{"id":"https://openalex.org/W2103015257","doi":"https://doi.org/10.1109/test.2003.1271111","title":"Circular bist testing the digital logic within a high speed serdes","display_name":"Circular bist testing the digital logic within a high speed serdes","publication_year":2004,"publication_date":"2004-07-08","ids":{"openalex":"https://openalex.org/W2103015257","doi":"https://doi.org/10.1109/test.2003.1271111","mag":"2103015257"},"language":"en","primary_location":{"id":"doi:10.1109/test.2003.1271111","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1271111","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060897846","display_name":"G. Hetherington","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]},{"id":"https://openalex.org/I4210140924","display_name":"Texas Instruments (United Kingdom)","ror":"https://ror.org/04eg77e50","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210140924","https://openalex.org/I74760111"]}],"countries":["GB","US"],"is_corresponding":true,"raw_author_name":"G. Hetherington","raw_affiliation_strings":["Texas Instruments Limited, Northampton, UK","Texas Instruments Ltd"],"affiliations":[{"raw_affiliation_string":"Texas Instruments Limited, Northampton, UK","institution_ids":["https://openalex.org/I4210140924"]},{"raw_affiliation_string":"Texas Instruments Ltd","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056752809","display_name":"Richard Simpson","orcid":null},"institutions":[{"id":"https://openalex.org/I4210140924","display_name":"Texas Instruments (United Kingdom)","ror":"https://ror.org/04eg77e50","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210140924","https://openalex.org/I74760111"]},{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["GB","US"],"is_corresponding":false,"raw_author_name":"R. Simpson","raw_affiliation_strings":["Texas Instruments Limited, Northampton, UK","Texas Instruments Ltd"],"affiliations":[{"raw_affiliation_string":"Texas Instruments Limited, Northampton, UK","institution_ids":["https://openalex.org/I4210140924"]},{"raw_affiliation_string":"Texas Instruments Ltd","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5060897846"],"corresponding_institution_ids":["https://openalex.org/I4210140924","https://openalex.org/I74760111"],"apc_list":null,"apc_paid":null,"fwci":0.7899,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.720736,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1","issue":null,"first_page":"1221","last_page":"1228"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/serdes","display_name":"SerDes","score":0.9886941909790039},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5408940315246582},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5122544169425964},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.41851726174354553},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3785676956176758},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.36425358057022095},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3284863233566284},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31882867217063904}],"concepts":[{"id":"https://openalex.org/C19707634","wikidata":"https://www.wikidata.org/wiki/Q6510662","display_name":"SerDes","level":2,"score":0.9886941909790039},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5408940315246582},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5122544169425964},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.41851726174354553},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3785676956176758},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.36425358057022095},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3284863233566284},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31882867217063904}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2003.1271111","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1271111","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W260727648","https://openalex.org/W1515082873","https://openalex.org/W1883987698","https://openalex.org/W1905213452","https://openalex.org/W2049812801","https://openalex.org/W2082208455","https://openalex.org/W2111151532","https://openalex.org/W2116631296","https://openalex.org/W2128124475","https://openalex.org/W2534966171","https://openalex.org/W6679278346"],"related_works":["https://openalex.org/W2145876553","https://openalex.org/W1999544091","https://openalex.org/W2139221936","https://openalex.org/W2017861587","https://openalex.org/W2019727651","https://openalex.org/W2790811635","https://openalex.org/W2344039297","https://openalex.org/W2600032170","https://openalex.org/W2110446288","https://openalex.org/W2151471266"],"abstract_inverted_index":{"High":[0],"Speed":[1],"Serializer":[2],"Deserializers":[3],"(serdes)":[4],"are":[5],"traditionally":[6],"tested":[7],"using":[8,25],"functional":[9],"BIST.":[10],"This":[11],"paper":[12],"presents":[13],"an":[14],"improved":[15],"BlST":[16],"for":[17],"testing":[18],"the":[19],"digital":[20],"part":[21],"of":[22],"a":[23],"serdes":[24],"circular":[26],"BET.":[27]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}