{"id":"https://openalex.org/W2135733524","doi":"https://doi.org/10.1109/test.2003.1271093","title":"Simulating resistive bridging and stuck-at faults","display_name":"Simulating resistive bridging and stuck-at faults","publication_year":2004,"publication_date":"2004-07-08","ids":{"openalex":"https://openalex.org/W2135733524","doi":"https://doi.org/10.1109/test.2003.1271093","mag":"2135733524"},"language":"en","primary_location":{"id":"doi:10.1109/test.2003.1271093","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1271093","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113076316","display_name":"P. Engelke","orcid":null},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"P. Engelke","raw_affiliation_strings":["Albert Ludwig University, Freiburg im Breisgau, Germany","Albert Ludwigs University Freiburg"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Albert Ludwig University, Freiburg im Breisgau, Germany","institution_ids":["https://openalex.org/I161046081"]},{"raw_affiliation_string":"Albert Ludwigs University Freiburg","institution_ids":["https://openalex.org/I161046081"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027416202","display_name":"Ilia Polian","orcid":"https://orcid.org/0000-0002-6563-2725"},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"I. Polian","raw_affiliation_strings":["Albert Ludwig University, Freiburg im Breisgau, Germany","Albert-Ludwigs-Universit\u00e4t Freiburg"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Albert Ludwig University, Freiburg im Breisgau, Germany","institution_ids":["https://openalex.org/I161046081"]},{"raw_affiliation_string":"Albert-Ludwigs-Universit\u00e4t Freiburg","institution_ids":["https://openalex.org/I161046081"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069159925","display_name":"M. Renovell","orcid":"https://orcid.org/0000-0002-3896-8231"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]},{"id":"https://openalex.org/I4210145979","display_name":"Laboratoire de Conception et d'Int\u00e9gration des Syst\u00e8mes","ror":"https://ror.org/04eg25g76","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I4210145979","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. Renovell","raw_affiliation_strings":["LIRMM-UMII, Montpellier, France","Conception et Test de Syst\u00e8mes MICro\u00e9lectroniques"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LIRMM-UMII, Montpellier, France","institution_ids":["https://openalex.org/I4210101743"]},{"raw_affiliation_string":"Conception et Test de Syst\u00e8mes MICro\u00e9lectroniques","institution_ids":["https://openalex.org/I4210145979"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038861833","display_name":"Bernd Becker","orcid":"https://orcid.org/0000-0003-4031-3258"},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"B. Becker","raw_affiliation_strings":["Albert Ludwig University, Freiburg im Breisgau, Germany","Albert-Ludwigs-Universit\u00e4t Freiburg"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Albert Ludwig University, Freiburg im Breisgau, Germany","institution_ids":["https://openalex.org/I161046081"]},{"raw_affiliation_string":"Albert-Ludwigs-Universit\u00e4t Freiburg","institution_ids":["https://openalex.org/I161046081"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.7079,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.93834854,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"1","issue":null,"first_page":"1051","last_page":"1059"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bridging","display_name":"Bridging (networking)","score":0.9377811551094055},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.6862872838973999},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.590545654296875},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.12358680367469788},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11412495374679565}],"concepts":[{"id":"https://openalex.org/C174348530","wikidata":"https://www.wikidata.org/wiki/Q188635","display_name":"Bridging (networking)","level":2,"score":0.9377811551094055},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6862872838973999},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.590545654296875},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.12358680367469788},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11412495374679565}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2003.1271093","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1271093","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W654442335","https://openalex.org/W1551719130","https://openalex.org/W1638854017","https://openalex.org/W1652447308","https://openalex.org/W1853233938","https://openalex.org/W1853776572","https://openalex.org/W1961775031","https://openalex.org/W1969896938","https://openalex.org/W2096007426","https://openalex.org/W2098335643","https://openalex.org/W2103839382","https://openalex.org/W2113979938","https://openalex.org/W2121440068","https://openalex.org/W2123181463","https://openalex.org/W2123957829","https://openalex.org/W2125954748","https://openalex.org/W2129751319","https://openalex.org/W2131924443","https://openalex.org/W2136159433","https://openalex.org/W2140414722","https://openalex.org/W2143022120","https://openalex.org/W2144016413","https://openalex.org/W2145395384","https://openalex.org/W2154418718","https://openalex.org/W2154446644","https://openalex.org/W2161511567","https://openalex.org/W2168971185","https://openalex.org/W3139599180","https://openalex.org/W6636825777"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4388870064","https://openalex.org/W4235186151","https://openalex.org/W2054685365","https://openalex.org/W2272354214","https://openalex.org/W2120383820","https://openalex.org/W2043010663","https://openalex.org/W2667588871","https://openalex.org/W4248308508","https://openalex.org/W118554674"],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2],"simulator":[3],"for":[4,56,64,93],"resistive":[5,65],"bridging":[6,66],"and":[7,49,67,72,82],"stuck-at":[8,68],"faults.":[9],"In":[10],"contrast":[11],"to":[12,87],"earlier":[13,50],"work,":[14],"it":[15],"is":[16,37,53],"based":[17],"on":[18,55],"electrical":[19],"equations":[20],"rather":[21],"than":[22],"table":[23],"look-up,":[24],"thus":[25],"exposing":[26],"more":[27],"flexibility.":[28],"For":[29],"the":[30,94],"first":[31,95],"time,":[32],"simulation":[33],"of":[34,42,77],"sequential":[35,73],"circuits":[36],"dealt":[38],"with;":[39],"reciprocal":[40],"action":[41],"fault":[43,78],"effects":[44],"in":[45,70],"current":[46],"time":[47,51],"frame":[48],"frames":[52],"elaborated":[54],"different":[57],"bridge":[58],"resistances.":[59],"Experimental":[60],"results":[61,84],"are":[62,80,91],"given":[63,92],"faults":[69],"combinational":[71],"circuits.":[74],"Different":[75],"definitions":[76,90],"coverage":[79],"listed":[81],"quantitative":[83],"with":[85],"respect":[86],"all":[88],"these":[89],"time.":[96]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}