{"id":"https://openalex.org/W1505907827","doi":"https://doi.org/10.1109/test.2004.1386998","title":"Decision selection and learning for an 'all-solutions ATPG engine'","display_name":"Decision selection and learning for an 'all-solutions ATPG engine'","publication_year":2005,"publication_date":"2005-03-07","ids":{"openalex":"https://openalex.org/W1505907827","doi":"https://doi.org/10.1109/test.2004.1386998","mag":"1505907827"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1386998","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386998","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064923800","display_name":"Kameshwar Chandrasekar","orcid":"https://orcid.org/0000-0002-6249-5593"},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"K. Chandrasekar","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Virginia Technology, Blacksburg, VA, USA","[Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Virginia Technology, Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA]","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108516165","display_name":"Michael S. Hsiao","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.S. Hsiao","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Virginia Technology, Blacksburg, VA, USA","[Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Virginia Technology, Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA]","institution_ids":["https://openalex.org/I859038795"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5064923800"],"corresponding_institution_ids":["https://openalex.org/I859038795"],"apc_list":null,"apc_paid":null,"fwci":0.5278,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.66519053,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"607","last_page":"616"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/heuristics","display_name":"Heuristics","score":0.858691930770874},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.760298490524292},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7133598327636719},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.6120476722717285},{"id":"https://openalex.org/keywords/heuristic","display_name":"Heuristic","score":0.5919872522354126},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.5761256217956543},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5188294649124146},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.47072139382362366},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4387943744659424},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3918956220149994},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.36229759454727173},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.27482324838638306},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13591820001602173},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.10379067063331604}],"concepts":[{"id":"https://openalex.org/C127705205","wikidata":"https://www.wikidata.org/wiki/Q5748245","display_name":"Heuristics","level":2,"score":0.858691930770874},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.760298490524292},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7133598327636719},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.6120476722717285},{"id":"https://openalex.org/C173801870","wikidata":"https://www.wikidata.org/wiki/Q201413","display_name":"Heuristic","level":2,"score":0.5919872522354126},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.5761256217956543},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5188294649124146},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.47072139382362366},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4387943744659424},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3918956220149994},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.36229759454727173},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.27482324838638306},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13591820001602173},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.10379067063331604},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/test.2004.1386998","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386998","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.108.4517","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.108.4517","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.itcprogramdev.org/itc2004proc/Papers/PDFs/0021_2.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.134.3822","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.134.3822","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://csdl.computer.org/comp/proceedings/itc/2004/2741/00/27410607.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","score":0.7200000286102295,"id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":46,"referenced_works":["https://openalex.org/W1494481937","https://openalex.org/W1554885925","https://openalex.org/W1582237333","https://openalex.org/W1599960931","https://openalex.org/W1813581279","https://openalex.org/W1856915098","https://openalex.org/W1904003763","https://openalex.org/W2044560939","https://openalex.org/W2071470864","https://openalex.org/W2096307462","https://openalex.org/W2100083403","https://openalex.org/W2110728526","https://openalex.org/W2111265695","https://openalex.org/W2111575167","https://openalex.org/W2112192542","https://openalex.org/W2114766961","https://openalex.org/W2118346508","https://openalex.org/W2119241964","https://openalex.org/W2120599220","https://openalex.org/W2133123458","https://openalex.org/W2136678847","https://openalex.org/W2138273756","https://openalex.org/W2144883917","https://openalex.org/W2147897801","https://openalex.org/W2149479807","https://openalex.org/W2151398141","https://openalex.org/W2161010566","https://openalex.org/W2162256736","https://openalex.org/W2171471221","https://openalex.org/W3147035810","https://openalex.org/W4239569538","https://openalex.org/W4241661428","https://openalex.org/W4250447890","https://openalex.org/W4251625379","https://openalex.org/W4252625489","https://openalex.org/W4302458519","https://openalex.org/W4378744510","https://openalex.org/W6629484655","https://openalex.org/W6633069435","https://openalex.org/W6638964787","https://openalex.org/W6668336099","https://openalex.org/W6674427772","https://openalex.org/W6676878899","https://openalex.org/W6677600375","https://openalex.org/W6682383673","https://openalex.org/W6685146715"],"related_works":["https://openalex.org/W3177062893","https://openalex.org/W3125143773","https://openalex.org/W803550684","https://openalex.org/W2007032764","https://openalex.org/W2483226803","https://openalex.org/W3143937874","https://openalex.org/W2067280619","https://openalex.org/W4251343851","https://openalex.org/W4352977312","https://openalex.org/W2041180560"],"abstract_inverted_index":{"'All-solutions":[0],"ATPG'":[1,61],"based":[2],"methods":[3],"have":[4],"found":[5],"applications":[6],"in":[7,100,103,115,120],"model":[8],"checking":[9],"sequential":[10],"circuits,":[11,177],"and":[12,32,123,151,175],"they":[13],"can":[14,163],"also":[15],"improve":[16],"the":[17,56,65,96,101,113,140,165],"defect":[18],"coverage":[19],"of":[20,95,98,142],"a":[21,87,107,135,145],"test-suite,":[22],"by":[23],"generating":[24],"distinct":[25],"multiple-detect":[26],"patterns.":[27],"Conventional":[28],"decision":[29,50,89],"selection":[30,51,90],"heuristics":[31,52,171,181],"learning":[33],"techniques":[34,77],"for":[35,58,172],"an":[36,59,80],"ATPG":[37,82],"engine":[38],"were":[39],"originally":[40],"developed":[41],"to":[42,68,78,105,126],"'quickly'":[43],"find":[44],"any":[45],"available":[46],"(single)":[47],"solution.":[48],"Such":[49],"may":[53],"not":[54],"be":[55,69],"best":[57],"'all-solutions":[60,81],"engine,":[62],"where":[63,178],"all":[64],"solutions":[66],"need":[67],"found.":[70],"In":[71],"this":[72],"paper,":[73],"we":[74,111,133,162],"explore":[75],"new":[76,88,136,170],"guide":[79],"engine'.":[83],"We":[84],"first":[85],"present":[86],"heuristic":[91],"that":[92,117,138,161],"makes":[93],"use":[94,141],"'connectivity":[97],"gates'":[99],"circuit":[102],"order":[104],"obtain":[106],"compact":[108],"solution-set.":[109],"Next,":[110],"analyze":[112],"'symmetry":[114],"search-states'":[116],"was":[118],"exploited":[119],"'success-driven":[121],"learning'":[122],"extend":[124],"it":[125],"prune":[127],"conflict":[128],"sub-spaces":[129],"as":[130],"well.":[131],"Finally,":[132],"propose":[134],"metric":[137],"determines":[139],"learnt":[143],"information":[144,148],"priori.":[146],"This":[147],"is":[149],"stored":[150],"used":[152],"efficiently":[153],"during":[154],"'success":[155],"driven":[156],"learning'.":[157],"Experimental":[158],"results":[159],"show":[160],"compute":[164],"complete":[166],"solution-set":[167],"with":[168],"our":[169],"large":[173],"ISCAS'89":[174],"ITC'99":[176],"conventional":[179],"guidance":[180],"fail.":[182]},"counts_by_year":[],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}