{"id":"https://openalex.org/W2295361767","doi":"https://doi.org/10.1109/test.2004.1387383","title":"How to bridge the gap between simulation and test","display_name":"How to bridge the gap between simulation and test","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W2295361767","doi":"https://doi.org/10.1109/test.2004.1387383","mag":"2295361767"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387383","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387383","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081257047","display_name":"Martin Zambaldi","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"M. Zambaldi","raw_affiliation_strings":["Corporate Development, Design Automation, Infineon Technologies, Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Corporate Development, Design Automation, Infineon Technologies, Munich, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046956677","display_name":"Wolfgang Ecker","orcid":"https://orcid.org/0000-0002-9362-8096"},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"W. Ecker","raw_affiliation_strings":["Corporate Development, Design Automation, Infineon Technologies, Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Corporate Development, Design Automation, Infineon Technologies, Munich, Germany","institution_ids":["https://openalex.org/I137594350"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5081257047"],"corresponding_institution_ids":["https://openalex.org/I137594350"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.27264031,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1091","last_page":"1099"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7529711723327637},{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.741931140422821},{"id":"https://openalex.org/keywords/bridge","display_name":"Bridge (graph theory)","score":0.5077865719795227},{"id":"https://openalex.org/keywords/adaptation","display_name":"Adaptation (eye)","score":0.46666258573532104},{"id":"https://openalex.org/keywords/reuse","display_name":"Reuse","score":0.42650002241134644},{"id":"https://openalex.org/keywords/logic-simulation","display_name":"Logic simulation","score":0.4184771180152893},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.3661051392555237},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3270754814147949},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.18044531345367432},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.16333529353141785},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14707538485527039},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.12491747736930847}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7529711723327637},{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.741931140422821},{"id":"https://openalex.org/C100776233","wikidata":"https://www.wikidata.org/wiki/Q2532492","display_name":"Bridge (graph theory)","level":2,"score":0.5077865719795227},{"id":"https://openalex.org/C139807058","wikidata":"https://www.wikidata.org/wiki/Q352374","display_name":"Adaptation (eye)","level":2,"score":0.46666258573532104},{"id":"https://openalex.org/C206588197","wikidata":"https://www.wikidata.org/wiki/Q846574","display_name":"Reuse","level":2,"score":0.42650002241134644},{"id":"https://openalex.org/C64859876","wikidata":"https://www.wikidata.org/wiki/Q173673","display_name":"Logic simulation","level":3,"score":0.4184771180152893},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.3661051392555237},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3270754814147949},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.18044531345367432},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.16333529353141785},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14707538485527039},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.12491747736930847},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1387383","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387383","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1550131357","https://openalex.org/W1979784624","https://openalex.org/W1998222344","https://openalex.org/W2103821321","https://openalex.org/W2106507440","https://openalex.org/W2119112693","https://openalex.org/W2130336743","https://openalex.org/W2141379495","https://openalex.org/W2143091636","https://openalex.org/W2151899112","https://openalex.org/W2160109399","https://openalex.org/W2163350036","https://openalex.org/W2183883265","https://openalex.org/W4238593383","https://openalex.org/W4239918599","https://openalex.org/W4245292706","https://openalex.org/W4251084993","https://openalex.org/W4252373676","https://openalex.org/W7043665758"],"related_works":["https://openalex.org/W1667647204","https://openalex.org/W2404647514","https://openalex.org/W4247536566","https://openalex.org/W4241418540","https://openalex.org/W2018477250","https://openalex.org/W3119814709","https://openalex.org/W1508895727","https://openalex.org/W2725786787","https://openalex.org/W1590965489","https://openalex.org/W1875930651"],"abstract_inverted_index":{"The":[0,80,94,160],"tester-related":[1],"simulation":[2,43,60,89,102],"environment":[3],"(TRSE)":[4],"and":[5,14,28,44,57,76,117,148,186,202,224],"applied":[6],"methodology":[7,204,225],"close":[8],"the":[9,18,21,26,31,34,40,115,122,127,157,165,168,180,190,196,219],"gap":[10],"between":[11],"physical":[12],"test":[13,29,45,92,143,200],"simulation.":[15],"Simulation":[16],"checks":[17,30],"correctness":[19,32],"of":[20,33,88,98,121,156,164,170,198],"implementation":[22],"with":[23,37,173,189],"respect":[24,38],"to":[25,39,182],"specification,":[27],"fabricated":[35],"product":[36],"implementation.":[41],"Unfortunately,":[42],"are":[46,138,227],"still":[47],"not":[48],"connected":[49],"in":[50,72,210],"a":[51,73,85,100,106,134,199,207,213],"smooth":[52],"verification":[53,193],"flow.":[54],"Test":[55],"cases":[56],"stimuli":[58,90],"from":[59,145],"cannot":[61],"be":[62,69,216],"directly":[63],"used":[64,70,140],"for":[65,91,114,130,141,149,152,218],"test.":[66],"They":[67],"may":[68],"only":[71],"restricted":[74],"way,":[75],"after":[77],"some":[78],"adaptation.":[79],"approach":[81],"presented":[82],"here":[83],"allows":[84],"better":[86],"reuse":[87],"issues.":[93],"main":[95,162],"idea":[96],"consists":[97],"inserting":[99],"special":[101],"element":[103],"(SE)":[104],"called":[105],"\"transforming":[107],"SE\".":[108],"This":[109,178],"transforming":[110],"SE":[111,172,181],"is":[112,167],"responsible":[113],"adaptation":[116],"single":[118],"cycle":[119],"relation":[120],"pattern.":[123],"It":[124],"also":[125],"traces":[126],"interface":[128],"pattern":[129,214],"direct":[131],"use":[132],"on":[133],"tester.":[135,220],"These":[136],"patterns":[137,147,151],"finally":[139],"deriving":[142],"programs":[144],"functional":[146],"providing":[150],"an":[153,174],"e-beam":[154],"analysis":[155],"manufactured":[158],"chip.":[159],"second":[161],"feature":[163],"TRSE":[166],"connection":[169],"each":[171],"appropriate":[175],"reference":[176],"clock.":[177],"enables":[179],"provide":[183],"both":[184],"synchronous":[185],"asynchronous":[187],"communication":[188],"unit":[191],"under":[192],"(UUV).":[194],"Both":[195],"modeling":[197,223],"case":[201],"general":[203],"issues":[205],"have":[206],"big":[208],"influence":[209],"how":[211],"easily":[212],"can":[215],"adapted":[217],"Some":[221],"practical":[222],"hints":[226],"given.":[228]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}