{"id":"https://openalex.org/W1865082683","doi":"https://doi.org/10.1109/test.2002.1041923","title":"Test time impact of redundancy repair in embedded flash memory","display_name":"Test time impact of redundancy repair in embedded flash memory","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W1865082683","doi":"https://doi.org/10.1109/test.2002.1041923","mag":"1865082683"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041923","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041923","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035298587","display_name":"P. Okino","orcid":null},"institutions":[{"id":"https://openalex.org/I138285227","display_name":"Agilent Technologies (United States)","ror":"https://ror.org/02tryst02","country_code":"US","type":"company","lineage":["https://openalex.org/I138285227"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"P. Okino","raw_affiliation_strings":["Agilent Technologies, Inc., USA","[Agilent Technologies"],"affiliations":[{"raw_affiliation_string":"Agilent Technologies, Inc., USA","institution_ids":["https://openalex.org/I138285227"]},{"raw_affiliation_string":"[Agilent Technologies","institution_ids":["https://openalex.org/I138285227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5035298587"],"corresponding_institution_ids":["https://openalex.org/I138285227"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09079396,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1220","last_page":"1220"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9855999946594238,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.897359311580658},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.6939400434494019},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.662061333656311},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5891693830490112},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5653643608093262},{"id":"https://openalex.org/keywords/memory-test","display_name":"Memory test","score":0.4808383882045746},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.447734534740448},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.349905788898468},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.2310737669467926},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18004891276359558},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10638129711151123}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.897359311580658},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.6939400434494019},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.662061333656311},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5891693830490112},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5653643608093262},{"id":"https://openalex.org/C3017990537","wikidata":"https://www.wikidata.org/wiki/Q6815759","display_name":"Memory test","level":3,"score":0.4808383882045746},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.447734534740448},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.349905788898468},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.2310737669467926},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18004891276359558},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10638129711151123},{"id":"https://openalex.org/C169760540","wikidata":"https://www.wikidata.org/wiki/Q207011","display_name":"Neuroscience","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C169900460","wikidata":"https://www.wikidata.org/wiki/Q2200417","display_name":"Cognition","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041923","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041923","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/8","display_name":"Decent work and economic growth","score":0.44999998807907104}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1998662473","https://openalex.org/W2075391483","https://openalex.org/W2742348144","https://openalex.org/W2038820605","https://openalex.org/W1985417357","https://openalex.org/W2115053376","https://openalex.org/W1865082683","https://openalex.org/W2382858638","https://openalex.org/W2347362599","https://openalex.org/W2349966504"],"abstract_inverted_index":{"Summary":[0],"form":[1],"only":[2],"given.":[3],"Redundancy":[4],"repair":[5,61,73],"of":[6,59,71],"high-density":[7],"commodity":[8],"flash":[9,76],"memory":[10,77],"is":[11,62],"an":[12],"effective":[13],"technique":[14],"to":[15,33],"improve":[16],"per-wafer":[17],"yield":[18],"by":[19],"trading-off":[20],"increased":[21,25],"die":[22],"size":[23],"and":[24,38,52],"time":[26],"at":[27],"wafer-probe":[28],"for":[29,74],"the":[30,35,40,57],"ATE":[31],"system":[32],"analyze":[34],"failing":[36],"bits":[37],"make":[39],"necessary":[41],"repairs.":[42],"In":[43],"embedded":[44,75],"flash,":[45],"where":[46],"densities":[47],"are":[48],"typically":[49],"much":[50],"lower":[51],"test":[53],"requirements":[54],"more":[55],"diverse,":[56],"benefit":[58],"redundancy":[60,72],"less":[63],"certain.":[64],"This":[65],"paper":[66],"discusses":[67],"two":[68],"key":[69],"aspects":[70],"blocks.":[78]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}