{"id":"https://openalex.org/W1676666806","doi":"https://doi.org/10.1109/test.2004.1387357","title":"Data compression for multiple scan chains using dictionaries with corrections","display_name":"Data compression for multiple scan chains using dictionaries with corrections","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W1676666806","doi":"https://doi.org/10.1109/test.2004.1387357","mag":"1676666806"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387357","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387357","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058797661","display_name":"A. Wurtenberger","orcid":null},"institutions":[{"id":"https://openalex.org/I190249584","display_name":"Universit\u00e4t Innsbruck","ror":"https://ror.org/054pv6659","country_code":"AT","type":"education","lineage":["https://openalex.org/I190249584"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"A. Wurtenberger","raw_affiliation_strings":["University of Innsbruck, Austria","Innsbruck University, Austria#TAB#"],"affiliations":[{"raw_affiliation_string":"University of Innsbruck, Austria","institution_ids":["https://openalex.org/I190249584"]},{"raw_affiliation_string":"Innsbruck University, Austria#TAB#","institution_ids":["https://openalex.org/I190249584"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053568658","display_name":"Christofer S. Tautermann","orcid":"https://orcid.org/0000-0002-6935-6940"},"institutions":[{"id":"https://openalex.org/I190249584","display_name":"Universit\u00e4t Innsbruck","ror":"https://ror.org/054pv6659","country_code":"AT","type":"education","lineage":["https://openalex.org/I190249584"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"C.S. Tautermann","raw_affiliation_strings":["University of Innsbruck, Austria","Innsbruck University, Austria#TAB#"],"affiliations":[{"raw_affiliation_string":"University of Innsbruck, Austria","institution_ids":["https://openalex.org/I190249584"]},{"raw_affiliation_string":"Innsbruck University, Austria#TAB#","institution_ids":["https://openalex.org/I190249584"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051549317","display_name":"Sybille Hellebrand","orcid":"https://orcid.org/0000-0002-3717-3939"},"institutions":[{"id":"https://openalex.org/I190249584","display_name":"Universit\u00e4t Innsbruck","ror":"https://ror.org/054pv6659","country_code":"AT","type":"education","lineage":["https://openalex.org/I190249584"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"S. Hellebrand","raw_affiliation_strings":["University of Innsbruck, Austria","Innsbruck University, Austria#TAB#"],"affiliations":[{"raw_affiliation_string":"University of Innsbruck, Austria","institution_ids":["https://openalex.org/I190249584"]},{"raw_affiliation_string":"Innsbruck University, Austria#TAB#","institution_ids":["https://openalex.org/I190249584"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5058797661"],"corresponding_institution_ids":["https://openalex.org/I190249584"],"apc_list":null,"apc_paid":null,"fwci":9.7607,"has_fulltext":false,"cited_by_count":80,"citation_normalized_percentile":{"value":0.9839374,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"926","last_page":"935"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.808779239654541},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.8014066219329834},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7885491251945496},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5927524566650391},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.5755754113197327},{"id":"https://openalex.org/keywords/encoding","display_name":"Encoding (memory)","score":0.5288525819778442},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.47865426540374756},{"id":"https://openalex.org/keywords/serialization","display_name":"Serialization","score":0.47737619280815125},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4378223419189453},{"id":"https://openalex.org/keywords/data-compression","display_name":"Data compression","score":0.4280804693698883},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.372475802898407},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.28724369406700134},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.18413928151130676},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.15674078464508057},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.1408514380455017},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.13316619396209717},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11725705862045288},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.10171893239021301},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09425199031829834}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.808779239654541},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.8014066219329834},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7885491251945496},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5927524566650391},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.5755754113197327},{"id":"https://openalex.org/C125411270","wikidata":"https://www.wikidata.org/wiki/Q18653","display_name":"Encoding (memory)","level":2,"score":0.5288525819778442},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.47865426540374756},{"id":"https://openalex.org/C52723943","wikidata":"https://www.wikidata.org/wiki/Q1127410","display_name":"Serialization","level":2,"score":0.47737619280815125},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4378223419189453},{"id":"https://openalex.org/C78548338","wikidata":"https://www.wikidata.org/wiki/Q2493","display_name":"Data