{"id":"https://openalex.org/W1627397376","doi":"https://doi.org/10.1109/test.2004.1387356","title":"VirtualScan: a new compressed scan technology for test cost reduction","display_name":"VirtualScan: a new compressed scan technology for test cost reduction","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W1627397376","doi":"https://doi.org/10.1109/test.2004.1387356","mag":"1627397376"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387356","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387356","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://kyutech.repo.nii.ac.jp/records/6394","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029839617","display_name":"L.-T. Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107885","display_name":"Syntek Technologies (United States)","ror":"https://ror.org/01rpq5x59","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107885"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"L.-T. Wang","raw_affiliation_strings":["SynTest Technologies, Inc., Sunnyvale, USA","SynTest Technol. Inc., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"SynTest Technologies, Inc., Sunnyvale, USA","institution_ids":["https://openalex.org/I4210107885"]},{"raw_affiliation_string":"SynTest Technol. Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210107885"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]},{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Department of CSE, Kyushu Institute of Technology, Iizuka, Japan","[NEC Corp.]"],"affiliations":[{"raw_affiliation_string":"Department of CSE, Kyushu Institute of Technology, Iizuka, Japan","institution_ids":["https://openalex.org/I207014233"]},{"raw_affiliation_string":"[NEC Corp.]","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101789417","display_name":"Hiroshi Furukawa","orcid":"https://orcid.org/0000-0002-4022-0767"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"H. Furukawa","raw_affiliation_strings":["NEC Micro Systems Limited, Kamimashiki, Kumamoto, Japan","Advanced Inormation and Communication Technology"],"affiliations":[{"raw_affiliation_string":"NEC Micro Systems Limited, Kamimashiki, Kumamoto, Japan","institution_ids":[]},{"raw_affiliation_string":"Advanced Inormation and Communication Technology","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022262917","display_name":"Fei-Sheng Hsu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107885","display_name":"Syntek Technologies (United States)","ror":"https://ror.org/01rpq5x59","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107885"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fei-Sheng Hsu","raw_affiliation_strings":["SynTest Technologies, Inc., Hsinchu, Taiwan","SynTest Technologies, Inc"],"affiliations":[{"raw_affiliation_string":"SynTest Technologies, Inc., Hsinchu, Taiwan","institution_ids":[]},{"raw_affiliation_string":"SynTest Technologies, Inc","institution_ids":["https://openalex.org/I4210107885"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111473610","display_name":"Shyh-Horng Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107885","display_name":"Syntek Technologies (United States)","ror":"https://ror.org/01rpq5x59","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107885"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shyh-Horng Lin","raw_affiliation_strings":["SynTest Technologies, Inc., Hsinchu, Taiwan","SynTest Technologies, Inc"],"affiliations":[{"raw_affiliation_string":"SynTest Technologies, Inc., Hsinchu, Taiwan","institution_ids":[]},{"raw_affiliation_string":"SynTest Technologies, Inc","institution_ids":["https://openalex.org/I4210107885"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024016846","display_name":"Sen\u2010Wei Tsai","orcid":"https://orcid.org/0000-0002-5714-8570"},"institutions":[{"id":"https://openalex.org/I4210107885","display_name":"Syntek Technologies (United States)","ror":"https://ror.org/01rpq5x59","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107885"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sen-Wei Tsai","raw_affiliation_strings":["SynTest Technologies, Inc., Hsinchu, Taiwan","SynTest Technologies, Inc"],"affiliations":[{"raw_affiliation_string":"SynTest Technologies, Inc., Hsinchu, Taiwan","institution_ids":[]},{"raw_affiliation_string":"SynTest Technologies, Inc","institution_ids":["https://openalex.org/I4210107885"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091274032","display_name":"K.S. Abdel-Hafez","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107885","display_name":"Syntek Technologies (United States)","ror":"https://ror.org/01rpq5x59","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107885"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K.S. Abdel-Hafez","raw_affiliation_strings":["SynTest Technologies, Inc., Sunnyvale, USA","SynTest Technologies, Inc"],"affiliations":[{"raw_affiliation_string":"SynTest Technologies, Inc., Sunnyvale, USA","institution_ids":["https://openalex.org/I4210107885"]},{"raw_affiliation_string":"SynTest Technologies, Inc","institution_ids":["https://openalex.org/I4210107885"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111982449","display_name":"Shianling Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107885","display_name":"Syntek Technologies (United States)","ror":"https://ror.org/01rpq5x59","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107885"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shianling Wu","raw_affiliation_strings":["SynTest Technologies, Inc., Sunnyvale, USA","SynTest Technologies, Inc"],"affiliations":[{"raw_affiliation_string":"SynTest Technologies, Inc., Sunnyvale, USA","institution_ids":["https://openalex.org/I4210107885"]},{"raw_affiliation_string":"SynTest Technologies, Inc","institution_ids":["https://openalex.org/I4210107885"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5029839617"],"corresponding_institution_ids":["https://openalex.org/I4210107885"],"apc_list":null,"apc_paid":null,"fwci":13.9816,"has_fulltext":false,"cited_by_count":105,"citation_normalized_percentile":{"value":0.99238056,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"916","last_page":"925"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.9254066944122314},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.7645120620727539},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.7455917596817017},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.7021552324295044},{"id":"https://openalex.org/keywords/aliasing","display_name":"Aliasing","score":0.6282258629798889},{"id":"https://openalex.org/keywords/cost-reduction","display_name":"Cost