{"id":"https://openalex.org/W1492146701","doi":"https://doi.org/10.1109/test.2003.1271151","title":"Multi-gb/s ic test challenges and solutions","display_name":"Multi-gb/s ic test challenges and solutions","publication_year":2004,"publication_date":"2004-07-08","ids":{"openalex":"https://openalex.org/W1492146701","doi":"https://doi.org/10.1109/test.2003.1271151","mag":"1492146701"},"language":"en","primary_location":{"id":"doi:10.1109/test.2003.1271151","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1271151","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077157327","display_name":"B.G. West","orcid":null},"institutions":[{"id":"https://openalex.org/I4210163748","display_name":"PREtest Consult (United States)","ror":"https://ror.org/02xwe8780","country_code":"US","type":"company","lineage":["https://openalex.org/I4210163748"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"B.G. West","raw_affiliation_strings":["NPTest, Inc., CA, USA","NPTest"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NPTest, Inc., CA, USA","institution_ids":[]},{"raw_affiliation_string":"NPTest","institution_ids":["https://openalex.org/I4210163748"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5077157327"],"corresponding_institution_ids":["https://openalex.org/I4210163748"],"apc_list":null,"apc_paid":null,"fwci":0.4137,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.52111887,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1","issue":null,"first_page":"1311","last_page":"1311"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.7985872626304626},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6911008954048157},{"id":"https://openalex.org/keywords/intersymbol-interference","display_name":"Intersymbol interference","score":0.47453773021698},{"id":"https://openalex.org/keywords/sort","display_name":"sort","score":0.4667057991027832},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.4626482427120209},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4461614787578583},{"id":"https://openalex.org/keywords/serial-communication","display_name":"Serial communication","score":0.4187588691711426},{"id":"https://openalex.org/keywords/interval","display_name":"Interval (graph theory)","score":0.41657692193984985},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.41506046056747437},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3208036422729492},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.29271674156188965},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.25131773948669434},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2160598337650299},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.10966774821281433},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10207083821296692}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.7985872626304626},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6911008954048157},{"id":"https://openalex.org/C97812054","wikidata":"https://www.wikidata.org/wiki/Q2166055","display_name":"Intersymbol interference","level":3,"score":0.47453773021698},{"id":"https://openalex.org/C88548561","wikidata":"https://www.wikidata.org/wiki/Q347599","display_name":"sort","level":2,"score":0.4667057991027832},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.4626482427120209},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4461614787578583},{"id":"https://openalex.org/C51707140","wikidata":"https://www.wikidata.org/wiki/Q518280","display_name":"Serial communication","level":2,"score":0.4187588691711426},{"id":"https://openalex.org/C2778067643","wikidata":"https://www.wikidata.org/wiki/Q166507","display_name":"Interval (graph theory)","level":2,"score":0.41657692193984985},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.41506046056747437},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3208036422729492},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.29271674156188965},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.25131773948669434},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2160598337650299},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.10966774821281433},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10207083821296692},{"id":"https://openalex.org/C23123220","wikidata":"https://www.wikidata.org/wiki/Q816826","display_name":"Information retrieval","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2003.1271151","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1271151","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2315668284","https://openalex.org/W2155789024","https://openalex.org/W2109491806","https://openalex.org/W3213608175","https://openalex.org/W2058044441","https://openalex.org/W3117675750","https://openalex.org/W2141743053","https://openalex.org/W3095633856","https://openalex.org/W2118455460"],"abstract_inverted_index":{"Production":[0,110],"test":[1,104,126,360,367,483,509],"and":[2,10,47,101,122,196,256,264,381,490],"device":[3,133],"I/O":[4,342],"characterization":[5,355],"are":[6,74,231,237,241,383],"different":[7,15,19],"tasks.":[8],"Measurements":[9],"analysis":[11],"associated":[12],"with":[13],"these":[14,70,162,354],"tasks":[16,356],"need":[17,501],"quite":[18],"tools.":[20],"1":[21,301],"Serial":[22],"