compression","level":2,"score":0.4280804693698883},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.372475802898407},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.28724369406700134},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.18413928151130676},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.15674078464508057},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.1408514380455017},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.13316619396209717},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11725705862045288},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.10171893239021301},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09425199031829834},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2004.1387357","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387357","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.118.9339","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.118.9339","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.date.uni-paderborn.de/fileadmin/documents/publications/itc04.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5600000023841858,"display_name":"Quality Education","id":"https://metadata.un.org/sdg/4"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1480380098","https://openalex.org/W1516123116","https://openalex.org/W1554885925","https://openalex.org/W1588594383","https://openalex.org/W1863819993","https://openalex.org/W1885199275","https://openalex.org/W1908802429","https://openalex.org/W1994418768","https://openalex.org/W2096757277","https://openalex.org/W2099814124","https://openalex.org/W2105282021","https://openalex.org/W2107800433","https://openalex.org/W2108481929","https://openalex.org/W2111761265","https://openalex.org/W2116829289","https://openalex.org/W2122955150","https://openalex.org/W2123887421","https://openalex.org/W2124629389","https://openalex.org/W2127184179","https://openalex.org/W2134998505","https://openalex.org/W2135851981","https://openalex.org/W2137549092","https://openalex.org/W2138530143","https://openalex.org/W2144033909","https://openalex.org/W2146638092","https://openalex.org/W2148218783","https://openalex.org/W2149792223","https://openalex.org/W2152406824","https://openalex.org/W4234998257","https://openalex.org/W4246972245","https://openalex.org/W4253753822","https://openalex.org/W4254102020","https://openalex.org/W4256404229","https://openalex.org/W6628752396","https://openalex.org/W6635219794","https://openalex.org/W6681008240"],"related_works":["https://openalex.org/W2789883751","https://openalex.org/W2147986372","https://openalex.org/W1979305473","https://openalex.org/W2274367941","https://openalex.org/W1974621628","https://openalex.org/W2075356617","https://openalex.org/W2074302528","https://openalex.org/W2092894550","https://openalex.org/W2543176856","https://openalex.org/W3088373974"],"abstract_inverted_index":{"Reducing":[0],"test":[1,5,33,61,64,91,96,143,164,190,206,232],"application":[2,191,207],"time":[3],"and":[4,59,104,111,229],"data":[6,34,65,92],"volume":[7],"are":[8,68,227],"major":[9,83],"challenges":[10],"in":[11,188],"SoC":[12],"design.":[13],"In":[14],"the":[15,32,39,49,57,62,77,86,89,102,105,124,142,163,170,176,189,210,216,219,221],"case":[16],"of":[17,76,88,141,160,186,218,223],"IP":[18],"cores,":[19],"where":[20],"no":[21],"structural":[22],"information":[23],"is":[24,29,54,113],"available,":[25],"a":[26,94,99,119,132,139,148,183,195,203,224],"common":[27],"strategy":[28],"to":[30,126,155,172,215],"compress":[31],"T/sub":[35,46,52,66],"D/":[36,67],"provided":[37],"by":[38,70],"core":[40],"vendor":[41],"into":[42,175],"an":[43,71],"encoded":[44,90],"format":[45],"E/.":[47],"Only":[48],"smaller":[50],"set":[51],"E/":[53],"stored":[55],"on":[56],"ATE,":[58],"during":[60],"original":[63],"regenerated":[69],"on-chip":[72],"decompressor.":[73],"However,":[74],"most":[75],"encoding":[78],"schemes":[79],"suffer":[80],"from":[81],"two":[82],"drawbacks:":[84],"Firstly,":[85],"irregularity":[87,187],"requires":[93,130],"complex":[95],"control":[97],"including":[98],"handshake":[100],"between":[101],"ATE":[103],"system":[106],"under":[107],"test.":[108],"Secondly,":[109],"compression":[110,199],"decompression":[112],"very":[114,230],"efficient":[115],"for":[116,135],"circuits":[117],"with":[118,162,169],"single":[120],"scan":[121,128,177],"chain,":[122],"however":[123],"extension":[125],"multiple":[127],"chains":[129],"either":[131],"separate":[133],"decompressor":[134],"each":[136],"chain":[137],"or":[138],"serialization":[140],"data.":[144],"So":[145],"far,":[146],"only":[147],"few":[149],"approaches":[150,167],"have":[151],"been":[152],"proposed":[153],"trying":[154],"overcome":[156],"these":[157,166],"problems.":[158],"Instead":[159],"dealing":[161],"vectors":[165],"work":[168],"slices":[171],"be":[173,235],"fed":[174],"chains,":[178],"but":[179],"they":[180],"still":[181],"allow":[182],"considerable":[184],"degree":[185],"process.":[192],"We":[193],"propose":[194],"new":[196],"dictionary":[197],"based":[198],"scheme":[200,220],"which":[201],"allows":[202],"fully":[204],"regular":[205],"while":[208],"keeping":[209],"storage":[211],"requirements":[212],"low.":[213],"Due":[214],"regularity":[217],"advantages":[222],"multiple-scan":[225],"architecture":[226],"preserved,":[228],"low":[231],"times":[233],"can":[234],"achieved.":[236]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":4}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}