{"id":"https://openalex.org/W2169280266","doi":"https://doi.org/10.1109/test.2003.1271094","title":"On-chip compression of output responses with unknown values using lfsr reseeding","display_name":"On-chip compression of output responses with unknown values using lfsr reseeding","publication_year":2004,"publication_date":"2004-07-08","ids":{"openalex":"https://openalex.org/W2169280266","doi":"https://doi.org/10.1109/test.2003.1271094","mag":"2169280266"},"language":"en","primary_location":{"id":"doi:10.1109/test.2003.1271094","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1271094","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103275478","display_name":"Masato Naruse","orcid":"https://orcid.org/0000-0002-4084-1117"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"M. Naruse","raw_affiliation_strings":["RENASAS Technology corp., Kodaira-shi, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"RENASAS Technology corp., Kodaira-shi, Tokyo, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017901396","display_name":"I. Porneranz","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"I. Porneranz","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077101123","display_name":"S.M. Reddy","orcid":"https://orcid.org/0000-0001-9208-8262"},"institutions":[{"id":"https://openalex.org/I126307644","display_name":"University of Iowa","ror":"https://ror.org/036jqmy94","country_code":"US","type":"education","lineage":["https://openalex.org/I126307644"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.M. Reddy","raw_affiliation_strings":["ECE Dept., University of Iowa, Iowa City, IA, USA"],"affiliations":[{"raw_affiliation_string":"ECE Dept., University of Iowa, Iowa City, IA, USA","institution_ids":["https://openalex.org/I126307644"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054064879","display_name":"Sandip Kundu","orcid":"https://orcid.org/0000-0001-8221-3824"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Kundu","raw_affiliation_strings":["Intel corp., Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Intel corp., Austin, TX, USA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5103275478"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":8.468,"has_fulltext":false,"cited_by_count":96,"citation_normalized_percentile":{"value":0.98082091,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"1","issue":null,"first_page":"1060","last_page":"1068"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linear-feedback-shift-register","display_name":"Linear feedback shift register","score":0.7614208459854126},{"id":"https://openalex.org/keywords/compression","display_name":"Compression (physics)","score":0.614438533782959},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5804907083511353},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.520677924156189},{"id":"https://openalex.org/keywords/data-compression","display_name":"Data compression","score":0.44573381543159485},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.4109647274017334},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3833466172218323},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.36733126640319824},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2343462109565735},{"id":"https://openalex.org/keywords/shift-register","display_name":"Shift register","score":0.2176063060760498},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.08370444178581238},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0587887167930603}],"concepts":[{"id":"https://openalex.org/C159862308","wikidata":"https://www.wikidata.org/wiki/Q681101","display_name":"Linear feedback shift register","level":4,"score":0.7614208459854126},{"id":"https://openalex.org/C180016635","wikidata":"https://www.wikidata.org/wiki/Q2712821","display_name":"Compression (physics)","level":2,"score":0.614438533782959},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5804907083511353},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.520677924156189},{"id":"https://openalex.org/C78548338","wikidata":"https://www.wikidata.org/wiki/Q2493","display_name":"Data compression","level":2,"score":0.44573381543159485},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.4109647274017334},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3833466172218323},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.36733126640319824},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2343462109565735},{"id":"https://openalex.org/C49654631","wikidata":"https://www.wikidata.org/wiki/Q746165","display_name":"Shift register","level":3,"score":0.2176063060760498},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.08370444178581238},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0587887167930603},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2003.1271094","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1271094","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5600000023841858,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W260727648","https://openalex.org/W1515082873","https://openalex.org/W1553303713","https://openalex.org/W1581011258","https://openalex.org/W1582825744","https://openalex.org/W1863819993","https://openalex.org/W2004437077","https://openalex.org/W2019631303","https://openalex.org/W2021756047","https://openalex.org/W2066974842","https://openalex.org/W2109761157","https://openalex.org/W2123535960","https://openalex.org/W2127343408","https://openalex.org/W2134998505","https://openalex.org/W2135931142","https://openalex.org/W2138530143","https://openalex.org/W2139009001","https://openalex.org/W2140283778","https://openalex.org/W2144033909","https://openalex.org/W2152279620","https://openalex.org/W2162223996","https://openalex.org/W2163285146","https://openalex.org/W2169449309","https://openalex.org/W2215675469","https://openalex.org/W2270313873","https://openalex.org/W4230587734","https://openalex.org/W4233616805","https://openalex.org/W6651354974"],"related_works":["https://openalex.org/W2391979783","https://openalex.org/W2101477403","https://openalex.org/W4245086458","https://openalex.org/W3011195299","https://openalex.org/W2356249392","https://openalex.org/W2612632602","https://openalex.org/W2321805087","https://openalex.org/W2065289416","https://openalex.org/W2115579119","https://openalex.org/W2017236304"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":8}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}