{"id":"https://openalex.org/W1559719544","doi":"https://doi.org/10.1109/test.2004.1387329","title":"Trends in manufacturing test methods and their implications","display_name":"Trends in manufacturing test methods and their implications","publication_year":2005,"publication_date":"2005-03-07","ids":{"openalex":"https://openalex.org/W1559719544","doi":"https://doi.org/10.1109/test.2004.1387329","mag":"1559719544"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387329","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387329","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067628877","display_name":"Subrata Kundu","orcid":"https://orcid.org/0000-0002-1992-9659"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S. Kundu","raw_affiliation_strings":["Design Technology, Intel Corporation, USA","Design Technol., Intel Corp., USA"],"affiliations":[{"raw_affiliation_string":"Design Technology, Intel Corporation, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Design Technol., Intel Corp., USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103281227","display_name":"Terrence Mak","orcid":"https://orcid.org/0000-0003-1945-8292"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T.M. Mak","raw_affiliation_strings":["Design Technology, Intel Corporation, USA","Design Technol., Intel Corp., USA"],"affiliations":[{"raw_affiliation_string":"Design Technology, Intel Corporation, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Design Technol., Intel Corp., USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049951159","display_name":"Rajesh Galivanche","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Galivanche","raw_affiliation_strings":["Design Technology, Intel Corporation, USA","Design Technol., Intel Corp., USA"],"affiliations":[{"raw_affiliation_string":"Design Technology, Intel Corporation, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Design Technol., Intel Corp., USA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5067628877"],"corresponding_institution_ids":["https://openalex.org/I1343180700"],"apc_list":null,"apc_paid":null,"fwci":6.0675,"has_fulltext":false,"cited_by_count":51,"citation_normalized_percentile":{"value":0.96334432,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"679","last_page":"687"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.7869378328323364},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6260096430778503},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6184697151184082},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.5842363834381104},{"id":"https://openalex.org/keywords/time-to-market","display_name":"Time to market","score":0.5405328273773193},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.5113388895988464},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.4866121709346771},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.47332295775413513},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4663865566253662},{"id":"https://openalex.org/keywords/product-testing","display_name":"Product testing","score":0.42152974009513855},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.42132022976875305},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3344196379184723},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.32610419392585754},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2777036428451538},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2313506007194519},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22847241163253784},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12953877449035645}],"concepts":[{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.7869378328323364},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6260096430778503},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6184697151184082},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.5842363834381104},{"id":"https://openalex.org/C2779229675","wikidata":"https://www.wikidata.org/wiki/Q445235","display_name":"Time to market","level":2,"score":0.5405328273773193},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.5113388895988464},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.4866121709346771},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.47332295775413513},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4663865566253662},{"id":"https://openalex.org/C526771534","wikidata":"https://www.wikidata.org/wiki/Q7247798","display_name":"Product testing","level":2,"score":0.42152974009513855},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.42132022976875305},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3344196379184723},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.32610419392585754},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2777036428451538},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2313506007194519},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22847241163253784},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12953877449035645},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1387329","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387329","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5199999809265137,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1501573324","https://openalex.org/W1502258793","https://openalex.org/W1657391569","https://openalex.org/W1891950198","https://openalex.org/W2130785928","https://openalex.org/W2131610230","https://openalex.org/W2153336129","https://openalex.org/W2162539355","https://openalex.org/W2543553088"],"related_works":["https://openalex.org/W1485756991","https://openalex.org/W2376218453","https://openalex.org/W2984236338","https://openalex.org/W4395090620","https://openalex.org/W2290315036","https://openalex.org/W2109907925","https://openalex.org/W1990473394","https://openalex.org/W1828239946","https://openalex.org/W4247963789","https://openalex.org/W2051573100"],"abstract_inverted_index":{"Driven":[0],"by":[1],"market":[2],"applications":[3,28],"in":[4,50,85],"the":[5,35,44,47,53,91],"areas":[6],"of":[7,26,37,56,87,93,120],"computing,":[8],"networking,":[9],"storage,":[10],"optical,":[11],"wireless,":[12],"portable,":[13],"and":[14,29,59,62,83,102,112,135],"consumer":[15],"electronics,":[16],"semiconductor":[17],"chips":[18,95],"today":[19,96],"are":[20],"as":[21,23,98],"diverse":[22],"ever.":[24],"Confluence":[25],"multiple":[27],"rapid":[30],"integration":[31],"has":[32],"also":[33],"driven":[34],"heterogeneity":[36],"chips.":[38],"Test":[39],"methods":[40],"have":[41],"evolved":[42],"with":[43],"products.":[45],"However,":[46],"basic":[48],"goals":[49],"testing":[51],"remain":[52],"same:":[54],"quality":[55],"product,":[57],"recurring":[58],"non-recurring":[60],"costs":[61],"time":[63],"to":[64,71,123],"market.":[65],"In":[66],"this":[67,121],"paper":[68,119],"we":[69,128],"try":[70],"catalog":[72],"some":[73],"commonly":[74],"used":[75],"test":[76],"methods,":[77],"identify":[78],"their":[79],"associated":[80],"DFT":[81],"requirements":[82],"trends":[84],"terms":[86],"tester":[88],"requirements.":[89],"Given":[90],"diversity":[92],"semiconductors":[94],"such":[97],"various":[99],"PLDs,":[100],"volatile":[101],"non-volatile":[103],"memories,":[104],"analog,":[105],"mixed":[106],"signal,":[107],"FPGA,":[108],"ASIC,":[109],"SOC,":[110],"MEMs":[111],"processors,":[113],"it":[114],"is":[115],"impossible":[116],"for":[117],"a":[118],"nature":[122],"be":[124],"fully":[125],"comprehensive.":[126],"So":[127],"limit":[129],"our":[130],"focus":[131],"on":[132],"processor,":[133],"ASIC":[134],"SOCs.":[136]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}