{"id":"https://openalex.org/W2161853162","doi":"https://doi.org/10.1109/test.2002.1041936","title":"Is board test worth talking about?","display_name":"Is board test worth talking about?","publication_year":2005,"publication_date":"2005-08-24","ids":{"openalex":"https://openalex.org/W2161853162","doi":"https://doi.org/10.1109/test.2002.1041936","mag":"2161853162"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041936","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041936","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055791424","display_name":"Bill Eklow","orcid":null},"institutions":[{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"B. Eklow","raw_affiliation_strings":["Cisco Systems, Inc., USA"],"affiliations":[{"raw_affiliation_string":"Cisco Systems, Inc., USA","institution_ids":["https://openalex.org/I135428043"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5055791424"],"corresponding_institution_ids":["https://openalex.org/I135428043"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.23129252,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1235","last_page":"1235"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9732000231742859,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/casual","display_name":"Casual","score":0.7150131464004517},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.7058860063552856},{"id":"https://openalex.org/keywords/on-board","display_name":"On board","score":0.6658796072006226},{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.5566643476486206},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48349860310554504},{"id":"https://openalex.org/keywords/observer","display_name":"Observer (physics)","score":0.4660640358924866},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3845893144607544},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.36505138874053955},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.3519572615623474},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10651963949203491},{"id":"https://openalex.org/keywords/political-science","display_name":"Political science","score":0.09567108750343323},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.0879659652709961},{"id":"https://openalex.org/keywords/law","display_name":"Law","score":0.08500111103057861}],"concepts":[{"id":"https://openalex.org/C2781426162","wikidata":"https://www.wikidata.org/wiki/Q2275793","display_name":"Casual","level":2,"score":0.7150131464004517},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.7058860063552856},{"id":"https://openalex.org/C3018963415","wikidata":"https://www.wikidata.org/wiki/Q16878425","display_name":"On board","level":2,"score":0.6658796072006226},{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.5566643476486206},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48349860310554504},{"id":"https://openalex.org/C2780704645","wikidata":"https://www.wikidata.org/wiki/Q9251458","display_name":"Observer (physics)","level":2,"score":0.4660640358924866},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3845893144607544},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.36505138874053955},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.3519572615623474},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10651963949203491},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.09567108750343323},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.0879659652709961},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.08500111103057861},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041936","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041936","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/1","display_name":"No poverty","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1005754617","https://openalex.org/W756683672","https://openalex.org/W2979523788","https://openalex.org/W2014044877","https://openalex.org/W3141514971","https://openalex.org/W1673318806","https://openalex.org/W2166929399","https://openalex.org/W3124834840","https://openalex.org/W3215211012","https://openalex.org/W2490317329"],"abstract_inverted_index":{"From":[0],"the":[1,14,22,34,92],"viewpoint":[2],"of":[3,13,64,74],"a":[4,59,75],"casual":[5],"observer,":[6],"it":[7],"appears":[8],"that":[9,43],"less":[10],"than":[11],"10%":[12],"paper":[15],"and":[16,47,68,94],"panel":[17],"presentations":[18],"at":[19,102],"ITC":[20],"in":[21],"last":[23],"10":[24],"years":[25],"have":[26,36],"been":[27],"related":[28],"to":[29,57],"board":[30,93],"test.":[31],"Of":[32],"those,":[33],"majority":[35],"focused":[37],"on":[38],"boundary":[39],"scan":[40],"testing.":[41],"Note":[42],"both":[44,65],"IEEE":[45,48],"1149.1":[46],"1149.4":[49],"are":[50,97],"standards":[51],"for":[52,62],"IC\u2019s.":[53],"Board":[54],"testing":[55],"continues":[56],"be":[58],"significant":[60],"challenge":[61],"producers":[63],"high":[66,69],"volume":[67],"complexity":[70],"PWA\u2019s.":[71],"The":[72],"impact":[73],"poor":[76],"board/system":[77],"test":[78,96],"strategy":[79],"is":[80,89],"felt":[81],"even":[82],"more":[83,100],"by":[84],"contract":[85],"manufacturers.":[86],"So":[87],"why":[88],"it,":[90],"then,":[91],"system":[95],"not":[98],"receiving":[99],"attention":[101],"ITC?":[103]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}