{"id":"https://openalex.org/W1552973677","doi":"https://doi.org/10.1109/test.2004.1387392","title":"Time/area tradeoffs in testing hierarchical SOCs with hard mega-cores","display_name":"Time/area tradeoffs in testing hierarchical SOCs with hard mega-cores","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W1552973677","doi":"https://doi.org/10.1109/test.2004.1387392","mag":"1552973677"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387392","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387392","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088556682","display_name":"Qiang Xu","orcid":"https://orcid.org/0000-0001-6747-126X"},"institutions":[{"id":"https://openalex.org/I98251732","display_name":"McMaster University","ror":"https://ror.org/02fa3aq29","country_code":"CA","type":"education","lineage":["https://openalex.org/I98251732"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Qiang Xu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, McMaster University, Hamilton, ONT, Canada","Dept. of Electr. & Comput Eng., McMaster Univ., Hamilton, Ont., Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, McMaster University, Hamilton, ONT, Canada","institution_ids":["https://openalex.org/I98251732"]},{"raw_affiliation_string":"Dept. of Electr. & Comput Eng., McMaster Univ., Hamilton, Ont., Canada","institution_ids":["https://openalex.org/I98251732"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048457847","display_name":"Nicola Nicolici","orcid":"https://orcid.org/0000-0001-6345-5908"},"institutions":[{"id":"https://openalex.org/I98251732","display_name":"McMaster University","ror":"https://ror.org/02fa3aq29","country_code":"CA","type":"education","lineage":["https://openalex.org/I98251732"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"N. Nicolici","raw_affiliation_strings":["Department of Electrical and Computer Engineering, McMaster University, Hamilton, ONT, Canada","Dept. of Electr. & Comput Eng., McMaster Univ., Hamilton, Ont., Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, McMaster University, Hamilton, ONT, Canada","institution_ids":["https://openalex.org/I98251732"]},{"raw_affiliation_string":"Dept. of Electr. & Comput Eng., McMaster Univ., Hamilton, Ont., Canada","institution_ids":["https://openalex.org/I98251732"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5088556682"],"corresponding_institution_ids":["https://openalex.org/I98251732"],"apc_list":null,"apc_paid":null,"fwci":2.638,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.89507825,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1196","last_page":"1202"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mega","display_name":"Mega-","score":0.7964800596237183},{"id":"https://openalex.org/keywords/reuse","display_name":"Reuse","score":0.7886696457862854},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6590656042098999},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6415297985076904},{"id":"https://openalex.org/keywords/core","display_name":"Core (optical fiber)","score":0.5718798637390137},{"id":"https://openalex.org/keywords/constraint","display_name":"Constraint (computer-aided design)","score":0.4663139283657074},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4033437669277191},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2281029224395752},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.13288035988807678},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07716968655586243},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.06776151061058044}],"concepts":[{"id":"https://openalex.org/C2781078984","wikidata":"https://www.wikidata.org/wiki/Q107205","display_name":"Mega-","level":2,"score":0.7964800596237183},{"id":"https://openalex.org/C206588197","wikidata":"https://www.wikidata.org/wiki/Q846574","display_name":"Reuse","level":2,"score":0.7886696457862854},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6590656042098999},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6415297985076904},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.5718798637390137},{"id":"https://openalex.org/C2776036281","wikidata":"https://www.wikidata.org/wiki/Q48769818","display_name":"Constraint (computer-aided design)","level":2,"score":0.4663139283657074},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4033437669277191},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2281029224395752},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.13288035988807678},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07716968655586243},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.06776151061058044},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2004.1387392","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387392","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.118.9471","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.118.9471","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.itcprogramdev.org/itc2004proc/papers/pdfs/0042_1.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.47999998927116394}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1596724070","https://openalex.org/W1914493487","https://openalex.org/W2103799547","https://openalex.org/W2110129459","https://openalex.org/W2112420302","https://openalex.org/W2130430551","https://openalex.org/W2151243068","https://openalex.org/W2153301553","https://openalex.org/W2162086806","https://openalex.org/W2165642910","https://openalex.org/W2170533364","https://openalex.org/W2503952136","https://openalex.org/W4252472882","https://openalex.org/W6677206520","https://openalex.org/W6685238459"],"related_works":["https://openalex.org/W4385584191","https://openalex.org/W3112226121","https://openalex.org/W102059279","https://openalex.org/W3191105034","https://openalex.org/W2163047545","https://openalex.org/W4308491350","https://openalex.org/W2922464302","https://openalex.org/W949046406","https://openalex.org/W4254012600","https://openalex.org/W940051479"],"abstract_inverted_index":{"Motivated":[0],"by":[1],"the":[2,16,31,36,46,51,59],"presence":[3],"of":[4,20,50],"mega-cores":[5],"in":[6],"hierarchical":[7],"systems-on-a-chip,":[8],"This":[9],"work":[10],"describes":[11],"a":[12],"new":[13],"framework":[14],"for":[15,74],"design":[17],"space":[18],"exploration":[19],"multi-level":[21],"test":[22,62,71],"access":[23],"mechanisms.":[24],"Test":[25],"resources":[26],"are":[27],"placed":[28],"next":[29],"to":[30],"mega-core":[32],"wrappers,":[33],"which":[34],"removes":[35],"constraint":[37],"that":[38],"upper-level":[39],"TAM":[40,48],"width":[41,49],"must":[42],"be":[43],"wider":[44],"than":[45],"internal":[47],"mega-core.":[52],"The":[53],"proposed":[54],"solution":[55],"can":[56],"rapidly":[57],"analyze":[58],"tradeoffs":[60],"between":[61],"application":[63],"time":[64],"and":[65,68],"area":[66],"overhead":[67],"it":[69],"facilitates":[70],"data":[72],"reuse":[73],"hard":[75],"mega-cores.":[76]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}