{"id":"https://openalex.org/W2118104860","doi":"https://doi.org/10.1109/test.2004.1386950","title":"Removing JTAG bottlenecks in system interconnect test","display_name":"Removing JTAG bottlenecks in system interconnect test","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W2118104860","doi":"https://doi.org/10.1109/test.2004.1386950","mag":"2118104860"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1386950","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386950","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007425755","display_name":"Hong-Shin Jun","orcid":"https://orcid.org/0000-0003-2443-675X"},"institutions":[{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]},{"id":"https://openalex.org/I151281966","display_name":"Cisco Systems (China)","ror":"https://ror.org/02qy75381","country_code":"CN","type":"company","lineage":["https://openalex.org/I135428043","https://openalex.org/I151281966"]}],"countries":["CN","US"],"is_corresponding":true,"raw_author_name":"Hong-Shin Jun","raw_affiliation_strings":["Cisco Systems, Inc., San Jose, CA, USA","Cisco Systems, Inc., San Jose, CA , USA"],"affiliations":[{"raw_affiliation_string":"Cisco Systems, Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I135428043"]},{"raw_affiliation_string":"Cisco Systems, Inc., San Jose, CA , USA","institution_ids":["https://openalex.org/I151281966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039099280","display_name":"Sung Chung","orcid":null},"institutions":[{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]},{"id":"https://openalex.org/I151281966","display_name":"Cisco Systems (China)","ror":"https://ror.org/02qy75381","country_code":"CN","type":"company","lineage":["https://openalex.org/I135428043","https://openalex.org/I151281966"]}],"countries":["CN","US"],"is_corresponding":false,"raw_author_name":"S.S. Chung","raw_affiliation_strings":["Cisco Systems, Inc., San Jose, CA, USA","Cisco Systems, Inc., San Jose, CA , USA"],"affiliations":[{"raw_affiliation_string":"Cisco Systems, Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I135428043"]},{"raw_affiliation_string":"Cisco Systems, Inc., San Jose, CA , USA","institution_ids":["https://openalex.org/I151281966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028169407","display_name":"Sanghyeon Baeg","orcid":"https://orcid.org/0000-0002-6990-1312"},"institutions":[{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]},{"id":"https://openalex.org/I151281966","display_name":"Cisco Systems (China)","ror":"https://ror.org/02qy75381","country_code":"CN","type":"company","lineage":["https://openalex.org/I135428043","https://openalex.org/I151281966"]}],"countries":["CN","US"],"is_corresponding":false,"raw_author_name":"S.H. Baeg","raw_affiliation_strings":["Cisco Systems, Inc., San Jose, CA, USA","Cisco Systems, Inc., San Jose, CA , USA"],"affiliations":[{"raw_affiliation_string":"Cisco Systems, Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I135428043"]},{"raw_affiliation_string":"Cisco Systems, Inc., San Jose, CA , USA","institution_ids":["https://openalex.org/I151281966"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5007425755"],"corresponding_institution_ids":["https://openalex.org/I135428043","https://openalex.org/I151281966"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.18154762,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"173","last_page":"180"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.7728350162506104},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6171406507492065},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5771504640579224},{"id":"https://openalex.org/keywords/skew","display_name":"Skew","score":0.5472949147224426},{"id":"https://openalex.org/keywords/synchronization","display_name":"Synchronization (alternating current)","score":0.5381456613540649},{"id":"https://openalex.org/keywords/latency","display_name":"Latency (audio)","score":0.47585031390190125},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43476101756095886},{"id":"https://openalex.org/keywords/clock-synchronization","display_name":"Clock synchronization","score":0.42297032475471497},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.39085087180137634},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24971088767051697},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.09502503275871277},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07540068030357361}],"concepts":[{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.7728350162506104},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6171406507492065},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5771504640579224},{"id":"https://openalex.org/C43711488","wikidata":"https://www.wikidata.org/wiki/Q7534783","display_name":"Skew","level":2,"score":0.5472949147224426},{"id":"https://openalex.org/C2778562939","wikidata":"https://www.wikidata.org/wiki/Q1298791","display_name":"Synchronization (alternating current)","level":3,"score":0.5381456613540649},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.47585031390190125},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43476101756095886},{"id":"https://openalex.org/C129891060","wikidata":"https://www.wikidata.org/wiki/Q1513059","display_name":"Clock synchronization","level":4,"score":0.42297032475471497},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.39085087180137634},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24971088767051697},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.09502503275871277},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07540068030357361},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1386950","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386950","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1490771654","https://openalex.org/W1575728663","https://openalex.org/W1885016154","https://openalex.org/W2028504835","https://openalex.org/W4231486519","https://openalex.org/W4231732519","https://openalex.org/W4242226835","https://openalex.org/W6629408396"],"related_works":["https://openalex.org/W2187730212","https://openalex.org/W1984658281","https://openalex.org/W4312714696","https://openalex.org/W1986532039","https://openalex.org/W2540672406","https://openalex.org/W2587929255","https://openalex.org/W2364948717","https://openalex.org/W2130974576","https://openalex.org/W3183483298","https://openalex.org/W2356054222"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,17,63],"new":[4],"methodology":[5],"that":[6,88],"removes":[7],"JTAG":[8,14],"bottlenecks":[9],"in":[10],"system":[11,26,36],"interconnect":[12,27],"test.":[13],"test":[15,28,31,85,90],"has":[16],"limitation":[18],"by":[19],"targeting":[20],"only":[21],"low-speed":[22],"testing.":[23,81],"But,":[24],"the":[25,30,40,43,50,56,59,69,89],"requires":[29],"to":[32,48],"be":[33,93],"run":[34],"at":[35],"clock":[37,66],"speed":[38],"through":[39],"cluster":[41,77],"of":[42,55],"network":[44],"and":[45,52,67,79,105],"also":[46],"needs":[47],"diagnose":[49],"skew":[51],"delay":[53,80],"characteristics":[54],"cluster.":[57],"Resolving":[58],"synchronization":[60],"issue":[61],"between":[62],"high-speed":[64],"pattern":[65],"TCK,":[68],"proposed":[70],"technique":[71,91],"enables":[72],"high":[73],"frequency":[74],"interconnection":[75],"testing,":[76,78],"Experimental":[82],"results":[83],"with":[84,95],"vehicles":[86],"show":[87],"can":[92],"used":[94],"complex":[96],"interconnections":[97],"including":[98],"differential":[99],"signal":[100,107],"lines,":[101],"AC":[102],"coupling,":[103],"latency,":[104],"optical":[106],"interconnections.":[108]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}