{"id":"https://openalex.org/W2130656936","doi":"https://doi.org/10.1109/test.2002.1041908","title":"Mixed-signal BIST: fact or fiction","display_name":"Mixed-signal BIST: fact or fiction","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2130656936","doi":"https://doi.org/10.1109/test.2002.1041908","mag":"2130656936"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041908","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041908","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043616116","display_name":"K. Arabi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210147298","display_name":"Sierra Engineering (United States)","ror":"https://ror.org/05kdrns38","country_code":"US","type":"company","lineage":["https://openalex.org/I4210147298"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"K. Arabi","raw_affiliation_strings":["PMC-Sierra, Inc., USA"],"affiliations":[{"raw_affiliation_string":"PMC-Sierra, Inc., USA","institution_ids":["https://openalex.org/I4210147298"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5043616116"],"corresponding_institution_ids":["https://openalex.org/I4210147298"],"apc_list":null,"apc_paid":null,"fwci":0.6954,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.73318191,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1200","last_page":"1200"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9692999720573425,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.7711139917373657},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.7423616647720337},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.6595490574836731},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5687517523765564},{"id":"https://openalex.org/keywords/panel-discussion","display_name":"Panel discussion","score":0.5250004529953003},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32331979274749756},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.15357705950737},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.06843966245651245},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.06471768021583557}],"concepts":[{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.7711139917373657},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.7423616647720337},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.6595490574836731},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5687517523765564},{"id":"https://openalex.org/C2781433648","wikidata":"https://www.wikidata.org/wiki/Q2100278","display_name":"Panel discussion","level":2,"score":0.5250004529953003},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32331979274749756},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.15357705950737},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.06843966245651245},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.06471768021583557},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C112698675","wikidata":"https://www.wikidata.org/wiki/Q37038","display_name":"Advertising","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041908","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041908","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6000000238418579,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1646128378","https://openalex.org/W2149724644","https://openalex.org/W2112983903","https://openalex.org/W1909129617","https://openalex.org/W2110446288","https://openalex.org/W2144814304","https://openalex.org/W2123664180","https://openalex.org/W2130656936","https://openalex.org/W2397378090","https://openalex.org/W1611136924"],"abstract_inverted_index":{"Summary":[0],"form":[1],"only":[2],"given.":[3],"Most":[4],"of":[5,20,33,78,102],"today's":[6],"SoCs":[7],"embed":[8],"complex":[9],"analog":[10],"and":[11,39,59,62,85],"mixed-signal":[12,28,34,82,95,106,119],"cores.":[13,29,96],"BIST":[14,35,83,120],"has":[15,43,52,68],"been":[16,45,53],"seen":[17],"as":[18,36,89],"one":[19],"the":[21,31,48,112,116],"most":[22,117],"promising":[23,118],"potential":[24],"solutions":[25],"for":[26,47,93],"embedded":[27,94],"But,":[30],"viability":[32,88],"a":[37,65,80,90],"credible":[38],"general-purpose":[40,91],"test":[41],"solution":[42,67,84,92],"always":[44],"questioned":[46],"past":[49],"decade.":[50],"It":[51],"subject":[54],"to":[55,105],"many":[56],"success":[57],"stories":[58],"several":[60],"failures":[61],"disappointments,":[63],"but":[64],"standard":[66],"not":[69],"emerged":[70],"yet.":[71],"This":[72,108],"panel":[73,98,109],"aims":[74,99],"at":[75,100],"highlighting":[76],"challenges":[77],"designing":[79],"practical":[81],"tackles":[86],"its":[87],"The":[97],"discussion":[101],"issues":[103],"related":[104],"BIST.":[107],"will":[110],"help":[111],"industry":[113],"focusing":[114],"on":[115],"solutions.":[121]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}