{"id":"https://openalex.org/W1504248014","doi":"https://doi.org/10.1109/test.2004.1386930","title":"New test paradigms for yield and manufacturability - Invited address","display_name":"New test paradigms for yield and manufacturability - Invited address","publication_year":2005,"publication_date":"2005-04-12","ids":{"openalex":"https://openalex.org/W1504248014","doi":"https://doi.org/10.1109/test.2004.1386930","mag":"1504248014"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1386930","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386930","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040957547","display_name":"R. Madge","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"R. Madge","raw_affiliation_strings":["Product Engineering, LSI Logic Corporation, USA"],"affiliations":[{"raw_affiliation_string":"Product Engineering, LSI Logic Corporation, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5040957547"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2567,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.54523938,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"13","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9878000020980835,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/design-for-manufacturability","display_name":"Design for manufacturability","score":0.9126601219177246},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6928889751434326},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5633050203323364},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5632765889167786},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5596341490745544},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5185514092445374},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.47244149446487427},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.4462691843509674},{"id":"https://openalex.org/keywords/test-plan","display_name":"Test plan","score":0.4326028823852539},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4147884249687195},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.38397061824798584},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.33444637060165405},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.11578401923179626},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09358102083206177}],"concepts":[{"id":"https://openalex.org/C62064638","wikidata":"https://www.wikidata.org/wiki/Q553878","display_name":"Design for manufacturability","level":2,"score":0.9126601219177246},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6928889751434326},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5633050203323364},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5632765889167786},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5596341490745544},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5185514092445374},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.47244149446487427},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.4462691843509674},{"id":"https://openalex.org/C12148698","wikidata":"https://www.wikidata.org/wiki/Q364651","display_name":"Test plan","level":3,"score":0.4326028823852539},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4147884249687195},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38397061824798584},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.33444637060165405},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.11578401923179626},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09358102083206177},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C2776746162","wikidata":"https://www.wikidata.org/wiki/Q4508","display_name":"Navy","level":2,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1386930","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1386930","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.4099999964237213}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2094969048","https://openalex.org/W994558755","https://openalex.org/W2010746423","https://openalex.org/W3035935536","https://openalex.org/W2117710422","https://openalex.org/W2078862364","https://openalex.org/W2373960738","https://openalex.org/W2348164510","https://openalex.org/W2161912179","https://openalex.org/W1973030117"],"abstract_inverted_index":{"Summary":[0],"form":[1],"only":[2,44],"given,":[3],"as":[4,23,25],"follows.":[5],"Test":[6],"holds":[7],"the":[8,13,26,57,68,71,76,92,103,117,140,164],"key":[9,90,137],"to":[10,74,91,102,106,124,144,150,160,163,173],"success":[11],"in":[12,59,63,66,139,175],"rapidly":[14],"changing":[15],"world":[16,142],"of":[17,29,48,94,133],"process":[18],"technology":[19],"and":[20,38,62,70,78,110,119,127,131,178],"design":[21,69],"complexity":[22],"well":[24],"fashionable":[27],"area":[28],"Design-for-Manufacturability":[30],"(DFM).":[31],"As":[32],"test":[33,51,86,104,108,112,141,148,157,176],"chips":[34],"become":[35],"prohibitively":[36],"expensive":[37],"less":[39],"statistically":[40],"valid,":[41],"it":[42],"is":[43,88,149],"through":[45],"statistical":[46],"analysis":[47],"volume":[49],"product":[50],"data":[52,87],"that":[53,121,167],"we":[54],"can":[55,99],"assess":[56],"improvements":[58],"parametric":[60],"variation":[61],"defectivity":[64],"necessary":[65],"both":[67],"manufacturing":[72],"processes":[73],"meet":[75],"yield":[77],"supply":[79],"chain":[80],"targets":[81],"for":[82],"complex":[83],"ICs.":[84],"Volume":[85],"also":[89],"implementation":[93],"adaptive":[95],"testing.":[96],"Probabilistic":[97],"decisionmaking":[98],"be":[100,161],"applied":[101],"flows":[105],"reduce":[107,128],"costs":[109],"improve":[111],"quality":[113],"by":[114],"specifically":[115],"targeting":[116],"parameters":[118],"defects":[120],"are":[122],"likely":[123],"cause":[125],"failures":[126],"unnecessary":[129],"testing":[130],"burn-in":[132],"defect-free":[134],"die.":[135],"Some":[136],"paradigms":[138],"have":[143],"change,":[145],"however,":[146],"if":[147],"keep":[151],"up":[152],"with":[153],"these":[154],"challenges":[155],"or":[156],"will":[158],"continue":[159],"relegated":[162],"\"non-valueadded\"":[165],"category":[166],"has":[168],"been":[169],"a":[170],"long-standing":[171],"barrier":[172],"investment":[174],"equipment":[177],"software.":[179]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}