{"id":"https://openalex.org/W1827698292","doi":"https://doi.org/10.1109/test.2002.1041922","title":"Test and repair of embedded flash memories","display_name":"Test and repair of embedded flash memories","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W1827698292","doi":"https://doi.org/10.1109/test.2002.1041922","mag":"1827698292"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041922","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041922","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110222566","display_name":"J.M. Daga","orcid":null},"institutions":[{"id":"https://openalex.org/I4210150879","display_name":"Atmel (France)","ror":"https://ror.org/04q92cj22","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210150581","https://openalex.org/I4210150879"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"J.M. Daga","raw_affiliation_strings":["ATMEL, Zone Industrielle, Rousset, FRANCE","ATMEL, Rousset, France"],"affiliations":[{"raw_affiliation_string":"ATMEL, Zone Industrielle, Rousset, FRANCE","institution_ids":["https://openalex.org/I4210150879"]},{"raw_affiliation_string":"ATMEL, Rousset, France","institution_ids":["https://openalex.org/I4210150879"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5110222566"],"corresponding_institution_ids":["https://openalex.org/I4210150879"],"apc_list":null,"apc_paid":null,"fwci":0.2361,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.60271529,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1219","last_page":"1219"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.98580002784729,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.98580002784729,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9409000277519226,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9401999711990356,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flash-memory-emulator","display_name":"Flash memory emulator","score":0.8333331346511841},{"id":"https://openalex.org/keywords/eeprom","display_name":"EEPROM","score":0.828857421875},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.767043948173523},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.714899480342865},{"id":"https://openalex.org/keywords/flash-file-system","display_name":"Flash file system","score":0.6534580588340759},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6430835127830505},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.5602425336837769},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.5323296785354614},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.4780888259410858},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.4761252999305725},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.459117591381073},{"id":"https://openalex.org/keywords/computer-memory","display_name":"Computer memory","score":0.4498169720172882},{"id":"https://openalex.org/keywords/memory-refresh","display_name":"Memory refresh","score":0.42359447479248047},{"id":"https://openalex.org/keywords/read-only-memory","display_name":"Read-only memory","score":0.42231571674346924},{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.42163020372390747},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.2254464328289032}],"concepts":[{"id":"https://openalex.org/C96535780","wikidata":"https://www.wikidata.org/wiki/Q5457561","display_name":"Flash memory emulator","level":5,"score":0.8333331346511841},{"id":"https://openalex.org/C27699510","wikidata":"https://www.wikidata.org/wiki/Q205908","display_name":"EEPROM","level":2,"score":0.828857421875},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.767043948173523},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.714899480342865},{"id":"https://openalex.org/C27670709","wikidata":"https://www.wikidata.org/wiki/Q5457555","display_name":"Flash file system","level":4,"score":0.6534580588340759},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6430835127830505},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.5602425336837769},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.5323296785354614},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.4780888259410858},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.4761252999305725},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.459117591381073},{"id":"https://openalex.org/C92855701","wikidata":"https://www.wikidata.org/wiki/Q5830907","display_name":"Computer memory","level":3,"score":0.4498169720172882},{"id":"https://openalex.org/C87907426","wikidata":"https://www.wikidata.org/wiki/Q6815755","display_name":"Memory refresh","level":4,"score":0.42359447479248047},{"id":"https://openalex.org/C89836824","wikidata":"https://www.wikidata.org/wiki/Q160710","display_name":"Read-only memory","level":2,"score":0.42231571674346924},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.42163020372390747},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.2254464328289032},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041922","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041922","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1937038249","https://openalex.org/W2082353818","https://openalex.org/W2291767606","https://openalex.org/W2182056015","https://openalex.org/W2013745773","https://openalex.org/W2151444573","https://openalex.org/W2135513937","https://openalex.org/W2099753358","https://openalex.org/W1827698292","https://openalex.org/W1998037745"],"abstract_inverted_index":{"Summary":[0],"form":[1],"only":[2],"given.":[3],"Flash":[4],"and":[5,42,48,51],"EEPROM":[6],"memories":[7],"are":[8,44,138,148],"now":[9],"embedded":[10,90,157],"in":[11,57],"a":[12,19,38,66,84,86,96,130,165,188],"large":[13],"number":[14],"of":[15,22,83,112,156,191],"specific":[16],"applications":[17,186],"requiring":[18,187],"broad":[20],"range":[21],"memory":[23,33,115,132,142],"sizes.":[24],"If":[25],"full":[26],"parallel":[27],"access":[28],"is":[29],"possible":[30],"the":[31,63,73,81,113,141,144],"flash":[32,91,114,158],"should":[34,116,161,174],"be":[35,117,162,175,183],"tested":[36],"as":[37,106,164],"stand-alone":[39],"memory.":[40],"Controllability":[41],"observability":[43],"optimum,":[45],"making":[46,80],"test":[47,68,111,135],"characterization":[49],"faster":[50],"easier.":[52],"Unfortunately":[53],"this":[54],"approach":[55],"results":[56],"an":[58,77],"unacceptable":[59],"pin":[60,74,99],"count":[61,75],"for":[62,89,185],"chip.":[64,121],"Using":[65],"serial":[67],"interface":[69],"(STI)":[70],"dramatically":[71],"reduces":[72],"to":[76,133,140,151,167,177],"acceptable":[78],"value,":[79],"use":[82],"STI":[85],"cost-effective":[87],"solution":[88,124,181],"testing.":[92],"For":[93],"SOCs":[94],"having":[95],"very":[97],"limited":[98],"count,":[100],"or":[101],"high":[102,189],"security":[103],"constraints":[104],"such":[105],"many":[107],"smart":[108],"card":[109],"chips,":[110],"entirely":[118],"generated":[119],"on":[120],"One":[122],"effective":[123],"that":[125,137],"has":[126],"been":[127],"implemented":[128,184],"uses":[129],"ROM":[131],"store":[134],"patterns":[136],"applied":[139],"by":[143],"microcontroller.":[145],"Memory":[146],"outputs":[147],"then":[149],"compared":[150],"expected":[152],"ones.":[153],"Regarding":[154],"repair":[155],"memories,":[159],"redundancy":[160],"considered":[163,176],"way":[166],"improve":[168,178],"yield.":[169],"Error":[170],"correcting":[171],"codes":[172],"(ECC)":[173],"reliability.":[179],"This":[180],"will":[182],"level":[190],"programming":[192],"endurance.":[193]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}