Data":[23],"Links":[24],"-the":[25],"future":[26],"is":[27,59,87,113,134,144,209,216,224,273,278,285,293,303,316,322,331,346,369,403,429,442,448,470],"\u201cbright\u201d":[28],"The":[29],"2001":[30],"ITRS":[31],"predicted":[32],"serial":[33,83,184,459],"datacom":[34],"rates":[35,71],"reaching":[36],"40":[37,48],"GBPS":[38,49],"by":[39,61,170,190,243,450],"this":[40,433,445,468],"year,":[41],"doubling":[42],"within":[43],"a":[44,131,151,159,168,171,182,202,347,358,365,423],"decade":[45],"-":[46,438,441],"production":[50,103,359,366,482],"devices":[51],"now":[52],"exist.":[53],"A":[54],"12.5":[55],"ps":[56,302],"unit":[57,194,205],"interval":[58,195],"tiny":[60],"today\u2019s":[62,341],"standards;":[63],"for":[64,89,502],"reliable":[65,96],"data":[66,84,185,337,460,504],"transmission":[67],"to":[68,91,116,128,138,157,212,306,324,339,350,352,377,432,462],"reach":[69],"the":[72,123,142,267,271,283,336,389,392,398,406,414,454,458,488,492],"challenges":[73],"daunting.":[75],"Despite":[76],"this,":[77],"we":[78],"can":[79,187],"fully":[80],"expect":[81],"such":[82],"links.":[85],"What":[86,371],"required":[88],"them":[90],"be":[92,188,262,307,325,373,499],"producible?":[93],"Quite":[94],"simply:":[95],"design,":[97],"consistent":[98],"process":[99],"technology,":[100],"solid":[102],"capability.":[105],"2":[106],"Design":[107],"Qualification":[108],"vs":[109],"Test":[111],"It":[112,148,452],"absolutely":[114],"necessary":[115,127,338],"distinguish":[117],"clearly":[118],"between":[119],"design":[120,268,272,378],"qualification/characterization":[121],"sort":[124,139],"of":[125,155,177,204,233,300,334,391,408,457],"guarantee":[129],"that":[130],"particular":[132],"manufactured":[135,431],"properly.":[136],"Yet":[137,444],"one":[140],"from":[141,405],"other":[143],"no":[145,500],"mean":[146],"task.":[147],"only":[149],"takes":[150],"few":[152,163,172],"extra":[153,164],"ohms":[154,165],"interconnect":[156],"marginalize":[158],"good":[160],"design;":[161],"will":[166,479],"displace":[167],"transition":[169],"but":[173,235],"unacceptably":[174],"large":[175],"number":[176],"picoseconds.":[178],"Each":[179],"bit":[180,493],"in":[181,291,298,327,364,397,413],"high-speed":[183],"stream":[186,461],"characterized":[189],"two":[191,485],"key":[192],"parameters:":[193],"individual":[197],"edge":[198],"displacement,":[199],"expressed":[200],"as":[201,213,220],"fraction":[203],"interval.":[206],"Edge":[207],"displacement":[208],"often":[210],"referred":[211],"jitter.":[214],"Jitter":[215],"an":[217],"unfortunate":[218],"term,":[219],"it":[221,345,428],"masks":[222],"what":[223],"actually":[225],"going":[226],"on.":[227],"Yes,":[228],"some":[229],"edges":[230,240],"out":[232],"place,":[234],"why":[236],"they?":[238],"Displaced":[239],"created":[242],"intersymbol":[244],"interference,":[245],"internal":[246,464],"systematic":[247,318],"path":[248],"or":[249,314,395,420,476,495,506],"propagation":[250],"delay":[251],"errors,":[252],"clock":[253,469,489],"phase":[254],"error,":[255],"random":[257],"noise.":[258],"These":[259],"errors":[260],"must":[261],"identified":[263],"minimized":[265],"during":[266],"qualification":[269],"phase;":[270],"acceptable":[274],"if":[275,427],"error":[276,321],"rate":[277],"sufficiently":[279],"below":[280],"target":[281,424],"unless":[282],"product":[284],"defective.":[286],"Key":[287],"point:":[288],"\u201crandom":[289],"noise\u201d":[290],"semiconductors":[292],"not":[294,430],"very":[295],"large.":[296],"RJ":[297],"excess":[299],"more":[304],"likely":[305,323],"instrumentation":[308],"noise":[309],"than":[310],"true":[311],"circuit":[312,415],"noise,":[313],"else":[315],"uncorrelated":[317],"error.":[319],"This":[320,401],"correctable":[326],"design.":[328],"Laboratory":[329],"equipment":[330],"generally":[332],"capable":[333],"acquiring":[335],"characterize":[340],"designs.":[343],"However,":[344],"costly":[348],"mistake":[349],"attempt":[351],"translate":[353],"into":[357],"requirement.":[361],"Measuring":[362],"\u201cjitter\u201d":[363],"environment":[368],"unneeded.":[370],"might":[372],"measured":[374],"(and":[375],"compared":[376],"minimum,":[379],"nominal,":[380],"maximum)":[382],"bit-by-bit":[384],"displacements":[385],"focused":[386],"specifically":[387],"on":[388],"structure":[390],"specific":[393,440],"serializers":[394],"deserializers":[396],"signal":[399],"path.":[400],"requirement":[402,435],"derived":[404],"concept":[407],"defect-based":[409],"testing:":[410],"each":[411],"element":[412],"(whether":[416],"transistor,":[417],"passive":[418],"component,":[419],"interconnect)":[421],"has":[422,484],"quality":[425,434],"requirement;":[426],"then":[436,473],"something":[437,439],"wrong.":[443],"overall":[446],"approach":[447],"insufficient":[449],"itself.":[451],"misses":[453],"tight":[455],"coupling":[456],"its":[463],"self-aligned":[465],"clock.":[466],"If":[467],"too":[471],"erratic,":[472],"perfect":[474],"serializing":[475],"deserializing":[477],"circuitry":[478],"break.":[480],"Conclusion:":[481],"requirements:":[486],"qualify":[487,491],"generators":[494],"extractors.":[496],"There":[497],"should":[498],"long":[503,508],"streams,":[505],"concomitant":[507],"times.":[510]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}