{"id":"https://openalex.org/W2108636909","doi":"https://doi.org/10.1109/test.2004.1387355","title":"Defect coverage analysis of partitioned testing","display_name":"Defect coverage analysis of partitioned testing","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W2108636909","doi":"https://doi.org/10.1109/test.2004.1387355","mag":"2108636909"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387355","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387355","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087206490","display_name":"S. Chakravarty","orcid":"https://orcid.org/0000-0002-3682-2060"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S. Chakravarty","raw_affiliation_strings":["Intel corporation, Santa Clara, USA","Intel Corp., Santa Clara, CA, , USA"],"affiliations":[{"raw_affiliation_string":"Intel corporation, Santa Clara, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corp., Santa Clara, CA, , USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075025030","display_name":"E.W. Savage","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E.W. Savage","raw_affiliation_strings":["Intel corporation, Santa Clara, USA","Intel Corp., Santa Clara, CA, , USA"],"affiliations":[{"raw_affiliation_string":"Intel corporation, Santa Clara, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corp., Santa Clara, CA, , USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036957966","display_name":"E.N. Tran","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E.N. Tran","raw_affiliation_strings":["Intel corporation, Santa Clara, USA","Intel Corp., Santa Clara, CA, , USA"],"affiliations":[{"raw_affiliation_string":"Intel corporation, Santa Clara, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corp., Santa Clara, CA, , USA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5087206490"],"corresponding_institution_ids":["https://openalex.org/I1343180700"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1704932,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"907","last_page":"915"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.792726993560791},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7324634790420532},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.6453591585159302},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5447521805763245},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5340710282325745},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.47810667753219604},{"id":"https://openalex.org/keywords/test-management-approach","display_name":"Test Management Approach","score":0.4652712345123291},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4619569778442383},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4546022117137909},{"id":"https://openalex.org/keywords/functional-testing","display_name":"Functional testing","score":0.4484739303588867},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4344263970851898},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4323536157608032},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.4083903431892395},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.1919092833995819},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.18660825490951538},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1563974916934967},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14995244145393372},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.07397076487541199}],"concepts":[{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.792726993560791},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7324634790420532},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.6453591585159302},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5447521805763245},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5340710282325745},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.47810667753219604},{"id":"https://openalex.org/C7435765","wikidata":"https://www.wikidata.org/wiki/Q7705776","display_name":"Test Management Approach","level":5,"score":0.4652712345123291},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4619569778442383},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4546022117137909},{"id":"https://openalex.org/C80823478","wikidata":"https://www.wikidata.org/wiki/Q4493432","display_name":"Functional testing","level":3,"score":0.4484739303588867},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4344263970851898},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4323536157608032},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.4083903431892395},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.1919092833995819},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.18660825490951538},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1563974916934967},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14995244145393372},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.07397076487541199},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1387355","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387355","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5400000214576721,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1600468096","https://openalex.org/W1690611602","https://openalex.org/W1708900174","https://openalex.org/W1961788500","https://openalex.org/W2106290994","https://openalex.org/W2109768518","https://openalex.org/W2112892127","https://openalex.org/W2113466675","https://openalex.org/W2126263957","https://openalex.org/W2133505378","https://openalex.org/W2135018455","https://openalex.org/W2136231728","https://openalex.org/W2136534898","https://openalex.org/W2139895946","https://openalex.org/W2144985485","https://openalex.org/W2154418718","https://openalex.org/W2162442179","https://openalex.org/W2163853211","https://openalex.org/W2169447254","https://openalex.org/W4229495070","https://openalex.org/W6683878488"],"related_works":["https://openalex.org/W149511501","https://openalex.org/W3022945690","https://openalex.org/W2243231242","https://openalex.org/W1888619389","https://openalex.org/W1978910953","https://openalex.org/W3175215928","https://openalex.org/W4389236635","https://openalex.org/W4376482197","https://openalex.org/W1968494916","https://openalex.org/W2187337904"],"abstract_inverted_index":{"Research":[0],"in":[1,70,111],"improving":[2],"test":[3,22,25,40,43,85,102,113],"quality":[4,129],"has":[5],"focused":[6],"on":[7,49,76],"identifying":[8],"better":[9],"fault":[10],"models":[11],"and":[12,15,24,42,104],"coverage":[13],"metrics":[14],"tools":[16],"to":[17,34,58,107,125,130],"achieve":[18],"high":[19],"coverage.":[20],"The":[21],"generation":[23,41],"application":[26,44],"methodology":[27],"is":[28,123],"usually":[29],"not":[30],"considered.":[31],"We":[32],"attempt":[33],"understand":[35],"the":[36,62,65,91,105,112,132],"implication":[37],"of":[38,61,79],"a":[39,71,120],"methodology,":[45],"viz,":[46],"partitioned":[47,53,80],"testing,":[48,54,81],"product":[50],"quality.":[51],"In":[52,115],"patterns":[55,95],"are":[56,68,87],"applied":[57],"one":[59],"part":[60],"design":[63],"while":[64],"other":[66],"parts":[67],"maintained":[69],"quiescent":[72],"state.":[73],"Quantitative":[74],"data":[75],"several":[77],"aspects":[78],"using":[82,96],"some":[83],"industrial":[84],"cases,":[86],"presented.":[88],"It":[89],"highlights":[90],"need":[92,106],"for":[93],"generating":[94,100],"different":[97,121],"partition":[98],"sizes,":[99],"longer":[101],"sequences":[103],"include":[108],"functional":[109,127],"testing":[110],"suite.":[114],"addition,":[116],"we":[117],"argue":[118],"that":[119],"metric":[122],"needed":[124],"evaluate":[126],"pattern":[128],"cover":[131],"gaps":[133],"identified.":[134]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}