{"id":"https://openalex.org/W1515792080","doi":"https://doi.org/10.1109/test.2004.1387404","title":"Jitter models and measurement methods for high-speed serial interconnects","display_name":"Jitter models and measurement methods for high-speed serial interconnects","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W1515792080","doi":"https://doi.org/10.1109/test.2004.1387404","mag":"1515792080"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387404","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387404","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063139113","display_name":"A. Kuo","orcid":null},"institutions":[{"id":"https://openalex.org/I141945490","display_name":"University of British Columbia","ror":"https://ror.org/03rmrcq20","country_code":"CA","type":"education","lineage":["https://openalex.org/I141945490"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"A. Kuo","raw_affiliation_strings":["SoC Research Group, University of British Columbia, Canada","SoC Res. Group, British Columbia Univ., Vancouver, BC, Canada"],"affiliations":[{"raw_affiliation_string":"SoC Research Group, University of British Columbia, Canada","institution_ids":["https://openalex.org/I141945490"]},{"raw_affiliation_string":"SoC Res. Group, British Columbia Univ., Vancouver, BC, Canada","institution_ids":["https://openalex.org/I141945490"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090149701","display_name":"T. Farahmand","orcid":null},"institutions":[{"id":"https://openalex.org/I141945490","display_name":"University of British Columbia","ror":"https://ror.org/03rmrcq20","country_code":"CA","type":"education","lineage":["https://openalex.org/I141945490"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"T. Farahmand","raw_affiliation_strings":["SoC Research Group, University of British Columbia, Canada","SoC Res. Group, British Columbia Univ., Vancouver, BC, Canada"],"affiliations":[{"raw_affiliation_string":"SoC Research Group, University of British Columbia, Canada","institution_ids":["https://openalex.org/I141945490"]},{"raw_affiliation_string":"SoC Res. Group, British Columbia Univ., Vancouver, BC, Canada","institution_ids":["https://openalex.org/I141945490"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018247332","display_name":"Ning Ou","orcid":null},"institutions":[{"id":"https://openalex.org/I141945490","display_name":"University of British Columbia","ror":"https://ror.org/03rmrcq20","country_code":"CA","type":"education","lineage":["https://openalex.org/I141945490"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"N. Ou","raw_affiliation_strings":["SoC Research Group, University of British Columbia, Canada","SoC Res. Group, British Columbia Univ., Vancouver, BC, Canada"],"affiliations":[{"raw_affiliation_string":"SoC Research Group, University of British Columbia, Canada","institution_ids":["https://openalex.org/I141945490"]},{"raw_affiliation_string":"SoC Res. Group, British Columbia Univ., Vancouver, BC, Canada","institution_ids":["https://openalex.org/I141945490"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109341425","display_name":"S. Tabatabaei","orcid":"https://orcid.org/0009-0007-2632-9364"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Tabatabaei","raw_affiliation_strings":["Guide Technology, Sunnyvale, CA, USA","Guide Technology, Sunnyvale, CA#TAB#"],"affiliations":[{"raw_affiliation_string":"Guide Technology, Sunnyvale, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Guide Technology, Sunnyvale, CA#TAB#","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062724257","display_name":"A. Ivanov","orcid":"https://orcid.org/0000-0002-0882-6750"},"institutions":[{"id":"https://openalex.org/I141945490","display_name":"University of British Columbia","ror":"https://ror.org/03rmrcq20","country_code":"CA","type":"education","lineage":["https://openalex.org/I141945490"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"A. Ivanov","raw_affiliation_strings":["SoC Research Group, University of British Columbia, Canada","University of British Columbia"],"affiliations":[{"raw_affiliation_string":"SoC Research Group, University of British Columbia, Canada","institution_ids":["https://openalex.org/I141945490"]},{"raw_affiliation_string":"University of British Columbia","institution_ids":["https://openalex.org/I141945490"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5063139113"],"corresponding_institution_ids":["https://openalex.org/I141945490"],"apc_list":null,"apc_paid":null,"fwci":2.9026,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.90078555,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1295","last_page":"1302"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9858708381652832},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6557152271270752},{"id":"https://openalex.org/keywords/crosstalk","display_name":"Crosstalk","score":0.5297509431838989},{"id":"https://openalex.org/keywords/uncorrelated","display_name":"Uncorrelated","score":0.5264407396316528},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49138346314430237},{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.4108920097351074},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.29275286197662354},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19996324181556702},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15196746587753296},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12631237506866455},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.112408846616745},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.07304975390434265}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9858708381652832},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6557152271270752},{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.5297509431838989},{"id":"https://openalex.org/C169345407","wikidata":"https://www.wikidata.org/wiki/Q8216221","display_name":"Uncorrelated","level":2,"score":0.5264407396316528},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49138346314430237},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.4108920097351074},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.29275286197662354},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19996324181556702},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15196746587753296},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12631237506866455},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.112408846616745},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.07304975390434265}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2004.1387404","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387404","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.101.8098","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.101.8098","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.itcprogramdev.org/itc2004proc/Papers/PDFs/0046_1.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1481954123","https://openalex.org/W1546460110","https://openalex.org/W1872349506","https://openalex.org/W2124283149","https://openalex.org/W2126574816","https://openalex.org/W2132989621","https://openalex.org/W2167173403","https://openalex.org/W2168901237","https://openalex.org/W2288200779"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2315668284","https://openalex.org/W2155789024","https://openalex.org/W3213608175","https://openalex.org/W3117675750","https://openalex.org/W2141743053","https://openalex.org/W2109491806","https://openalex.org/W3095633856","https://openalex.org/W2058044441","https://openalex.org/W2343144621"],"abstract_inverted_index":{"Jitter":[0],"can":[1],"be":[2],"decomposed":[3],"into":[4],"several":[5],"subcomponents,":[6],"each":[7],"having":[8],"specific":[9],"sets":[10],"of":[11,24,59,78,85],"characteristics":[12],"and":[13,21,36,63,71,75],"root-causes.":[14],"This":[15],"work":[16],"focuses":[17],"on":[18,45,68],"describing":[19],"causes":[20,47],"measurement":[22,51,73],"methods":[23,52],"jitter":[25,34,50,81],"subcomponents.":[26],"We":[27],"first":[28],"describe":[29],"the":[30,69],"relationship":[31],"between":[32],"a":[33,43,83],"PDF":[35],"bit":[37],"error":[38],"rate":[39],"(BER)":[40],"followed":[41],"by":[42],"discussion":[44],"what":[46],"jitter.":[48],"Common":[49],"are":[53],"presented,":[54],"along":[55],"with":[56],"an":[57],"analysis":[58],"their":[60],"respective":[61],"advantages":[62],"disadvantages.":[64],"Our":[65],"recent":[66],"research":[67],"cause":[70],"practical":[72],"results":[74],"design":[76],"issues":[77],"bounded":[79],"uncorrelated":[80],"(BUJ),":[82],"subcomponent":[84],"jitter,":[86],"due":[87],"to":[88],"crosstalk,":[89],"is":[90],"also":[91],"presented.":[92]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":4}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}