{"id":"https://openalex.org/W1484351771","doi":"https://doi.org/10.1109/test.2004.1386988","title":"An economic analysis and ROI model for nanometer test","display_name":"An economic analysis and ROI model for nanometer test","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W1484351771","doi":"https://doi.org/10.1109/test.2004.1386988","mag":"1484351771"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1386988","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386988","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006214290","display_name":"Brion Keller","orcid":null},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"B. Keller","raw_affiliation_strings":["Cadence Design Systems, Inc., Endicott, NY, USA","Cadence Design Syst. Inc., Endicott, NY, USA"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems, Inc., Endicott, NY, USA","institution_ids":["https://openalex.org/I66217453"]},{"raw_affiliation_string":"Cadence Design Syst. Inc., Endicott, NY, USA","institution_ids":["https://openalex.org/I66217453"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067130828","display_name":"M.M.V. Tegethoff","orcid":null},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Tegethoff","raw_affiliation_strings":["Cadence Design Systems, Inc., Endicott, NY, USA","Cadence Design Syst. Inc., Endicott, NY, USA"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems, Inc., Endicott, NY, USA","institution_ids":["https://openalex.org/I66217453"]},{"raw_affiliation_string":"Cadence Design Syst. Inc., Endicott, NY, USA","institution_ids":["https://openalex.org/I66217453"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012462967","display_name":"T. Bartenstein","orcid":null},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. Bartenstein","raw_affiliation_strings":["Cadence Design Systems, Inc., Endicott, NY, USA","Cadence Design Syst. Inc., Endicott, NY, USA"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems, Inc., Endicott, NY, USA","institution_ids":["https://openalex.org/I66217453"]},{"raw_affiliation_string":"Cadence Design Syst. Inc., Endicott, NY, USA","institution_ids":["https://openalex.org/I66217453"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061006452","display_name":"Vivek Chickermane","orcid":"https://orcid.org/0000-0003-1232-470X"},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"V. Chickermane","raw_affiliation_strings":["Cadence Design Systems, Inc., Endicott, NY, USA","Cadence Design Syst. Inc., Endicott, NY, USA"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems, Inc., Endicott, NY, USA","institution_ids":["https://openalex.org/I66217453"]},{"raw_affiliation_string":"Cadence Design Syst. Inc., Endicott, NY, USA","institution_ids":["https://openalex.org/I66217453"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5006214290"],"corresponding_institution_ids":["https://openalex.org/I66217453"],"apc_list":null,"apc_paid":null,"fwci":2.8359,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.90274235,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"518","last_page":"524"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/return-on-investment","display_name":"Return on investment","score":0.6808272004127502},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6246848702430725},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.5435062050819397},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5370468497276306},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5306742787361145},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5101023316383362},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5028597712516785},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4904937148094177},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.450623095035553},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.3304975926876068},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2317257523536682},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.13602235913276672},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.10840994119644165},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.0877470076084137},{"id":"https://openalex.org/keywords/economics","display_name":"Economics","score":0.0816546082496643}],"concepts":[{"id":"https://openalex.org/C169549615","wikidata":"https://www.wikidata.org/wiki/Q939134","display_name":"Return on investment","level":3,"score":0.6808272004127502},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6246848702430725},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.5435062050819397},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5370468497276306},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5306742787361145},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5101023316383362},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5028597712516785},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4904937148094177},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.450623095035553},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.3304975926876068},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2317257523536682},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.13602235913276672},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.10840994119644165},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0877470076084137},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0816546082496643},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1386988","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386988","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Decent work and economic growth","score":0.5400000214576721,"id":"https://metadata.un.org/sdg/8"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W260873559","https://openalex.org/W1538850614","https://openalex.org/W1554885925","https://openalex.org/W1590110141","https://openalex.org/W1863819993","https://openalex.org/W1864256460","https://openalex.org/W2097242382","https://openalex.org/W2107262883","https://openalex.org/W2134998505","https://openalex.org/W2140283778","https://openalex.org/W2161811418"],"related_works":["https://openalex.org/W4376453582","https://openalex.org/W3147033875","https://openalex.org/W1568390478","https://openalex.org/W2764722704","https://openalex.org/W318913410","https://openalex.org/W2355543518","https://openalex.org/W2601840227","https://openalex.org/W2131832954","https://openalex.org/W4205240067","https://openalex.org/W2374901194"],"abstract_inverted_index":{"This":[0],"work":[1],"describes":[2],"an":[3],"economic":[4],"and":[5,28,41,59,63],"return-on-investment":[6],"(RoI)":[7],"model":[8],"for":[9,17],"a":[10],"test":[11,38,58],"methodology":[12,39],"that":[13,20],"ensures":[14],"product":[15,51],"quality":[16,52],"logic":[18],"devices":[19],"are":[21,74],"in":[22],"the":[23,32,36,45,55,78,82],"130":[24],"nm":[25],"technology":[26],"node":[27],"below.":[29],"We":[30],"describe":[31],"key":[33],"components":[34],"of":[35,57],"nanometer":[37],"(NTM)":[40],"how":[42,64],"it":[43],"drives":[44],"model.":[46,87],"In":[47],"addition":[48],"to":[49,61,76],"ensuring":[50],"we":[53],"address":[54],"cost":[56],"time":[60],"volume":[62],"both":[65],"factors":[66],"can":[67],"be":[68],"improved.":[69],"Examples":[70],"from":[71,81],"realistic":[72],"scenarios":[73],"provided":[75],"illustrate":[77],"net":[79],"savings":[80],"proposed":[83],"NTM":[84],"using":[85],"this":[86]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}