{"id":"https://openalex.org/W2123423290","doi":"https://doi.org/10.1109/test.2003.1270826","title":"Cmos built-in test architecture for high-speed jitter measurement","display_name":"Cmos built-in test architecture for high-speed jitter measurement","publication_year":2004,"publication_date":"2004-07-08","ids":{"openalex":"https://openalex.org/W2123423290","doi":"https://doi.org/10.1109/test.2003.1270826","mag":"2123423290"},"language":"en","primary_location":{"id":"doi:10.1109/test.2003.1270826","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1270826","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035615782","display_name":"Hung-Peng Lin","orcid":"https://orcid.org/0000-0002-0868-5564"},"institutions":[{"id":"https://openalex.org/I201448701","display_name":"University of Washington","ror":"https://ror.org/00cvxb145","country_code":"US","type":"education","lineage":["https://openalex.org/I201448701"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"H.C. Lin","raw_affiliation_strings":["Department of Electrical Engineering, University of Washington, Seattle, WA","Department of Electrical Engineering, University of Washington, Seattle, WA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Washington, Seattle, WA","institution_ids":["https://openalex.org/I201448701"]},{"raw_affiliation_string":"Department of Electrical Engineering, University of Washington, Seattle, WA, USA","institution_ids":["https://openalex.org/I201448701"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111925076","display_name":"Kim Taylor","orcid":null},"institutions":[{"id":"https://openalex.org/I201448701","display_name":"University of Washington","ror":"https://ror.org/00cvxb145","country_code":"US","type":"education","lineage":["https://openalex.org/I201448701"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Taylor","raw_affiliation_strings":["Department of Electrical Engineering, University of Washington, Seattle, WA","Department of Electrical Engineering, University of Washington, Seattle, WA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Washington, Seattle, WA","institution_ids":["https://openalex.org/I201448701"]},{"raw_affiliation_string":"Department of Electrical Engineering, University of Washington, Seattle, WA, USA","institution_ids":["https://openalex.org/I201448701"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075182832","display_name":"Alex Chong","orcid":"https://orcid.org/0000-0001-7289-7521"},"institutions":[{"id":"https://openalex.org/I201448701","display_name":"University of Washington","ror":"https://ror.org/00cvxb145","country_code":"US","type":"education","lineage":["https://openalex.org/I201448701"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Chong","raw_affiliation_strings":["Department of Electrical Engineering, University of Washington, Seattle, WA","Department of Electrical Engineering, University of Washington, Seattle, WA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Washington, Seattle, WA","institution_ids":["https://openalex.org/I201448701"]},{"raw_affiliation_string":"Department of Electrical Engineering, University of Washington, Seattle, WA, USA","institution_ids":["https://openalex.org/I201448701"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108647056","display_name":"E. Chan","orcid":null},"institutions":[{"id":"https://openalex.org/I201448701","display_name":"University of Washington","ror":"https://ror.org/00cvxb145","country_code":"US","type":"education","lineage":["https://openalex.org/I201448701"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E. Chan","raw_affiliation_strings":["Department of Electrical Engineering, University of Washington, Seattle, WA","Department of Electrical Engineering, University of Washington, Seattle, WA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Washington, Seattle, WA","institution_ids":["https://openalex.org/I201448701"]},{"raw_affiliation_string":"Department of Electrical Engineering, University of Washington, Seattle, WA, USA","institution_ids":["https://openalex.org/I201448701"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112265787","display_name":"M. Soma","orcid":null},"institutions":[{"id":"https://openalex.org/I201448701","display_name":"University of Washington","ror":"https://ror.org/00cvxb145","country_code":"US","type":"education","lineage":["https://openalex.org/I201448701"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Soma","raw_affiliation_strings":["Department of Electrical Engineering, University of Washington, Seattle, WA","Department of Electrical Engineering, University of Washington, Seattle, WA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Washington, Seattle, WA","institution_ids":["https://openalex.org/I201448701"]},{"raw_affiliation_string":"Department of Electrical Engineering, University of Washington, Seattle, WA, USA","institution_ids":["https://openalex.org/I201448701"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108361644","display_name":"H. Haggag","orcid":null},"institutions":[{"id":"https://openalex.org/I16269868","display_name":"Santa Clara University","ror":"https://ror.org/03ypqe447","country_code":"US","type":"education","lineage":["https://openalex.org/I16269868"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. Haggag","raw_affiliation_strings":["National Semiconductor, Santa Clara Design Center, Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"National Semiconductor, Santa Clara Design Center, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I16269868"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048603864","display_name":"J. Huard","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Huard","raw_affiliation_strings":["National Semiconductor, Tacoma Design Center, Federal Way, WA","National Semiconductor, Tacoma Design Center, Federal Way, WA, USA"],"affiliations":[{"raw_affiliation_string":"National Semiconductor, Tacoma Design Center, Federal Way, WA","institution_ids":[]},{"raw_affiliation_string":"National Semiconductor, Tacoma Design Center, Federal Way, WA, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091272943","display_name":"J. A. Braat","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Braat","raw_affiliation_strings":["Tacoma Design Center, National Semiconductor, Federal Way, WA"],"affiliations":[{"raw_affiliation_string":"Tacoma Design Center, National Semiconductor, Federal Way, WA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5035615782"],"corresponding_institution_ids":["https://openalex.org/I201448701"],"apc_list":null,"apc_paid":null,"fwci":6.2541,"has_fulltext":false,"cited_by_count":32,"citation_normalized_percentile":{"value":0.96716003,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"1","issue":null,"first_page":"67","last_page":"76"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9781031608581543},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6690565943717957},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5856013298034668},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5771144032478333},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.485443651676178},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4523214101791382},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.4242344796657562},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.41289421916007996},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.26424282789230347},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21007704734802246},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09764754772186279}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9781031608581543},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6690565943717957},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5856013298034668},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5771144032478333},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.485443651676178},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4523214101791382},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.4242344796657562},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.41289421916007996},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.26424282789230347},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21007704734802246},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09764754772186279},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2003.1270826","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2003.1270826","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference, 2003. Proceedings. ITC 2003.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7400000095367432}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1536986550","https://openalex.org/W1691451471","https://openalex.org/W1932648966","https://openalex.org/W1943406714","https://openalex.org/W2011733719","https://openalex.org/W2105233835","https://openalex.org/W2108021536","https://openalex.org/W2121182846","https://openalex.org/W2121955149","https://openalex.org/W2144401740","https://openalex.org/W2147922245","https://openalex.org/W6632075683"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2155789024","https://openalex.org/W2315668284","https://openalex.org/W3213608175","https://openalex.org/W2109491806","https://openalex.org/W3117675750","https://openalex.org/W2141743053","https://openalex.org/W2037276323","https://openalex.org/W3095633856","https://openalex.org/W2058044441"],"abstract_inverted_index":{"A":[0],"BIST":[1],"method":[2],"measures":[3],"accumulated":[4],"jitter":[5,32],"over":[6],"N":[7],"periods":[8],"and":[9],"requires":[10],"no":[11],"external":[12],"references.":[13],"Simulation":[14],"using":[15],"a":[16,20],"0.25um":[17],"process":[18],"shows":[19],"625MHz":[21],"-":[22],"I":[23],"GHz":[24],"input":[25],"range":[26],"with":[27],"resolution":[28],"of":[29],"70ps":[30],"RMS":[31],"occupying":[33],"0.05":[34],"75mmz":[35],"area.":[36]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}