{"id":"https://openalex.org/W2159853605","doi":"https://doi.org/10.1109/test.2004.1386962","title":"Extending the digital core-based test methodology to support mixed-signal","display_name":"Extending the digital core-based test methodology to support mixed-signal","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W2159853605","doi":"https://doi.org/10.1109/test.2004.1386962","mag":"2159853605"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1386962","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386962","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042038858","display_name":"G. Seuren","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"G. Seuren","raw_affiliation_strings":["Philips Research Electronic Design and Tools, Eindhoven, Netherlands"],"affiliations":[{"raw_affiliation_string":"Philips Research Electronic Design and Tools, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I4210122849"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038993405","display_name":"T. Waayers","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"T. Waayers","raw_affiliation_strings":["Philips Research Electronic Design and Tools, Eindhoven, Netherlands"],"affiliations":[{"raw_affiliation_string":"Philips Research Electronic Design and Tools, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I4210122849"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5042038858"],"corresponding_institution_ids":["https://openalex.org/I4210122849"],"apc_list":null,"apc_paid":null,"fwci":0.2578,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.61437075,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"281","last_page":"289"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7049343585968018},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.6687090992927551},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5999627113342285},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5736144781112671},{"id":"https://openalex.org/keywords/core","display_name":"Core (optical fiber)","score":0.4676342308521271},{"id":"https://openalex.org/keywords/work-flow","display_name":"Work flow","score":0.4545556306838989},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.41270628571510315},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3951268792152405},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.37476253509521484},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17465069890022278},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11214342713356018},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.10607859492301941},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.09358716011047363},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0854468047618866}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7049343585968018},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.6687090992927551},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5999627113342285},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5736144781112671},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.4676342308521271},{"id":"https://openalex.org/C2985179714","wikidata":"https://www.wikidata.org/wiki/Q627335","display_name":"Work flow","level":2,"score":0.4545556306838989},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.41270628571510315},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3951268792152405},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.37476253509521484},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17465069890022278},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11214342713356018},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.10607859492301941},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.09358716011047363},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0854468047618866},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1386962","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386962","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5600000023841858}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1998669267","https://openalex.org/W2115228544","https://openalex.org/W2119264186","https://openalex.org/W2132654661","https://openalex.org/W2152293791","https://openalex.org/W2155118826","https://openalex.org/W2170533364","https://openalex.org/W2738468787"],"related_works":["https://openalex.org/W3158538495","https://openalex.org/W2045815042","https://openalex.org/W2588198209","https://openalex.org/W3174096205","https://openalex.org/W1909006023","https://openalex.org/W4205824991","https://openalex.org/W3200723557","https://openalex.org/W2092226129","https://openalex.org/W2913619905","https://openalex.org/W2038503502"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2,22],"an":[3],"extension":[4],"to":[5,11,36],"a":[6,18,23,31],"digital":[7],"core-based":[8],"test":[9,26,32,39],"architecture":[10],"support":[12],"testing":[13],"of":[14],"mixed-signal":[15,25,38],"cores":[16],"in":[17],"system-on-chip.":[19],"It":[20],"also":[21],"new":[24,42],"development":[27],"flow":[28,43],"that":[29],"comprises":[30],"library":[33],"based":[34],"approach":[35],"ease":[37],"development.":[40],"The":[41],"was":[44],"realized":[45],"and":[46],"experiments":[47],"show":[48],"clear":[49],"advantages.":[50]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}