{"id":"https://openalex.org/W2167258210","doi":"https://doi.org/10.1109/test.2004.1386946","title":"A novel scan chain diagnostics technique based on light emission from leakage current","display_name":"A novel scan chain diagnostics technique based on light emission from leakage current","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W2167258210","doi":"https://doi.org/10.1109/test.2004.1386946","mag":"2167258210"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1386946","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386946","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080343787","display_name":"Peilin Song","orcid":"https://orcid.org/0000-0003-4793-3230"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"P. Song","raw_affiliation_strings":["IBM T.J. Watson Research Center, Yorktown Heights, NY, USA","[IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA]"],"affiliations":[{"raw_affiliation_string":"IBM T.J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"[IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA]","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043549704","display_name":"Franco Stellari","orcid":"https://orcid.org/0000-0002-1510-6882"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F. Stellari","raw_affiliation_strings":["IBM T.J. Watson Research Center, Yorktown Heights, NY, USA","[IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA]"],"affiliations":[{"raw_affiliation_string":"IBM T.J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"[IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA]","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048747574","display_name":"Tian Xia","orcid":"https://orcid.org/0000-0002-4395-7350"},"institutions":[{"id":"https://openalex.org/I111236770","display_name":"University of Vermont","ror":"https://ror.org/0155zta11","country_code":"US","type":"education","lineage":["https://openalex.org/I111236770"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. Xia","raw_affiliation_strings":["ELE Dept., University of Vermont, Burlington, VT","University of Vermont, Burlington, VT,"],"affiliations":[{"raw_affiliation_string":"ELE Dept., University of Vermont, Burlington, VT","institution_ids":["https://openalex.org/I111236770"]},{"raw_affiliation_string":"University of Vermont, Burlington, VT,","institution_ids":["https://openalex.org/I111236770"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088957863","display_name":"Alan J. Weger","orcid":"https://orcid.org/0000-0001-8557-9573"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A.J. Weger","raw_affiliation_strings":["IBM T.J. Watson Research Center, Yorktown Heights, NY, USA","IBM, T.J. Watson Research Center Yorktown Heights, NY"],"affiliations":[{"raw_affiliation_string":"IBM T.J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM, T.J. Watson Research Center Yorktown Heights, NY","institution_ids":["https://openalex.org/I4210114115"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5080343787"],"corresponding_institution_ids":["https://openalex.org/I4210114115"],"apc_list":null,"apc_paid":null,"fwci":5.691,"has_fulltext":false,"cited_by_count":57,"citation_normalized_percentile":{"value":0.9618757,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":93,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"140","last_page":"147"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.7545100450515747},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.6983531713485718},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6758987307548523},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5881209969520569},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.5671997666358948},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5601128339767456},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.53040611743927},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5256879329681396},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4388340413570404},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3562922179698944},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.316093772649765},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.29859721660614014},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2764056921005249},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0909457802772522}],"concepts":[{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.7545100450515747},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.6983531713485718},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6758987307548523},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5881209969520569},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.5671997666358948},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5601128339767456},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.53040611743927},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5256879329681396},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4388340413570404},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3562922179698944},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.316093772649765},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.29859721660614014},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2764056921005249},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0909457802772522},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1386946","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386946","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.550000011920929}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1498956065","https://openalex.org/W1502879325","https://openalex.org/W1835662651","https://openalex.org/W1901671433","https://openalex.org/W1967227789","https://openalex.org/W2031108558","https://openalex.org/W2045664507","https://openalex.org/W2058860919","https://openalex.org/W2076228782","https://openalex.org/W2086932620","https://openalex.org/W2110731889","https://openalex.org/W2123072391","https://openalex.org/W2133812334","https://openalex.org/W2134174349","https://openalex.org/W2139664386","https://openalex.org/W2155038322","https://openalex.org/W2157200201","https://openalex.org/W2157739709","https://openalex.org/W2561899570","https://openalex.org/W3109328898","https://openalex.org/W3110687601","https://openalex.org/W3113418477","https://openalex.org/W3115089118","https://openalex.org/W3115961008","https://openalex.org/W3117657295","https://openalex.org/W6629793900","https://openalex.org/W6638713964","https://openalex.org/W6679907138","https://openalex.org/W6786299019","https://openalex.org/W6787438465","https://openalex.org/W6787765100","https://openalex.org/W6787913602"],"related_works":["https://openalex.org/W4321442002","https://openalex.org/W2015265939","https://openalex.org/W2284072287","https://openalex.org/W2611067230","https://openalex.org/W2480201319","https://openalex.org/W2387706296","https://openalex.org/W2155788121","https://openalex.org/W4235469518","https://openalex.org/W2294325978","https://openalex.org/W2098218272"],"abstract_inverted_index":{"Scan":[0],"chain":[1],"diagnostics":[2],"have":[3,79],"become":[4],"more":[5,18,20],"important":[6],"than":[7],"ever":[8],"due":[9,73],"to":[10,46,74,96],"the":[11,31,34,47,57,68],"increasing":[12],"complexity":[13],"of":[14,38,70],"VLSI":[15,87],"designs,":[16,26],"as":[17],"and":[19,84,100],"scan":[21,106],"latches/flip-flops":[22],"are":[23],"utilized":[24],"in":[25,28,103],"especially":[27],"microprocessors.":[29],"At":[30],"same":[32],"time,":[33],"off-state":[35,75],"leakage":[36,76],"current":[37,77],"CMOS":[39],"technology":[40],"grows":[41],"exponentially":[42],"from":[43],"one":[44],"generation":[45],"next":[48],"one.":[49],"This":[50],"fact":[51],"imposes":[52],"a":[53,104],"big":[54],"challenge":[55],"on":[56,67],"chip":[58],"design,":[59],"packaging,":[60],"cooling,":[61],"etc.":[62],"However,":[63],"innovative":[64],"applications,":[65],"based":[66],"detection":[69],"light":[71],"emission":[72],"(LEOSLC)":[78],"been":[80],"developed":[81],"for":[82],"testing":[83],"diagnosing":[85],"modern":[86],"circuits.":[88],"We":[89],"show":[90],"that":[91],"LEOSLC":[92],"can":[93],"be":[94],"used":[95],"effectively":[97],"debug,":[98],"diagnose,":[99],"localize":[101],"defects":[102],"broken":[105],"chain.":[107]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}