{"id":"https://openalex.org/W2112688207","doi":"https://doi.org/10.1109/test.2004.1386985","title":"Z-DFD: design-for-diagnosability based on the concept of Z-detection","display_name":"Z-DFD: design-for-diagnosability based on the concept of Z-detection","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W2112688207","doi":"https://doi.org/10.1109/test.2004.1386985","mag":"2112688207"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1386985","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386985","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032651920","display_name":"Irith Pomeranz","orcid":"https://orcid.org/0000-0002-5491-7282"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"I. Pomeranz","raw_affiliation_strings":["School of ECE, Purdue University, West Lafayette, IN, USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101549581","display_name":"S. Venkataraman","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Venkataraman","raw_affiliation_strings":["Intel Corporation, Hillsboro, OR, USA","Intel Corporation, Hillsboro, OR#TAB#"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR#TAB#","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077101123","display_name":"S.M. Reddy","orcid":"https://orcid.org/0000-0001-9208-8262"},"institutions":[{"id":"https://openalex.org/I126307644","display_name":"University of Iowa","ror":"https://ror.org/036jqmy94","country_code":"US","type":"education","lineage":["https://openalex.org/I126307644"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.M. Reddy","raw_affiliation_strings":["ECE Department, University of Iowa, IA, USA","University of Iowa,  Iowa City, IA"],"affiliations":[{"raw_affiliation_string":"ECE Department, University of Iowa, IA, USA","institution_ids":["https://openalex.org/I126307644"]},{"raw_affiliation_string":"University of Iowa,  Iowa City, IA","institution_ids":["https://openalex.org/I126307644"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5032651920"],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":null,"apc_paid":null,"fwci":1.0312,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.7841199,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"489","last_page":"497"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7488213181495667},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6341723799705505},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5968329310417175},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5884824991226196},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5843906998634338},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5452315807342529},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.488755464553833},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47969362139701843},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4420568346977234},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.39960777759552},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18788674473762512},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07356002926826477}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7488213181495667},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6341723799705505},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5968329310417175},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5884824991226196},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5843906998634338},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5452315807342529},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.488755464553833},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47969362139701843},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4420568346977234},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.39960777759552},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18788674473762512},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07356002926826477},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1386985","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386985","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1520109271","https://openalex.org/W1554885925","https://openalex.org/W2021463588","https://openalex.org/W2064492678","https://openalex.org/W2106031934","https://openalex.org/W2106183788","https://openalex.org/W2112265472","https://openalex.org/W2114564787","https://openalex.org/W2127795505","https://openalex.org/W2128069111","https://openalex.org/W2133512509","https://openalex.org/W2138200330","https://openalex.org/W2142519941","https://openalex.org/W2145314233","https://openalex.org/W2170339697","https://openalex.org/W4235069246","https://openalex.org/W4246237793","https://openalex.org/W4248518188","https://openalex.org/W4302458519","https://openalex.org/W6631015558"],"related_works":["https://openalex.org/W2378211422","https://openalex.org/W4321353415","https://openalex.org/W2745001401","https://openalex.org/W2130974462","https://openalex.org/W2028665553","https://openalex.org/W2086519370","https://openalex.org/W972276598","https://openalex.org/W4246352526","https://openalex.org/W4400235630","https://openalex.org/W2383699822"],"abstract_inverted_index":{"We":[0,78,105,129,148],"address":[1],"the":[2,8,18,35,56,80,84,102,108,157],"problem":[3],"of":[4,10,20,37,58,82,86,110,139,159],"design-for-diagnosability,":[5],"i.e.,":[6],"improving":[7],"accuracy":[9,158],"fault":[11,38,69,76],"diagnosis":[12],"or":[13],"reducing":[14],"its":[15],"complexity":[16],"through":[17],"insertion":[19],"observation":[21,91,111,140],"points.":[22],"To":[23],"perform":[24],"design-for-diagnosability":[25,166],"efficiently,":[26],"we":[27],"use":[28],"a":[29,50,87,122,136,165],"procedure":[30,133],"developed":[31],"earlier":[32],"for":[33,125,134,152],"computing":[34],"number":[36,109,138],"pairs,":[39],"N/sub":[40,61,97,126,146,161],"P/,":[41],"that":[42,113],"are":[43],"not":[44],"guaranteed":[45],"to":[46,95,115,120,144,155,163],"be":[47,64,116],"distinguished":[48],"by":[49,89],"given":[51,137],"test":[52],"set.":[53],"By":[54],"using":[55,160],"concept":[57],"z":[59],"-detection,":[60],"P/":[62,162],"can":[63],"computed":[65],"efficiently":[66],"without":[67,72],"enumerating":[68],"pairs":[70],"and":[71],"performing":[73],"non-fault":[74],"dropping":[75],"simulation.":[77],"study":[79],"possibility":[81],"increasing":[83],"diagnosability":[85],"circuit":[88],"inserting":[90,135],"points":[92,112,141],"so":[93,142],"as":[94,143],"reduce":[96,145],"P/.":[98,127,147],"Our":[99],"results":[100,151],"include":[101],"following.":[103],"(1)":[104],"find":[106],"experimentally":[107],"need":[114],"inserted":[117],"in":[118],"order":[119],"achieve":[121],"close-to-minimum":[123],"value":[124],"(2)":[128],"describe":[130],"an":[131],"efficient":[132],"present":[149],"experimental":[150],"benchmark":[153],"circuits":[154],"demonstrate":[156],"guide":[164],"process.":[167]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}