{"id":"https://openalex.org/W2162528988","doi":"https://doi.org/10.1109/test.2004.1387405","title":"Implementation of an economic jitter compliance test for a multi-gigabit device on ATE","display_name":"Implementation of an economic jitter compliance test for a multi-gigabit device on ATE","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W2162528988","doi":"https://doi.org/10.1109/test.2004.1387405","mag":"2162528988"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387405","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387405","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002889108","display_name":"G. H\u00e4nsel","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"G. Hansel","raw_affiliation_strings":["Infineon Technologies, Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies, Munich, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088559097","display_name":"K. Stieglbauer","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"K. Stieglbauer","raw_affiliation_strings":["Infineon Technologies, Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies, Munich, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059695019","display_name":"G. Schulze","orcid":null},"institutions":[{"id":"https://openalex.org/I4210129668","display_name":"Agilent Technologies (Germany)","ror":"https://ror.org/0355p2e87","country_code":"DE","type":"company","lineage":["https://openalex.org/I138285227","https://openalex.org/I4210129668"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"G. Schulze","raw_affiliation_strings":["Agilent Technologies, Inc., Boblingen, Germany"],"affiliations":[{"raw_affiliation_string":"Agilent Technologies, Inc., Boblingen, Germany","institution_ids":["https://openalex.org/I4210129668"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005298960","display_name":"Jose Moreira","orcid":"https://orcid.org/0000-0003-2574-0665"},"institutions":[{"id":"https://openalex.org/I4210129668","display_name":"Agilent Technologies (Germany)","ror":"https://ror.org/0355p2e87","country_code":"DE","type":"company","lineage":["https://openalex.org/I138285227","https://openalex.org/I4210129668"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J. Moreira","raw_affiliation_strings":["Agilent Technologies, Inc., Boblingen, Germany"],"affiliations":[{"raw_affiliation_string":"Agilent Technologies, Inc., Boblingen, Germany","institution_ids":["https://openalex.org/I4210129668"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5002889108"],"corresponding_institution_ids":["https://openalex.org/I137594350"],"apc_list":null,"apc_paid":null,"fwci":2.4898,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.89666696,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1303","last_page":"1312"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9767000079154968,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9751104116439819},{"id":"https://openalex.org/keywords/gigabit","display_name":"Gigabit","score":0.7519841194152832},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6156560182571411},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5429546236991882},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3847225308418274},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32809388637542725},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21778932213783264},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.18071824312210083}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9751104116439819},{"id":"https://openalex.org/C21922175","wikidata":"https://www.wikidata.org/wiki/Q3105497","display_name":"Gigabit","level":2,"score":0.7519841194152832},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6156560182571411},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5429546236991882},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3847225308418274},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32809388637542725},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21778932213783264},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.18071824312210083}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1387405","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387405","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1490491299","https://openalex.org/W1837437086","https://openalex.org/W2067722023","https://openalex.org/W2126574816","https://openalex.org/W2162364319","https://openalex.org/W2322398337","https://openalex.org/W6667825805"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W1522446673","https://openalex.org/W1485868897","https://openalex.org/W2155789024","https://openalex.org/W2086436170","https://openalex.org/W2109491806","https://openalex.org/W3213608175","https://openalex.org/W2058044441","https://openalex.org/W3117675750","https://openalex.org/W2109445684"],"abstract_inverted_index":{"State":[0],"of":[1,35,83,92,101],"the":[2,33,39,43,66,84,99],"art":[3],"communication":[4],"devices":[5],"combine":[6],"multiple":[7],"high-speed":[8],"interfaces":[9,37],"like":[10],"SFI4.2":[11],"and":[12,73,96],"XAUI":[13],"with":[14,107],"speeds":[15],"up":[16],"to":[17,32,52],"3.2":[18],"gigabits":[19],"per":[20,76],"second":[21],"(Gbps)":[22],"on":[23,42],"a":[24,60,81,89,102],"single":[25],"CMOS":[26],"chip.":[27,77],"One":[28],"key":[29],"parameter":[30,55],"common":[31],"specification":[34],"these":[36],"is":[38],"jitter":[40,87,93,104],"observed":[41],"transmitters.":[44],"Existing":[45],"automated":[46],"test":[47,58,74],"approaches":[48],"are":[49],"not":[50],"able":[51],"cover":[53],"this":[54],"during":[56],"production":[57],"at":[59],"reasonable":[61],"economical":[62],"performance,":[63],"determined":[64],"by":[65],"following":[67],"items:":[68],"capital":[69],"investment,":[70],"time-to-market":[71],"(TTM)":[72],"cost":[75],"This":[78],"work":[79],"includes":[80],"discussion":[82],"need":[85],"for":[86],"separation,":[88],"thorough":[90],"review":[91],"separation":[94,105],"algorithms":[95],"also":[97],"presents":[98],"results":[100],"specific":[103],"approach":[106],"an":[108],"at-speed":[109],"ATE":[110],"system.":[111]},"counts_by_year":[{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}