{"id":"https://openalex.org/W2110977962","doi":"https://doi.org/10.1109/test.2003.1270853","title":"Progressive bridge identification","display_name":"Progressive bridge identification","publication_year":2004,"publication_date":"2004-07-08","ids":{"openalex":"https://openalex.org/W2110977962","doi":"https://doi.org/10.1109/test.2003.1270853","mag":"2110977962"},"language":"en","primary_location":{"id":"doi:10.1109/test.2003.1270853","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1270853","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020200055","display_name":"Thijs Vogels","orcid":"https://orcid.org/0000-0002-5884-4842"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"T.J. Vogels","raw_affiliation_strings":["Center for Silicon System Implementation (Test Group), Carnegie Mellon University, Pittsburgh, PA, USA","Carnegie Mellon University"],"affiliations":[{"raw_affiliation_string":"Center for Silicon System Implementation (Test Group), Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]},{"raw_affiliation_string":"Carnegie Mellon University","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013238154","display_name":"W. Maly","orcid":null},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W. Maly","raw_affiliation_strings":["Center for Silicon System Implementation (Test Group), Carnegie Mellon University, Pittsburgh, PA, USA","Carnegie-Mellon University, Pittsburgh, PA"],"affiliations":[{"raw_affiliation_string":"Center for Silicon System Implementation (Test Group), Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]},{"raw_affiliation_string":"Carnegie-Mellon University, Pittsburgh, PA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111967389","display_name":"R.D. Blanton","orcid":null},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R.D.S. Blanton","raw_affiliation_strings":["Center for Silicon System Implementation (Test Group), Carnegie Mellon University, Pittsburgh, PA, USA","Carnegie-Mellon University, Pittsburgh, PA"],"affiliations":[{"raw_affiliation_string":"Center for Silicon System Implementation (Test Group), Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]},{"raw_affiliation_string":"Carnegie-Mellon University, Pittsburgh, PA","institution_ids":["https://openalex.org/I74973139"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5020200055"],"corresponding_institution_ids":["https://openalex.org/I74973139"],"apc_list":null,"apc_paid":null,"fwci":1.8524,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.84766675,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"1","issue":null,"first_page":"309","last_page":"318"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7059600353240967},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.6807069778442383},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6746270656585693},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6454639434814453},{"id":"https://openalex.org/keywords/bridge","display_name":"Bridge (graph theory)","score":0.6371873617172241},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.5656338334083557},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5274822115898132},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4769143760204315},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4750147759914398},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.47367483377456665},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4297953248023987},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.42933568358421326},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.40327101945877075},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3771458566188812},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.36039474606513977},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.28609970211982727},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2835579514503479},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2825978100299835},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.27008581161499023},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11405977606773376},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.092570960521698}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7059600353240967},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.6807069778442383},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6746270656585693},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6454639434814453},{"id":"https://openalex.org/C100776233","wikidata":"https://www.wikidata.org/wiki/Q2532492","display_name":"Bridge (graph theory)","level":2,"score":0.6371873617172241},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.5656338334083557},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5274822115898132},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4769143760204315},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4750147759914398},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.47367483377456665},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4297953248023987},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.42933568358421326},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.40327101945877075},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3771458566188812},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.36039474606513977},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.28609970211982727},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2835579514503479},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2825978100299835},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.27008581161499023},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11405977606773376},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.092570960521698},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2003.1270853","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1270853","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.128.5167","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.128.5167","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.itcprogramdev.org/itc2003proc/papers/pdfs/0012_1c.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5400000214576721,"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1554885925","https://openalex.org/W1830318039","https://openalex.org/W1970654607","https://openalex.org/W2098374349","https://openalex.org/W2109892423","https://openalex.org/W2122459133","https://openalex.org/W2123181463","https://openalex.org/W2130231461","https://openalex.org/W2132704666","https://openalex.org/W2137641348","https://openalex.org/W2138735239","https://openalex.org/W2139730802","https://openalex.org/W2164001463","https://openalex.org/W2171012943","https://openalex.org/W2518501055","https://openalex.org/W2587271961","https://openalex.org/W3118097827","https://openalex.org/W3141183454","https://openalex.org/W4240026072","https://openalex.org/W4302458519","https://openalex.org/W6788376913"],"related_works":["https://openalex.org/W2340957901","https://openalex.org/W4256030018","https://openalex.org/W2147400189","https://openalex.org/W3147038789","https://openalex.org/W2068571131","https://openalex.org/W1555400249","https://openalex.org/W2115005577","https://openalex.org/W2092357065","https://openalex.org/W1493811107","https://openalex.org/W2913077774"],"abstract_inverted_index":{"We":[0,59],"present":[1,60],"an":[2],"efficient":[3],"algorithm":[4],"for":[5,25,62],"identification":[6,48],"of":[7,33,87],"two-line":[8,18],"bridges":[9],"in":[10],"combinational":[11],"CMOS":[12],"logic":[13],"that":[14],"narrows":[15],"down":[16],"the":[17,30,76,85],"bridge":[19,34,47],"candidates":[20],"based":[21],"on":[22],"tester":[23],"responses":[24],"voltage":[26],"tests.":[27],"Due":[28],"to":[29],"implicit":[31],"enumeration":[32],"sites,":[35],"no":[36],"layout":[37],"extraction":[38],"or":[39],"precomputed":[40],"stuck-at":[41],"fault":[42,68,81],"dictionaries":[43],"are":[44],"required.":[45],"The":[46],"is":[49],"easily":[50],"refined":[51],"using":[52],"additional":[53],"test":[54],"pattern":[55],"results":[56,61],"when":[57],"necessary.":[58],"benchmark":[63],"circuits":[64],"and":[65,73,83],"four":[66],"common":[67],"models":[69],"(wired-AND,":[70],"wired-OR,":[71],"dominant,":[72],"composite),":[74],"evaluate":[75],"diagnosis":[77],"against":[78],"other":[79],"possible":[80],"types,":[82],"summarize":[84],"quality":[86],"our":[88],"results.":[89],"1.":[90]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}