{"id":"https://openalex.org/W1520522463","doi":"https://doi.org/10.1109/test.2004.1386992","title":"A frequency mixing and sub-sampling based RF-measurement apparatus for IEEE 1149.4","display_name":"A frequency mixing and sub-sampling based RF-measurement apparatus for IEEE 1149.4","publication_year":2005,"publication_date":"2005-03-07","ids":{"openalex":"https://openalex.org/W1520522463","doi":"https://doi.org/10.1109/test.2004.1386992","mag":"1520522463"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1386992","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386992","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054871443","display_name":"Juha H\u00e4kkinen","orcid":"https://orcid.org/0000-0003-2850-4414"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]},{"id":"https://openalex.org/I4210126846","display_name":"Information Technology Laboratory","ror":"https://ror.org/0440c3437","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210126846"]}],"countries":["FI","US"],"is_corresponding":true,"raw_author_name":"J. Hakkinen","raw_affiliation_strings":["Department of Electrical and Information Engineering, Electronics Laboratory","Department of Electrical and Information Engineering, Electronics Laboratory, University of Oulu, Finland"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Information Engineering, Electronics Laboratory","institution_ids":["https://openalex.org/I4210126846"]},{"raw_affiliation_string":"Department of Electrical and Information Engineering, Electronics Laboratory, University of Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082341166","display_name":"Pekka Syri","orcid":null},"institutions":[{"id":"https://openalex.org/I4210126846","display_name":"Information Technology Laboratory","ror":"https://ror.org/0440c3437","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210126846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Syri","raw_affiliation_strings":["Department of Electrical and Information Engineering, Electronics Laboratory"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Information Engineering, Electronics Laboratory","institution_ids":["https://openalex.org/I4210126846"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111681037","display_name":"Juha Veikko Voutilainen","orcid":null},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"J.-V. Voutilainen","raw_affiliation_strings":["Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Finland"],"affiliations":[{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5082862323","display_name":"M. Moilanen","orcid":null},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"M. Moilanen","raw_affiliation_strings":["Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Finland"],"affiliations":[{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5054871443"],"corresponding_institution_ids":["https://openalex.org/I4210126846","https://openalex.org/I98381234"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.05962925,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"551","last_page":"559"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.8645385503768921},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.6548595428466797},{"id":"https://openalex.org/keywords/repeatability","display_name":"Repeatability","score":0.6513475179672241},{"id":"https://openalex.org/keywords/rf-probe","display_name":"RF probe","score":0.6320275664329529},{"id":"https://openalex.org/keywords/voltage-controlled-oscillator","display_name":"Voltage-controlled oscillator","score":0.5102517604827881},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.49447011947631836},{"id":"https://openalex.org/keywords/rf-power-amplifier","display_name":"RF power amplifier","score":0.4644688665866852},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.46213498711586},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4552622437477112},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34696513414382935},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.319222092628479}],"concepts":[{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.8645385503768921},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.6548595428466797},{"id":"https://openalex.org/C154020017","wikidata":"https://www.wikidata.org/wiki/Q520171","display_name":"Repeatability","level":2,"score":0.6513475179672241},{"id":"https://openalex.org/C161893790","wikidata":"https://www.wikidata.org/wiki/Q7276619","display_name":"RF probe","level":5,"score":0.6320275664329529},{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.5102517604827881},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.49447011947631836},{"id":"https://openalex.org/C196054291","wikidata":"https://www.wikidata.org/wiki/Q7276624","display_name":"RF power amplifier","level":4,"score":0.4644688665866852},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46213498711586},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4552622437477112},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34696513414382935},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.319222092628479},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2004.1386992","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386992","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.107.52","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.107.52","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.itcprogramdev.org/itc2004proc/Papers/PDFs/0019_2.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Partnerships for the goals","id":"https://metadata.un.org/sdg/17","score":0.4399999976158142}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1514489145","https://openalex.org/W1991539030","https://openalex.org/W2112025713","https://openalex.org/W6630821598"],"related_works":["https://openalex.org/W2155700382","https://openalex.org/W2147585254","https://openalex.org/W4235509732","https://openalex.org/W2063196868","https://openalex.org/W2738144851","https://openalex.org/W4386535175","https://openalex.org/W2801509523","https://openalex.org/W2061720025","https://openalex.org/W3175858086","https://openalex.org/W3145027672"],"abstract_inverted_index":{"This":[0],"paper":[1],"demonstrates":[2],"the":[3,12,25,29,38,43,64,67,90,95,99,108,112,148,152],"possibility":[4],"of":[5,20,66,85,101,111,151],"performing":[6],"radio":[7],"frequency":[8,35,114],"(RF)":[9],"measurements":[10,127],"in":[11,71],"IEEE":[13,76],"1149.4":[14,44,77],"environment":[15],"using":[16],"a":[17,33,55],"selected":[18],"combination":[19],"mixing":[21],"and":[22,54,107,119,140],"sub-sampling":[23],"as":[24,137],"method":[26],"to":[27,62,98,116],"down-convert":[28],"RF":[30,49,86,96,113],"signal":[31,50,120],"into":[32],"low":[34],"suitable":[36],"for":[37],"analogue":[39],"busses":[40],"specified":[41],"by":[42,48],"standard.":[45],"Signals":[46],"generated":[47],"generators":[51],"(2":[52],"GHz)":[53,59],"commercial":[56],"VCO":[57],"(3":[58],"were":[60,131],"used":[61],"demonstrate":[63],"operation":[65],"developed":[68],"RF-to-LF":[69,153],"circuitry":[70],"cooperation":[72],"with":[73],"National's":[74],"SCANSTA400":[75],"analog":[78],"test":[79],"access":[80],"device.":[81],"The":[82],"measured":[83],"repeatability":[84],"power":[87],"measurement":[88,109,117],"through":[89],"whole":[91],"system,":[92],"i.e.":[93],"from":[94],"input":[97],"output":[100,150],"SCANSTA400,":[102],"is":[103,122],"/spl":[104,123],"plusmn/0.15":[105],"dB":[106],"uncertainty":[110],"due":[115],"instruments":[118],"sources":[121],"plusmn/350":[124],"Hz.":[125],"Interconnect":[126],"at":[128,147],"2.1":[129],"GHz":[130],"also":[132],"demonstrated.":[133],"Simple":[134],"faults":[135],"such":[136],"shorts,":[138],"opens":[139],"missing":[141],"components":[142],"may":[143],"readily":[144],"be":[145],"detected":[146],"low-frequency":[149],"circuitry.":[154]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}