted":[12],"intense":[14],"focus":[15],"on":[16],"jitter":[17,23,37,47,105,114],"BER":[19],"testing":[20],"techniques,":[21],"including":[22,43],"generation":[24,49],"measurement":[26,106,115,136],"methodologies.":[27],"We":[28,83],"describe":[29],"techniques":[30,63],"for":[31,55,67,101,131],"injection":[32,60],"random":[34],"deterministic":[36],"controlled":[39],"programmable":[41],"fashion,":[42],"a":[44,68,80],"novel":[45],"data-dependent":[46],"(DDJ)":[48],"method":[50],"that":[51],"eliminates":[52],"the":[53,86,120,134],"need":[54],"bulky":[56],"difficult-to-control":[58],"DDJ":[59],"filters.":[61],"These":[62],"can":[64,98],"be":[65,99],"employed":[66],"wide":[69],"range":[70],"with":[73],"different":[74],"bit":[75],"rates":[76],"patterns":[78],"single":[81],"setup.":[82],"also":[84],"introduce":[85],"concept":[87],"continuous":[89],"time":[90],"interval":[91],"analyzer":[92],"(CTIA)":[93],"demonstrate":[95],"how":[96],"it":[97],"used":[100,128],"fast":[102],"accurate":[104],"without":[107],"any":[108],"trigger":[109],"signal.":[110],"Subsequently,":[111],"we":[112],"present":[113],"methodologies":[116],"results":[118],"using":[119],"real-time":[121],"equivalent-time":[123],"sampling":[124],"oscilloscopes,":[125],"which":[126],"are":[127],"as":[129],"benchmarks":[130],"verification":[132],"CTIA":[135],"accuracy.":[137]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}