{"id":"https://openalex.org/W2113399863","doi":"https://doi.org/10.1109/test.2003.1271092","title":"Using logic models to predict the detection behavior of statistical timing defects","display_name":"Using logic models to predict the detection behavior of statistical timing defects","publication_year":2004,"publication_date":"2004-07-08","ids":{"openalex":"https://openalex.org/W2113399863","doi":"https://doi.org/10.1109/test.2003.1271092","mag":"2113399863"},"language":"en","primary_location":{"id":"doi:10.1109/test.2003.1271092","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1271092","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100369642","display_name":"Li-C. Wang","orcid":"https://orcid.org/0000-0003-4851-8004"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"L.-C. Wang","raw_affiliation_strings":["Department of ECE, DC-Santa Barbara"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ECE, DC-Santa Barbara","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111934210","display_name":"A. Krsti\u0107","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A. Krstic","raw_affiliation_strings":["Department of ECE, DC-Santa Barbara"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ECE, DC-Santa Barbara","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034755537","display_name":"L. Lee","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"L. Lee","raw_affiliation_strings":["Department of ECE, DC-Santa Barbara"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ECE, DC-Santa Barbara","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077687075","display_name":"Kwang\u2010Ting Cheng","orcid":"https://orcid.org/0000-0002-3885-4912"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kwang-Ting Cheng","raw_affiliation_strings":["Department of ECE, DC-Santa Barbara"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ECE, DC-Santa Barbara","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":51,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"1","issue":null,"first_page":"1041","last_page":"1050"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7977572083473206},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6206707954406738},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5989856123924255},{"id":"https://openalex.org/keywords/statistical-model","display_name":"Statistical model","score":0.5564007759094238},{"id":"https://openalex.org/keywords/statistical-hypothesis-testing","display_name":"Statistical hypothesis testing","score":0.45082637667655945},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4461529850959778},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.41860824823379517},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4178534150123596},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17709049582481384},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.16782689094543457}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7977572083473206},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6206707954406738},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5989856123924255},{"id":"https://openalex.org/C114289077","wikidata":"https://www.wikidata.org/wiki/Q3284399","display_name":"Statistical model","level":2,"score":0.5564007759094238},{"id":"https://openalex.org/C87007009","wikidata":"https://www.wikidata.org/wiki/Q210832","display_name":"Statistical hypothesis testing","level":2,"score":0.45082637667655945},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4461529850959778},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.41860824823379517},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4178534150123596},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17709049582481384},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.16782689094543457},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2003.1271092","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1271092","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-77849","is_oa":false,"landing_page_url":"http://repository.hkust.edu.hk/ir/Record/1783.1-77849","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference paper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":43,"referenced_works":["https://openalex.org/W1690611602","https://openalex.org/W1725193629","https://openalex.org/W1823801491","https://openalex.org/W1917217922","https://openalex.org/W1985476435","https://openalex.org/W1988192422","https://openalex.org/W1991398325","https://openalex.org/W2008350620","https://openalex.org/W2043411903","https://openalex.org/W2051907727","https://openalex.org/W2074760143","https://openalex.org/W2106078350","https://openalex.org/W2106246015","https://openalex.org/W2106571261","https://openalex.org/W2109172132","https://openalex.org/W2109791184","https://openalex.org/W2111670167","https://openalex.org/W2112727903","https://openalex.org/W2117314013","https://openalex.org/W2119927730","https://openalex.org/W2121708049","https://openalex.org/W2127676287","https://openalex.org/W2128164886","https://openalex.org/W2129212061","https://openalex.org/W2132376539","https://openalex.org/W2132778431","https://openalex.org/W2133058970","https://openalex.org/W2133505378","https://openalex.org/W2136032562","https://openalex.org/W2143258279","https://openalex.org/W2147709193","https://openalex.org/W2147973376","https://openalex.org/W2149342513","https://openalex.org/W2153047365","https://openalex.org/W2157571503","https://openalex.org/W2159571837","https://openalex.org/W2168517735","https://openalex.org/W2171908682","https://openalex.org/W3148660165","https://openalex.org/W4245703168","https://openalex.org/W4247608823","https://openalex.org/W6679241621","https://openalex.org/W6683403585"],"related_works":["https://openalex.org/W2378211422","https://openalex.org/W4321353415","https://openalex.org/W2745001401","https://openalex.org/W2130974462","https://openalex.org/W2028665553","https://openalex.org/W2086519370","https://openalex.org/W4246352526","https://openalex.org/W2121910908","https://openalex.org/W4387527746","https://openalex.org/W4256548255"],"abstract_inverted_index":{"In":[0,37],"this":[1],"paper,":[2],"we":[3,69],"study":[4],"the":[5,15,28,33,38,40,46,62,79,92,96,106],"possibility":[6],"of":[7,18,64,78,91,99,109],"using":[8],"logic":[9,26,56],"defect-level":[10],"prediction":[11],"models":[12,57],"to":[13,60,105],"predict":[14,61],"detection":[16,63,97,107],"behavior":[17,98,108],"statistical":[19,65,110,118],"timing":[20,66,111],"defects.":[21,67,112],"We":[22,51,83,113],"compare":[23],"two":[24],"known":[25],"models:":[27],"Williams-Brown":[29],"(WB)":[30],"model":[31,74],"and":[32,122,124],"Mercer-Park-Grimaila-Dworak":[34],"(MPGD)":[35],"model.":[36],"WB-model,":[39],"defect":[41,120],"coverage":[42],"is":[43],"replaced":[44],"by":[45,86],"n-detection":[47],"transition":[48,81,94],"fault":[49],"coverage.":[50],"first":[52],"demonstrate":[53],"that":[54],"both":[55],"may":[58],"fail":[59],"Then,":[68],"propose":[70],"an":[71],"improved":[72],"WB":[73],"based":[75,127],"upon":[76,128],"selection":[77],"hard-to-detect":[80,93],"faults.":[82],"show":[84],"that,":[85],"selecting":[87],"a":[88],"proper":[89],"subset":[90],"faults,":[95],"these":[100],"faults":[101],"can":[102],"correlate":[103],"well":[104],"explain":[114],"our":[115],"findings":[116],"through":[117],"delay":[119],"injection":[121],"simulation,":[123],"report":[125],"results":[126],"various":[129],"benchmark":[130],"circuits.":[131]},"counts_by_year":[{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}