{"id":"https://openalex.org/W1531696936","doi":"https://doi.org/10.1109/test.2004.1386954","title":"In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost","display_name":"In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W1531696936","doi":"https://doi.org/10.1109/test.2004.1386954","mag":"1531696936"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1386954","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386954","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040957547","display_name":"R. Madge","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"R. Madge","raw_affiliation_strings":["LSI Logic Corporation, Gresham, OR, USA","LSI Logic Corp., Gresham, OR, USA"],"affiliations":[{"raw_affiliation_string":"LSI Logic Corporation, Gresham, OR, USA","institution_ids":[]},{"raw_affiliation_string":"LSI Logic Corp., Gresham, OR, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083871148","display_name":"Brady Benware","orcid":null},"institutions":[{"id":"https://openalex.org/I2801299839","display_name":"Collins College","ror":"https://ror.org/03rb26y64","country_code":"US","type":"education","lineage":["https://openalex.org/I2801299839"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. Benware","raw_affiliation_strings":["LSI Logic Corporation, Collins, CO, USA","LSI Logic Corporation, Ft. Collins, Colorado"],"affiliations":[{"raw_affiliation_string":"LSI Logic Corporation, Collins, CO, USA","institution_ids":["https://openalex.org/I2801299839"]},{"raw_affiliation_string":"LSI Logic Corporation, Ft. Collins, Colorado","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029619346","display_name":"Ritesh Turakhia","orcid":null},"institutions":[{"id":"https://openalex.org/I2801299839","display_name":"Collins College","ror":"https://ror.org/03rb26y64","country_code":"US","type":"education","lineage":["https://openalex.org/I2801299839"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Turakhia","raw_affiliation_strings":["LSI Logic Corporation, Collins, CO, USA","LSI Logic Corporation, Ft. Collins, Colorado"],"affiliations":[{"raw_affiliation_string":"LSI Logic Corporation, Collins, CO, USA","institution_ids":["https://openalex.org/I2801299839"]},{"raw_affiliation_string":"LSI Logic Corporation, Ft. Collins, Colorado","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005789370","display_name":"R. Daasch","orcid":null},"institutions":[{"id":"https://openalex.org/I126345244","display_name":"Portland State University","ror":"https://ror.org/00yn2fy02","country_code":"US","type":"education","lineage":["https://openalex.org/I126345244"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Daasch","raw_affiliation_strings":["Integrated Circuits Design and Test Laboratory, Portland State University, Portland, OR, USA","Portland State University; Portland Oregon"],"affiliations":[{"raw_affiliation_string":"Integrated Circuits Design and Test Laboratory, Portland State University, Portland, OR, USA","institution_ids":["https://openalex.org/I126345244"]},{"raw_affiliation_string":"Portland State University; Portland Oregon","institution_ids":["https://openalex.org/I126345244"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109433539","display_name":"Chris Schuermyer","orcid":null},"institutions":[{"id":"https://openalex.org/I126345244","display_name":"Portland State University","ror":"https://ror.org/00yn2fy02","country_code":"US","type":"education","lineage":["https://openalex.org/I126345244"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Schuermyer","raw_affiliation_strings":["Integrated Circuits Design and Test Laboratory, Portland State University, Portland, OR, USA","Portland State University; Portland Oregon"],"affiliations":[{"raw_affiliation_string":"Integrated Circuits Design and Test Laboratory, Portland State University, Portland, OR, USA","institution_ids":["https://openalex.org/I126345244"]},{"raw_affiliation_string":"Portland State University; Portland Oregon","institution_ids":["https://openalex.org/I126345244"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009945032","display_name":"J. Ruffler","orcid":null},"institutions":[{"id":"https://openalex.org/I126345244","display_name":"Portland State University","ror":"https://ror.org/00yn2fy02","country_code":"US","type":"education","lineage":["https://openalex.org/I126345244"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Ruffler","raw_affiliation_strings":["Integrated Circuits Design and Test Laboratory, Portland State University, Portland, OR, USA","Portland State University; Portland Oregon"],"affiliations":[{"raw_affiliation_string":"Integrated Circuits Design and Test Laboratory, Portland State University, Portland, OR, USA","institution_ids":["https://openalex.org/I126345244"]},{"raw_affiliation_string":"Portland State University; Portland Oregon","institution_ids":["https://openalex.org/I126345244"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5040957547"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.2761,"has_fulltext":false,"cited_by_count":56,"citation_normalized_percentile":{"value":0.95551895,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"203","last_page":"212"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.7263359427452087},{"id":"https://openalex.org/keywords/computerized-adaptive-testing","display_name":"Computerized adaptive