{"id":"https://openalex.org/W1562699972","doi":"https://doi.org/10.1109/test.2004.1386936","title":"Efficient pattern mapping for deterministic logic BIST","display_name":"Efficient pattern mapping for deterministic logic BIST","publication_year":2005,"publication_date":"2005-03-07","ids":{"openalex":"https://openalex.org/W1562699972","doi":"https://doi.org/10.1109/test.2004.1386936","mag":"1562699972"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1386936","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386936","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070545363","display_name":"Valentin Gherman","orcid":"https://orcid.org/0009-0008-8322-9906"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"V. Gherman","raw_affiliation_strings":["Universit\u00e4t Stuttgart, Stuttgart, Germany","Stuttgart University GERMANY"],"affiliations":[{"raw_affiliation_string":"Universit\u00e4t Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Stuttgart University GERMANY","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008775226","display_name":"Hans-Joachim Wunderlich","orcid":"https://orcid.org/0000-0003-4536-8290"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"H.-J. Wunderlich","raw_affiliation_strings":["Universit\u00e4t Stuttgart, Stuttgart, Germany","Stuttgart University GERMANY"],"affiliations":[{"raw_affiliation_string":"Universit\u00e4t Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Stuttgart University GERMANY","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062126489","display_name":"Harald Vranken","orcid":"https://orcid.org/0000-0003-4541-6475"},"institutions":[{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"H. Vranken","raw_affiliation_strings":["Philips Research, Eindhoven, Netherlands","Philips Research Netherlands"],"affiliations":[{"raw_affiliation_string":"Philips Research, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I4210122849"]},{"raw_affiliation_string":"Philips Research Netherlands","institution_ids":["https://openalex.org/I4210122849"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065187948","display_name":"Friedrich Hapke","orcid":"https://orcid.org/0000-0001-8744-3039"},"institutions":[{"id":"https://openalex.org/I4210162505","display_name":"Philips (Germany)","ror":"https://ror.org/05san5604","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210122849","https://openalex.org/I4210162505"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"F. Hapke","raw_affiliation_strings":["Philips Semiconductors, Hamburg, Germany","Philips Semiconductors (Germany)"],"affiliations":[{"raw_affiliation_string":"Philips Semiconductors, Hamburg, Germany","institution_ids":["https://openalex.org/I4210162505"]},{"raw_affiliation_string":"Philips Semiconductors (Germany)","institution_ids":["https://openalex.org/I4210162505"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086797619","display_name":"Michael Wittke","orcid":null},"institutions":[{"id":"https://openalex.org/I4210162505","display_name":"Philips (Germany)","ror":"https://ror.org/05san5604","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210122849","https://openalex.org/I4210162505"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. Wittke","raw_affiliation_strings":["Philips Semiconductors, Hamburg, Germany","Philips Semiconductors (Germany)"],"affiliations":[{"raw_affiliation_string":"Philips Semiconductors, Hamburg, Germany","institution_ids":["https://openalex.org/I4210162505"]},{"raw_affiliation_string":"Philips Semiconductors (Germany)","institution_ids":["https://openalex.org/I4210162505"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044414519","display_name":"M. Garbers","orcid":null},"institutions":[{"id":"https://openalex.org/I4210162505","display_name":"Philips (Germany)","ror":"https://ror.org/05san5604","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210122849","https://openalex.org/I4210162505"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. Garbers","raw_affiliation_strings":["Philips Semiconductors, Hamburg, Germany","Philips Semiconductors (Germany)"],"affiliations":[{"raw_affiliation_string":"Philips Semiconductors, Hamburg, Germany","institution_ids":["https://openalex.org/I4210162505"]},{"raw_affiliation_string":"Philips Semiconductors (Germany)","institution_ids":["https://openalex.org/I4210162505"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5070545363"],"corresponding_institution_ids":["https://openalex.org/I100066346"],"apc_list":null,"apc_paid":null,"fwci":3.1656,"has_fulltext":false,"cited_by_count":51,"citation_normalized_percentile":{"value":0.91258237,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"48","last_page":"56"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/binary-decision-diagram","display_name":"Binary decision diagram","score":0.6988103985786438},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6858625411987305},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4596419632434845},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.454524427652359},{"id":"https://openalex.org/keywords/time-complexity","display_name":"Time complexity","score":0.4490707814693451},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.42743173241615295},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.4074052572250366},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.11818882822990417}],"concepts":[{"id":"https://openalex.org/C3309909","wikidata":"https://www.wikidata.org/wiki/Q864155","display_name":"Binary