{"id":"https://openalex.org/W2151059446","doi":"https://doi.org/10.1109/test.2003.1271119","title":"Panel synopsis - how (In)adequate is one time testing?","display_name":"Panel synopsis - how (In)adequate is one time testing?","publication_year":2004,"publication_date":"2004-07-08","ids":{"openalex":"https://openalex.org/W2151059446","doi":"https://doi.org/10.1109/test.2003.1271119","mag":"2151059446"},"language":"en","primary_location":{"id":"doi:10.1109/test.2003.1271119","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1271119","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028519358","display_name":"Rubin Parekhji","orcid":"https://orcid.org/0009-0000-6625-2786"},"institutions":[{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"R.A. Parekhji","raw_affiliation_strings":["Texas Instruments (India) Private Limited, Bangalore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments (India) Private Limited, Bangalore, India","institution_ids":["https://openalex.org/I4210109535"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5028519358"],"corresponding_institution_ids":["https://openalex.org/I4210109535"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"1","issue":null,"first_page":"1279","last_page":"1279"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9646000266075134,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9585000276565552,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6241993308067322}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6241993308067322}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2003.1271119","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1271119","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2350741829","https://openalex.org/W2130043461","https://openalex.org/W2530322880"],"abstract_inverted_index":{"While":[0],"the":[1,13,27,45,70,85,89,102,117,141,163,180,186,192,224,227,234,274,280,291,321,342],"topics":[2],"of":[3,77,92,105,195,215,229,293,296,311,338,370,382,424,439],"periodic":[4,48,160,414,434],"and":[5,15,18,54,87,122,131,134,185,191,203,279,319,323,360,367,378,410,437,444],"concurrent":[6],"testing":[7,49,74,161,222],"have":[8,124],"been":[9,125,238],"well":[10,111],"researched":[11],"in":[12,20,63,84,116,140,162,183,189,210,223,226,240,243,248,307,349,354],"literature,":[14],"techniques":[16,32,386,412,432],"developed":[17],"deployed":[19],"mission":[21],"critical":[22,75,244],"systems":[23,241,257],"for":[24,29,47,72,146,150,261,413,433],"several":[25],"years,":[26],"need":[28,46,71],"incorporating":[30],"these":[31],"into":[33,233,315],"nanometer":[34,355],"technology":[35,99,356],"chips":[36,80,340],"is":[37,168,285],"being":[38],"felt":[39],"now.":[40],"Contrary":[41],"to":[42,153,197,282,326,332,393,420],"common":[43],"belief,":[44],"may":[50,56],"exist":[51],"even":[52],"today":[53],"we":[55],"be":[57,277,333],"missing":[58],"failures":[59],"during":[60,81,218,358,361],"normal":[61,219,301],"operation":[62,217,275,302],"dense":[64],"chips.":[65],"This":[66,166,287],"panel":[67,288],"debates":[68],"on":[69,128,341,365,376,388],"periodically":[73],"components":[76],"today's":[78,316,339],"complex":[79,317],"in-use":[82],"conditions":[83],"field,":[86,225],"investigates":[88],"possible":[90],"incompleteness":[91],"manufacturing":[93,359],"time":[94],"(one":[95],"time)":[96],"testing.":[97,415,435],"Nanometer":[98],"designs":[100,196,357],"face":[101],"dual":[103],"problems":[104],"design":[106,129,132,136,171,322,405,409],"correctness":[107],"upon":[108],"manufacture":[109],"as":[110,112,148,170],"after":[113],"it.":[114],"Issues":[115],"former":[118],"are":[119,143],"better":[120],"understood":[121],"solutions":[123],"proposed":[126],"based":[127,387],"styles":[130],"margins,":[133],"accompanying":[135],"automation.":[137],"However,":[138],"issues":[139,331],"latter":[142],"only":[144],"analysed":[145],"reliability,":[147],"against":[149],"errors":[151],"due":[152],"hard":[154],"or":[155,303],"soft":[156],"failures,":[157],"which":[158],"require":[159],"field":[164],"itself.":[165],"problem":[167],"aggravated":[169],"geometries":[172],"shrink,":[173],"with":[174,300,404],"an":[175,211],"increasingly":[176,212],"larger":[177,213],"mis-correlation":[178],"between":[179],"expected":[181],"behaviour":[182,188],"simulation":[184],"actual":[187],"silicon,":[190],"increased":[193],"susceptibility":[194],"internal":[198],"disturbances,":[199,205],"(e.g.":[200,206],"switching":[201],"conditions),":[202],"external":[204],"atmospheric":[207],"radiation),":[208],"resulting":[209],"probability":[214],"incorrect":[216],"operation.":[220],"Periodic":[221],"form":[228],"test":[230,270,324,390,440],"support":[231,421],"built":[232,314],"hardware":[235],"system,":[236],"has":[237],"employed":[239],"used":[242,260],"applications,":[245],"e.g.":[246],"mainframes":[247],"online":[249],"transaction":[250],"processing,":[251],"process":[252],"control":[253,256],"systems,":[254],"navigation":[255],"(including":[258],"those":[259],"spacecrafts),":[262],"telephone":[263],"exchanges,":[264],"life":[265],"saving":[266],"equipment,":[267,271],"high":[268],"end":[269],"etc.,":[272],"where":[273],"must":[276],"uninterrupted":[278],"tolerance":[281],"any":[283],"error":[284],"nil.":[286],"will":[289],"investigate":[290],"necessity":[292],"such":[294],"forms":[295],"testing,":[297],"(either":[298],"concurrently":[299],"at":[304],"regular":[305],"intervals),":[306],"a":[308],"wider":[309],"class":[310],"circuit":[312],"functions":[313],"chips,":[318],"sensitise":[320],"community":[325],"this":[327],"new":[328],"challenge.":[329],"The":[330],"investigated":[334],"include:":[335],"(a)":[336],"Reliability":[337],"field.":[343],"Failure":[344,352],"rates.":[345],"Debug":[346],"mechanisms":[347,375],"presently":[348],"use.":[350,362],"(b)":[351],"modes":[353],"Their":[363,442],"impact":[364],"logic":[366],"memories.":[368],"Impact":[369],"corresponding":[371],"fault":[372],"condition":[373],"detection":[374],"yield":[377],"reliability.":[379],"(c)":[380],"Adequacy":[381],"present":[383],"defect":[384],"screening":[385],"static":[389],"coverage.":[391],"Enhancements":[392],"address":[394],"very":[395],"low":[396],"DPPM":[397],"(defective":[398],"parts":[399],"per":[400],"million)":[401],"requirements.":[402],"Tradeoffs":[403],"margins.":[406],"(d)":[407],"Circuit":[408],"synthesis":[411],"Design":[416,436],"methodology":[417],"changes":[418],"required":[419],"them.":[422,428],"Type":[423],"faults":[425],"targetted":[426],"by":[427],"(e)":[429],"System":[430],"level":[431],"integration":[438],"IPs.":[441],"re-use":[443],"applications.":[445]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}