testing","score":0.6126953363418579},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5921885371208191},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5755104422569275},{"id":"https://openalex.org/keywords/pareto-principle","display_name":"Pareto principle","score":0.5529419183731079},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5107243061065674},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4481312036514282},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.43627652525901794},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.43442708253860474},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4212188720703125},{"id":"https://openalex.org/keywords/test-strategy","display_name":"Test strategy","score":0.4158127009868622},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4156327247619629},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.321283221244812},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.26416850090026855},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22212734818458557},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21254119277000427},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.20189189910888672},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.08878493309020996}],"concepts":[{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.7263359427452087},{"id":"https://openalex.org/C144352353","wikidata":"https://www.wikidata.org/wiki/Q2920411","display_name":"Computerized adaptive testing","level":3,"score":0.6126953363418579},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5921885371208191},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5755104422569275},{"id":"https://openalex.org/C137635306","wikidata":"https://www.wikidata.org/wiki/Q182667","display_name":"Pareto principle","level":2,"score":0.5529419183731079},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5107243061065674},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4481312036514282},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.43627652525901794},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.43442708253860474},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4212188720703125},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.4158127009868622},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4156327247619629},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.321283221244812},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.26416850090026855},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22212734818458557},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21254119277000427},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.20189189910888672},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.08878493309020996},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C171606756","wikidata":"https://www.wikidata.org/wiki/Q506132","display_name":"Psychometrics","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1386954","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386954","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1704018133","https://openalex.org/W2097497265","https://openalex.org/W2098374349","https://openalex.org/W2103543101","https://openalex.org/W2115632957","https://openalex.org/W2124451896","https://openalex.org/W2130653422","https://openalex.org/W2132751984","https://openalex.org/W2137926373","https://openalex.org/W2144887125","https://openalex.org/W2154241270","https://openalex.org/W2156747864","https://openalex.org/W2156955559","https://openalex.org/W2158421641","https://openalex.org/W2168209902","https://openalex.org/W6682656800"],"related_works":["https://openalex.org/W1967937306","https://openalex.org/W226604446","https://openalex.org/W4242162185","https://openalex.org/W3021300720","https://openalex.org/W1883834147","https://openalex.org/W2170357422","https://openalex.org/W2076585022","https://openalex.org/W2554003653","https://openalex.org/W4309301673","https://openalex.org/W1565333176"],"abstract_inverted_index":{"Maintaining":[0],"product":[1,110],"quality":[2,111],"at":[3,112],"reasonable":[4],"test":[5,72,88,119],"cost":[6],"in":[7,76,109,118],"very":[8],"deep":[9],"sub-micron":[10],"process":[11],"has":[12],"become":[13],"a":[14,116],"major":[15],"challenge":[16],"especially":[17],"due":[18],"to":[19,54,66],"multiple":[20],"manufacturing":[21],"locations":[22],"with":[23],"varying":[24],"defect":[25,41,96],"and":[26,32,47,64,97],"parametric":[27,45,98],"distributions.":[28],"Increasing":[29],"vector":[30],"counts":[31],"binary":[33],"search":[34],"routines":[35],"are":[36,60,74],"now":[37],"necessary":[38,53],"for":[39],"subtle":[40],"screening.":[42],"In":[43],"addition,":[44],"tests":[46],"at-spec":[48],"testing":[49],"is":[50],"still":[51],"often":[52],"ensure":[55],"customer":[56],"quality.":[57],"Systematic":[58],"defects":[59],"becoming":[61],"more":[62],"common":[63],"threaten":[65],"dominate":[67],"the":[68,81,87,92,101,113],"yield":[69],"Pareto.":[70],"Adaptive":[71],"methods":[73],"introduced":[75],"This":[77],"work":[78],"that":[79],"demonstrate":[80],"capability":[82],"of":[83,100],"increasing":[84],"or":[85,94],"decreasing":[86],"coverage":[89],"based":[90],"on":[91],"predicted":[93],"measured":[95],"behavior":[99],"silicon":[102],"being":[103],"tested.":[104],"Results":[105],"promise":[106],"an":[107],"increase":[108],"same":[114],"time":[115],"reduction":[117],"costs.":[120]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}