decision diagram","level":2,"score":0.6988103985786438},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6858625411987305},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4596419632434845},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.454524427652359},{"id":"https://openalex.org/C311688","wikidata":"https://www.wikidata.org/wiki/Q2393193","display_name":"Time complexity","level":2,"score":0.4490707814693451},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.42743173241615295},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.4074052572250366},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.11818882822990417}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/test.2004.1386936","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386936","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.176.5775","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.176.5775","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ra.informatik.uni-stuttgart.de/research/publications/papers/conferences/2004/ETS_GhermWVHW2004.pdf","raw_type":"text"},{"id":"pmh:oai:informatik.uni-stuttgart.de:INPROC-2004-80","is_oa":false,"landing_page_url":"http://www2.informatik.uni-stuttgart.de/cgi-bin/NCSTRL/NCSTRL_view.pl?id=INPROC-2004-80&engl=1","pdf_url":null,"source":{"id":"https://openalex.org/S4306401306","display_name":"Fachbereich Informatik (University of Stuttgart)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I100066346","host_organization_name":"University of Stuttgart","host_organization_lineage":["https://openalex.org/I100066346"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"\\n            In: International Test Conference (ed.): Proceedings of the 35th\\n            IEEE International Test Conference (ITC'04); Charlotte, NC,\\n            USA, October 25-28; 2004, pp. 48-56\\n          ","raw_type":"Text"},{"id":"pmh:oai:informatik.uni-stuttgart.de:INPROC-2004-87","is_oa":false,"landing_page_url":"http://www2.informatik.uni-stuttgart.de/cgi-bin/NCSTRL/NCSTRL_view.pl?id=INPROC-2004-87&engl=1","pdf_url":null,"source":{"id":"https://openalex.org/S4306401306","display_name":"Fachbereich Informatik (University of Stuttgart)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I100066346","host_organization_name":"University of Stuttgart","host_organization_lineage":["https://openalex.org/I100066346"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"\\n            In: IEEE Computer Society (ed.): Proceedings of the 9th IEEE\\n            European Test Sypmposium (ETS'04); Ajaccio, Corsica, France;\\n            May 23-26, 2004, pp. 327-332\\n          ","raw_type":"Text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1536064657","https://openalex.org/W1905213452","https://openalex.org/W1976062726","https://openalex.org/W1994143452","https://openalex.org/W2046314918","https://openalex.org/W2080267935","https://openalex.org/W2097973512","https://openalex.org/W2104478015","https://openalex.org/W2105761964","https://openalex.org/W2111761265","https://openalex.org/W2118133071","https://openalex.org/W2124629389","https://openalex.org/W2130429991","https://openalex.org/W2134998505","https://openalex.org/W2137549092","https://openalex.org/W2144033909","https://openalex.org/W2150853262","https://openalex.org/W2156809456","https://openalex.org/W2167639389","https://openalex.org/W4230343699","https://openalex.org/W4240277685","https://openalex.org/W4246972245","https://openalex.org/W4256404229","https://openalex.org/W4297159816","https://openalex.org/W6676111922","https://openalex.org/W6681008240"],"related_works":["https://openalex.org/W2390183607","https://openalex.org/W2122917767","https://openalex.org/W4300631294","https://openalex.org/W3196342125","https://openalex.org/W86917440","https://openalex.org/W1819373035","https://openalex.org/W4309131146","https://openalex.org/W2188215366","https://openalex.org/W197248315","https://openalex.org/W1974942814"],"abstract_inverted_index":{"Deterministic":[0],"logic":[1],"BIST":[2],"(DLBIST)":[3],"is":[4],"an":[5],"attractive":[6],"test":[7],"strategy,":[8],"since":[9,30],"it":[10],"combines":[11],"advantages":[12],"of":[13,36,68,89],"deterministic":[14],"external":[15],"testing":[16],"and":[17,33,72],"pseudo-random":[18],"LBIST.":[19],"Unfortunately,":[20],"previously":[21],"published":[22],"DLBIST":[23,38,58],"methods":[24],"are":[25,78],"unsuited":[26],"for":[27,93],"large":[28],"ICs,":[29],"computing":[31,70],"time":[32,71],"memory":[34,73],"consumption":[35],"the":[37,48,87,90],"synthesis":[39,59],"algorithms":[40,77,92],"increase":[41],"exponentially,":[42],"or":[43],"at":[44],"least":[45],"cubically,":[46],"with":[47],"circuit":[49],"size.":[50],"In":[51],"this":[52],"paper,":[53],"we":[54],"propose":[55],"a":[56],"novel":[57],"procedure":[60],"that":[61],"has":[62],"nearly":[63],"linear":[64],"complexity":[65],"in":[66],"terms":[67],"both":[69],"consumption.":[74],"The":[75],"new":[76,91],"based":[79],"on":[80],"binary":[81],"decision":[82],"diagrams":[83],"(BDDs).":[84],"We":[85],"demonstrate":[86],"efficiency":[88],"industrial":[94],"designs":[95],"up":[96],"to":[97],"2M":[98],"gates.":[99]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}