{"id":"https://openalex.org/W2098374349","doi":"https://doi.org/10.1109/test.2003.1271071","title":"Deformations of ic structure in test and yield learning","display_name":"Deformations of ic structure in test and yield learning","publication_year":2004,"publication_date":"2004-07-08","ids":{"openalex":"https://openalex.org/W2098374349","doi":"https://doi.org/10.1109/test.2003.1271071","mag":"2098374349"},"language":"en","primary_location":{"id":"doi:10.1109/test.2003.1271071","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1271071","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013238154","display_name":"W. Maly","orcid":null},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W. Maly","raw_affiliation_strings":["Carnegie Mellon University, Pittsburgh, PA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026865205","display_name":"Anne Gattiker","orcid":null},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Gattiker","raw_affiliation_strings":["Carnegie Mellon University, Pittsburgh, PA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019306942","display_name":"T. Zanon","orcid":null},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. Zanon","raw_affiliation_strings":["Carnegie Mellon University, Pittsburgh, PA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020200055","display_name":"Thijs Vogels","orcid":"https://orcid.org/0000-0002-5884-4842"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. Vogels","raw_affiliation_strings":["Carnegie Mellon University, Pittsburgh, PA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039038157","display_name":"R. D. Blanton","orcid":"https://orcid.org/0000-0001-6108-2925"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R.D. Blanton","raw_affiliation_strings":["Carnegie Mellon University, Pittsburgh, PA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063826809","display_name":"T. Storey","orcid":null},"institutions":[{"id":"https://openalex.org/I65376102","display_name":"PDF Solutions (United States)","ror":"https://ror.org/007737841","country_code":"US","type":"company","lineage":["https://openalex.org/I65376102"]},{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. Storey","raw_affiliation_strings":["PDF Solutions, Carnegie Mellon University, Pittsburgh, PA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"PDF Solutions, Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139","https://openalex.org/I65376102"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.0952,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.96629213,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"1","issue":null,"first_page":"856","last_page":"865"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.6819257736206055},{"id":"https://openalex.org/keywords/blueprint","display_name":"Blueprint","score":0.6377984881401062},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.5920144319534302},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5893272757530212},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5557519197463989},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.4800213873386383},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4568830132484436},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.45001450181007385},{"id":"https://openalex.org/keywords/cognitive-science","display_name":"Cognitive science","score":0.3451688885688782},{"id":"https://openalex.org/keywords/epistemology","display_name":"Epistemology","score":0.3255295753479004},{"id":"https://openalex.org/keywords/psychology","display_name":"Psychology","score":0.25850948691368103},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.25610291957855225},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20495644211769104},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.20118501782417297},{"id":"https://openalex.org/keywords/philosophy","display_name":"Philosophy","score":0.10524770617485046},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.0836186408996582}],"concepts":[{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.6819257736206055},{"id":"https://openalex.org/C155911762","wikidata":"https://www.wikidata.org/wiki/Q422321","display_name":"Blueprint","level":2,"score":0.6377984881401062},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.5920144319534302},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5893272757530212},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5557519197463989},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.4800213873386383},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4568830132484436},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.45001450181007385},{"id":"https://openalex.org/C188147891","wikidata":"https://www.wikidata.org/wiki/Q147638","display_name":"Cognitive