reduction","score":0.6223902702331543},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5466081500053406},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5164849758148193},{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.4970376789569855},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.45290642976760864},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4238618016242981},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.3814380466938019},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37799328565597534},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.344779908657074},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3092098832130432},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.28132137656211853},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23579713702201843},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.1966908574104309},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1492794156074524},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09411540627479553}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.9254066944122314},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.7645120620727539},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.7455917596817017},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.7021552324295044},{"id":"https://openalex.org/C4069607","wikidata":"https://www.wikidata.org/wiki/Q868732","display_name":"Aliasing","level":3,"score":0.6282258629798889},{"id":"https://openalex.org/C2778820799","wikidata":"https://www.wikidata.org/wiki/Q3454688","display_name":"Cost reduction","level":2,"score":0.6223902702331543},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5466081500053406},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5164849758148193},{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.4970376789569855},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.45290642976760864},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4238618016242981},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.3814380466938019},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37799328565597534},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.344779908657074},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3092098832130432},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.28132137656211853},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23579713702201843},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.1966908574104309},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1492794156074524},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09411540627479553},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C136536468","wikidata":"https://www.wikidata.org/wiki/Q1225894","display_name":"Undersampling","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C187736073","wikidata":"https://www.wikidata.org/wiki/Q2920921","display_name":"Management","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/test.2004.1387356","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387356","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},{"id":"pmh:oai:irdb.nii.ac.jp:01216:0004349215","is_oa":true,"landing_page_url":"https://kyutech.repo.nii.ac.jp/records/6394","pdf_url":null,"source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"2004 International Conference on Test","raw_type":"journal article"},{"id":"pmh:oai:kyutech.repo.nii.ac.jp:00006394","is_oa":false,"landing_page_url":"http://hdl.handle.net/10228/00007604","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"AM"}],"best_oa_location":{"id":"pmh:oai:irdb.nii.ac.jp:01216:0004349215","is_oa":true,"landing_page_url":"https://kyutech.repo.nii.ac.jp/records/6394","pdf_url":null,"source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"2004 International Conference on Test","raw_type":"journal article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1554885925","https://openalex.org/W1590110141","https://openalex.org/W1601643892","https://openalex.org/W1763985980","https://openalex.org/W1836862579","https://openalex.org/W1863819993","https://openalex.org/W1905213452","https://openalex.org/W2099814124","https://openalex.org/W2100891789","https://openalex.org/W2103706706","https://openalex.org/W2110634061","https://openalex.org/W2118204515","https://openalex.org/W2134998505","https://openalex.org/W2138530143","https://openalex.org/W2138843016","https://openalex.org/W2139009001","https://openalex.org/W2144033909","https://openalex.org/W2148192154","https://openalex.org/W2159919870","https://openalex.org/W2164719222","https://openalex.org/W2168755502","https://openalex.org/W2169632679","https://openalex.org/W4302458519","https://openalex.org/W6676498741","https://openalex.org/W6681008240"],"related_works":["https://openalex.org/W2127184179","https://openalex.org/W3088373974","https://openalex.org/W2143881398","https://openalex.org/W2160753176","https://openalex.org/W2092894550","https://openalex.org/W1970697485","https://openalex.org/W2049913894","https://openalex.org/W4230966676","https://openalex.org/W2520108610","https://openalex.org/W2111803469"],"abstract_inverted_index":{"This":[0],"work":[1],"describes":[2],"the":[3,23],"VirtualScan":[4,15,45,52,66,80],"technology":[5,81],"for":[6,43,100],"scan":[7,27,31,101],"test":[8,60,102],"cost":[9,103],"reduction.":[10,104],"Scan":[11],"chains":[12,32],"in":[13,54],"a":[14,36,39,44],"circuit":[16,46],"are":[17,33,47,62],"split":[18],"into":[19],"shorter":[20],"ones":[21],"and":[22,29,38,58,70,89,97],"gap":[24],"between":[25],"external":[26],"ports":[28],"internal":[30],"bridged":[34],"with":[35],"broadcaster":[37],"compactor.":[40],"Test":[41],"patterns":[42],"generated":[48],"directly":[49],"by":[50],"one-pass":[51],"ATPG,":[53],"which":[55],"multi-capture":[56],"clocking":[57],"maximum":[59],"compaction":[61],"supported.":[63],"In":[64],"addition,":[65],"ATPG":[67],"avoids":[68],"unknown-value":[69],"aliasing":[71],"effects":[72],"algorithmically":[73],"without":[74],"adding":[75],"any":[76],"additional":[77],"circuitry.":[78],"The":[79],"has":[82,90],"achieved":[83],"successful":[84],"tape-outs":[85],"of":[86],"industrial":[87],"chips":[88],"been":[91],"proven":[92],"to":[93],"be":[94],"an":[95],"efficient":[96],"easy-to-implement":[98],"solution":[99]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":7},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":7}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}