{"id":"https://openalex.org/W2113302467","doi":"https://doi.org/10.1109/test.2004.1387388","title":"BER estimation for serial links based on jitter spectrum and clock recovery characteristics","display_name":"BER estimation for serial links based on jitter spectrum and clock recovery characteristics","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W2113302467","doi":"https://doi.org/10.1109/test.2004.1387388","mag":"2113302467"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387388","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387388","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078128275","display_name":"Dongwoo Hong","orcid":"https://orcid.org/0000-0002-8553-4276"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Dongwoo Hong","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA","Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082664384","display_name":"Chee-Kian Ong","orcid":null},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chee-Kian Ong","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA","Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077687075","display_name":"Kwang\u2010Ting Cheng","orcid":"https://orcid.org/0000-0002-3885-4912"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kwang-Ting Cheng","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA","Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5078128275"],"corresponding_institution_ids":["https://openalex.org/I154570441"],"apc_list":null,"apc_paid":null,"fwci":4.624,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.94741927,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"1","issue":null,"first_page":"1138","last_page":"1147"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9617776274681091},{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.8066263198852539},{"id":"https://openalex.org/keywords/data-recovery","display_name":"Data recovery","score":0.7177887558937073},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.715851902961731},{"id":"https://openalex.org/keywords/clock-recovery","display_name":"Clock recovery","score":0.6616489887237549},{"id":"https://openalex.org/keywords/spectral-efficiency","display_name":"Spectral efficiency","score":0.4202273190021515},{"id":"https://openalex.org/keywords/communications-system","display_name":"Communications system","score":0.4137260317802429},{"id":"https://openalex.org/keywords/serial-communication","display_name":"Serial communication","score":0.4115731716156006},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37697988748550415},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3683519959449768},{"id":"https://openalex.org/keywords/clock-signal","display_name":"Clock signal","score":0.3007253408432007},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.21881833672523499},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.19582915306091309},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15473467111587524},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.07472968101501465}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9617776274681091},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.8066263198852539},{"id":"https://openalex.org/C529754248","wikidata":"https://www.wikidata.org/wiki/Q1054772","display_name":"Data recovery","level":2,"score":0.7177887558937073},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.715851902961731},{"id":"https://openalex.org/C2779835379","wikidata":"https://www.wikidata.org/wiki/Q2348121","display_name":"Clock recovery","level":4,"score":0.6616489887237549},{"id":"https://openalex.org/C137246740","wikidata":"https://www.wikidata.org/wiki/Q583970","display_name":"Spectral efficiency","level":3,"score":0.4202273190021515},{"id":"https://openalex.org/C101765175","wikidata":"https://www.wikidata.org/wiki/Q577764","display_name":"Communications system","level":2,"score":0.4137260317802429},{"id":"https://openalex.org/C51707140","wikidata":"https://www.wikidata.org/wiki/Q518280","display_name":"Serial communication","level":2,"score":0.4115731716156006},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37697988748550415},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3683519959449768},{"id":"https://openalex.org/C137059387","wikidata":"https://www.wikidata.org/wiki/Q426882","display_name":"Clock signal","level":3,"score":0.3007253408432007},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.21881833672523499},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.19582915306091309},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15473467111587524},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.07472968101501465},{"id":"https://openalex.org/C54197355","wikidata":"https://www.wikidata.org/wiki/Q5782992","display_name":"Beamforming","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/test.2004.1387388","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387388","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-77811","is_oa":false,"landing_page_url":"http://repository.hkust.edu.hk/ir/Record/1783.1-77811","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference paper"},{"id":"pmh:oai:repository.ust.hk:1783.1-77811","is_oa":false,"landing_page_url":"http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=1089-3539&rft.volume=&rft.issue=&rft.date=2004&rft.spage=1138&rft.aulast=Hong&rft.aufirst=D.&rft.atitle=BER+estimation+for+serial+links+based+on+jitter+spectrum+and+clock+recovery+characteristics&rft.title=IEEE+International+Test+Conference+%28ITC%29","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference paper"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1490491299","https://openalex.org/W1546992623","https://openalex.org/W2021145888","https://openalex.org/W2034525900","https://openalex.org/W2061310904","https://openalex.org/W2126574816","https://openalex.org/W2136969326","https://openalex.org/W2144401740","https://openalex.org/W2167173403","https://openalex.org/W2288200779","https://openalex.org/W4232276540","https://openalex.org/W4241879879","https://openalex.org/W6632878484","https://openalex.org/W6659196990"],"related_works":["https://openalex.org/W2043253188","https://openalex.org/W2151679122","https://openalex.org/W2019391412","https://openalex.org/W2373248727","https://openalex.org/W2351742130","https://openalex.org/W2157571555","https://openalex.org/W1897666724","https://openalex.org/W73385798","https://openalex.org/W2886200888","https://openalex.org/W2626890257"],"abstract_inverted_index":{"High":[0],"performance":[1],"serial":[2],"communication":[3,38],"systems":[4,39],"often":[5],"require":[6],"the":[7,15,52,58,62,68,71,82,92,96],"bit":[8],"error":[9],"rate":[10],"(BER)":[11],"to":[12],"be":[13],"at":[14],"level":[16],"of":[17,51,65,70,95],"10/sup":[18],"-12/":[19],"or":[20],"below.":[21],"The":[22,54,77],"excessive":[23],"test":[24,84],"time":[25,85],"for":[26,46,86],"measuring":[27],"such":[28],"a":[29,33,43],"low":[30],"BER":[31,59,87],"is":[32],"major":[34],"hindrance":[35],"in":[36],"testing":[37],"cost-effectively.":[40],"We":[41],"propose":[42],"new":[44],"technique":[45,56],"accurate":[47],"and":[48,67,73],"efficient":[49],"estimation":[50],"BER.":[53],"proposed":[55],"estimates":[57],"based":[60],"on":[61],"spectral":[63],"information":[64],"jitter":[66],"characteristics":[69],"clock":[72],"data":[74],"recovery":[75],"circuit.":[76],"method":[78],"can":[79],"significantly":[80],"reduce":[81],"production":[83],"testing.":[88],"Simulation":[89],"results":[90],"demonstrate":[91],"potential":[93],"usefulness":[94],"method.":[97]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}