science","level":1,"score":0.3451688885688782},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.3255295753479004},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.25850948691368103},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.25610291957855225},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20495644211769104},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.20118501782417297},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.10524770617485046},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0836186408996582},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2003.1271071","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1271071","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":54,"referenced_works":["https://openalex.org/W59256056","https://openalex.org/W1527363716","https://openalex.org/W1592689466","https://openalex.org/W1695545649","https://openalex.org/W1735018384","https://openalex.org/W1955440229","https://openalex.org/W1968835137","https://openalex.org/W1978232794","https://openalex.org/W1986941465","https://openalex.org/W1991398325","https://openalex.org/W2003506352","https://openalex.org/W2032743383","https://openalex.org/W2083988308","https://openalex.org/W2098112833","https://openalex.org/W2100827158","https://openalex.org/W2100875390","https://openalex.org/W2107566947","https://openalex.org/W2108827798","https://openalex.org/W2112146416","https://openalex.org/W2112978605","https://openalex.org/W2118435391","https://openalex.org/W2119862847","https://openalex.org/W2119927730","https://openalex.org/W2123181463","https://openalex.org/W2124227409","https://openalex.org/W2124677378","https://openalex.org/W2129563753","https://openalex.org/W2130231461","https://openalex.org/W2132829258","https://openalex.org/W2135329032","https://openalex.org/W2139730802","https://openalex.org/W2142606518","https://openalex.org/W2146488229","https://openalex.org/W2151244242","https://openalex.org/W2152131832","https://openalex.org/W2155454734","https://openalex.org/W2164001463","https://openalex.org/W2164768227","https://openalex.org/W2167138208","https://openalex.org/W2505380584","https://openalex.org/W2532344226","https://openalex.org/W2809413928","https://openalex.org/W2884479736","https://openalex.org/W3114676154","https://openalex.org/W3118009276","https://openalex.org/W3118097827","https://openalex.org/W4230433944","https://openalex.org/W4239330251","https://openalex.org/W6602367459","https://openalex.org/W6680356280","https://openalex.org/W6752832882","https://openalex.org/W6787893379","https://openalex.org/W6787905475","https://openalex.org/W6788376913"],"related_works":["https://openalex.org/W2384575798","https://openalex.org/W2265189214","https://openalex.org/W2766654718","https://openalex.org/W2007211730","https://openalex.org/W2379378785","https://openalex.org/W1975337239","https://openalex.org/W1971312788","https://openalex.org/W345637833","https://openalex.org/W2182844422","https://openalex.org/W2600085362"],"abstract_inverted_index":{"Abstract":[0],"This":[1],"paper":[2,180,208,221],"argues":[3],"that":[4],"the":[5,96,102,130,149,163,170,175,199,217,220],"existing":[6],"approaches":[7],"to":[8,145,194,210,224,233],"modelingand":[9],"characterization":[10,68],"of":[11,20,26,45,48,56,63,89,101,112,126,134,148,151,159,178,206,219,227,239],"IC":[12,50,57],"malfunctions":[13],"are":[14,36,136,169],"inadequate":[15],"fortest":[16],"and":[17,30,32,38,54,86,104],"yield":[18,73],"learning":[19,238],"Deep":[21],"Sub-Micron":[22],"(DSM)":[23],"products.Traditional":[24],"notions":[25],"a":[27,67],"spot":[28],"defect":[29,79],"local":[31],"global":[33],"pro-cess":[34],"variations":[35],"analyzed":[37],"their":[39],"shortcomings":[40],"areexposed.":[41],"A":[42,203],"detailed":[43],"taxonomy":[44],"process-induced":[46],"deforma-tions":[47],"DSM":[49,200],"structures,":[51],"enabling":[52,65],"modeling":[53],"charac-terization":[55],"malfunctions,":[58],"is":[59,69,117,143,222],"proposed.":[60],"The":[61,83,99],"blueprint":[62],"aroadmap":[64],"such":[66],"suggested.":[70],"Keywords":[71],":":[72],"learning,":[74],"fault":[75],"modeling,":[76],"defects,":[77],"diagno-sis,":[78],"characterization.":[80],"1":[81],"Introduction":[82],"motivation,":[84],"purpose":[85],"overall":[87],"structure":[88],"this":[90,113,179,207],"paperhave":[91],"already":[92],"been":[93],"explained":[94],"in":[95,129,140],"abstract":[97],"above.":[98],"dis-cussion":[100],"prior":[103],"relevant":[105,127],"publications":[106],"should":[107,231],"be":[108],"thenext":[109],"natural":[110],"component":[111],"paper.":[114],"But":[115],"it":[116],"skipped":[118,144],"aswell,":[119],"even":[120],"if":[121],"there":[122],"exists":[123],"substantial":[124,204],"body":[125],"publi-cations":[128],"related":[131,152],"domain":[132],"(some":[133],"them":[135],"listed":[137],"as":[138],"ref-erences":[139],"[1,2].)":[141],"It":[142],"avoid":[146],"unnecessarydiscussion":[147],"weaknesses":[150],"results":[153],"presented":[154],"inthe":[155],"past.":[156],"Simply,":[157],"majority":[158],"published":[160],"papers":[161,172],"with":[162],"ICtechnology-oriented":[164],"flavour":[165],"(and":[166],"prime":[167],"examples":[168],"fol-lowing":[171],"co-written":[173],"by":[174,198],"first":[176],"author":[177],"[3,4,":[181],"5,":[182],"6,":[183],"7,":[184],"8])":[185],"do":[186],"not":[187],"offer":[188],"sufficient":[189],"insight":[190],"into":[191],"failure":[192],"mech-anisms":[193],"address":[195],"challenges":[196],"posed":[197],"era":[201,241],"prod-ucts.":[202],"portion":[205],"attempts":[209],"justify":[211],"theabove,":[212],"somewhat":[213],"provocative":[214],"claim.":[215],"Then":[216],"remainingportion":[218],"used":[223],"suggest":[225],"directions":[226],"theresearch,":[228],"which":[229],"we":[230],"undertake":[232],"truly":[234],"assist":[235],"test":[236],"andyield":[237],"modern":[240],"ICs.":[242]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}