{"id":"https://openalex.org/W2169517241","doi":"https://doi.org/10.1109/test.2003.1270861","title":"Exploiting programmable bist for the diagnosis of embedded memory cores","display_name":"Exploiting programmable bist for the diagnosis of embedded memory cores","publication_year":2004,"publication_date":"2004-07-08","ids":{"openalex":"https://openalex.org/W2169517241","doi":"https://doi.org/10.1109/test.2003.1270861","mag":"2169517241"},"language":"en","primary_location":{"id":"doi:10.1109/test.2003.1270861","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1270861","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024226992","display_name":"D. Appello","orcid":"https://orcid.org/0000-0001-8178-2785"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"D. Appello","raw_affiliation_strings":["STMicroelectronics, TPA Mixed Signal Test Solution Group, Cornaredo, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, TPA Mixed Signal Test Solution Group, Cornaredo, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049430681","display_name":"Paolo Bernardi","orcid":"https://orcid.org/0000-0002-0985-9327"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"P. Bernardi","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Turino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Turino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084021125","display_name":"A. Fudoli","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Fudoli","raw_affiliation_strings":["STMicroelectronics, TPA Mixed Signal Test Solution Group, Cornaredo, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, TPA Mixed Signal Test Solution Group, Cornaredo, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076102072","display_name":"Maurizio Rebaudengo","orcid":"https://orcid.org/0000-0002-7135-7694"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Rebaudengo","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Turino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Turino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058555274","display_name":"M. Sonza Reorda","orcid":"https://orcid.org/0000-0003-2899-7669"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M.S. Reorda","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Turino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Turino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043908290","display_name":"Vincenzo Tancorre","orcid":"https://orcid.org/0000-0001-7959-0784"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"V. Tancorre","raw_affiliation_strings":["STMicroelectronics, TPA Mixed Signal Test Solution Group, Cornaredo, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, TPA Mixed Signal Test Solution Group, Cornaredo, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087219426","display_name":"M. Violante","orcid":"https://orcid.org/0000-0002-5821-3418"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Violante","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Turino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Turino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5024226992"],"corresponding_institution_ids":["https://openalex.org/I4210154781"],"apc_list":null,"apc_paid":null,"fwci":4.4896,"has_fulltext":false,"cited_by_count":41,"citation_normalized_percentile":{"value":0.94571847,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"1","issue":null,"first_page":"379","last_page":"385"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reuse","display_name":"Reuse","score":0.7361971139907837},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7349345684051514},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.6971782445907593},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6487876176834106},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3218235373497009},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16542556881904602}],"concepts":[{"id":"https://openalex.org/C206588197","wikidata":"https://www.wikidata.org/wiki/Q846574","display_name":"Reuse","level":2,"score":0.7361971139907837},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7349345684051514},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.6971782445907593},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6487876176834106},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3218235373497009},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16542556881904602},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2003.1270861","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1270861","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"},{"id":"pmh:oai:porto.polito.it:1498942","is_oa":false,"landing_page_url":"http://porto.polito.it/1498942/","pdf_url":null,"source":{"id":"https://openalex.org/S4306402038","display_name":"PORTO Publications Open Repository TOrino (Politecnico di Torino)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I177477856","host_organization_name":"Politecnico di Torino","host_organization_lineage":["https://openalex.org/I177477856"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5299999713897705,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1596724070","https://openalex.org/W1905213452","https://openalex.org/W1924406256","https://openalex.org/W1994887588","https://openalex.org/W1994950055","https://openalex.org/W2021130660","https://openalex.org/W2063435983","https://openalex.org/W2106478410","https://openalex.org/W2106935654","https://openalex.org/W2119285239","https://openalex.org/W2121938580","https://openalex.org/W2129640538","https://openalex.org/W2133058970","https://openalex.org/W2134643048","https://openalex.org/W2134822007","https://openalex.org/W2142661102","https://openalex.org/W2150714491","https://openalex.org/W2155288938","https://openalex.org/W2164333395","https://openalex.org/W2503952136","https://openalex.org/W4229714877","https://openalex.org/W4234025235","https://openalex.org/W4252060717","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2000444236","https://openalex.org/W2390279801","https://openalex.org/W2384475851","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2353602216","https://openalex.org/W2382290278","https://openalex.org/W2110446288"],"abstract_inverted_index":{"This":[0],"paper":[1],"addresses":[2],"the":[3,48,53,79,85,88,101,104],"issue":[4],"of":[5,52,81,87,95,103],"testing":[6,38],"and":[7,32,39,50,56,93,99],"diagnosing":[8],"a":[9,14,23,28],"memory":[10,97],"core":[11],"embedded":[12],"in":[13,72],"complex":[15],"SOC.":[16],"The":[17,64],"proposed":[18,62],"solution":[19,55,65],"is":[20,33],"based":[21],"on":[22],"P1500-compliant":[24],"wrapper":[25],"that":[26],"follows":[27],"programmable":[29],"BIST":[30],"approach":[31],"able":[34],"to":[35,46,57],"support":[36],"both":[37],"diagnosis.":[40],"Experimental":[41],"results":[42],"are":[43],"provided":[44],"allowing":[45],"evaluate":[47],"benefits":[49],"limitations":[51],"adopted":[54],"compare":[58],"it":[59],"with":[60],"previously":[61],"ones.":[63],"takes":[66],"into":[67],"account":[68],"several":[69],"constraints":[70],"existing":[71],"an":[73],"industrial":[74],"environment,":[75],"such":[76],"as":[77],"minimizing":[78,100],"cost":[80,102],"test":[82,92],"development,":[83],"easing":[84],"reuse":[86],"available":[89],"architectures":[90],"for":[91],"diagnosis":[94],"different":[96],"types":[98],"external":[105],"ATE.":[106]},"counts_by_year":[{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}