{"id":"https://openalex.org/W2143533928","doi":"https://doi.org/10.1109/test.2003.1270865","title":"A high precision iddq measurement system with improved dynamic load regulation","display_name":"A high precision iddq measurement system with improved dynamic load regulation","publication_year":2004,"publication_date":"2004-07-08","ids":{"openalex":"https://openalex.org/W2143533928","doi":"https://doi.org/10.1109/test.2003.1270865","mag":"2143533928"},"language":"en","primary_location":{"id":"doi:10.1109/test.2003.1270865","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1270865","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102971792","display_name":"Noriaki Sato","orcid":"https://orcid.org/0000-0002-6808-0751"},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"N. Sato","raw_affiliation_strings":["Advantest Corporation, Meiwa, Gunma, Japan"],"affiliations":[{"raw_affiliation_string":"Advantest Corporation, Meiwa, Gunma, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039677395","display_name":"Y. Hashimoto","orcid":"https://orcid.org/0009-0007-5383-8068"},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Hashimoto","raw_affiliation_strings":["Advantest Corporation, Meiwa, Gunma, Japan"],"affiliations":[{"raw_affiliation_string":"Advantest Corporation, Meiwa, Gunma, Japan","institution_ids":["https://openalex.org/I4210103901"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5102971792"],"corresponding_institution_ids":["https://openalex.org/I4210103901"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17647059,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1","issue":null,"first_page":"410","last_page":"414"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.9941157102584839},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.620301365852356},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48657357692718506},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44916069507598877},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.413874089717865},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3760823607444763},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3383098244667053},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07249698042869568}],"concepts":[{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.9941157102584839},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.620301365852356},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48657357692718506},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44916069507598877},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.413874089717865},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3760823607444763},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3383098244667053},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07249698042869568},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2003.1270865","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1270865","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7099999785423279,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2108472236","https://openalex.org/W2127145135"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2164017138","https://openalex.org/W2181536841","https://openalex.org/W2121399123","https://openalex.org/W2946329844","https://openalex.org/W1549631873","https://openalex.org/W2109445684","https://openalex.org/W2102383741","https://openalex.org/W2075762290","https://openalex.org/W2111156521"],"abstract_inverted_index":{"This":[0,50,59],"paper":[1,60],"describes":[2],"a":[3,15,27],"system":[4,51],"for":[5,67],"performing":[6],"high":[7],"precision":[8],"IDDQ":[9,64],"measurement":[10,23],"of":[11,30,35,71,75],"CMOS":[12],"ICs":[13],"having":[14],"large":[16],"peak":[17],"current":[18,34],"during":[19,39],"operation.":[20],"Although":[21],"the":[22,32,46,68,76],"rate":[24],"is":[25,52],"at":[26],"low":[28],"speed":[29],"200uS,":[31],"average":[33],"up":[36],"to":[37,55],"1A":[38],"operation":[40],"may":[41],"be":[42],"accepted":[43],"by":[44],"improving":[45],"dynamic":[47],"load":[48],"regulation.":[49],"also":[53],"applicable":[54],"conventional":[56],"testing":[57],"apparatus.":[58],"covers":[61],"problems":[62],"in":[63],"testing,":[65],"solution":[66],"problems,":[69],"embodiment":[70],"each":[72],"circuit,":[73],"verijication":[74],"results,":[77],"conclusion":[78],"and":[79],"future":[80],"issues.":[81]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}