{"id":"https://openalex.org/W1830097635","doi":"https://doi.org/10.1109/test.2002.1041906","title":"Trouble with scan","display_name":"Trouble with scan","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W1830097635","doi":"https://doi.org/10.1109/test.2002.1041906","mag":"1830097635"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041906","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041906","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010647186","display_name":"Dejun Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"D.M. Wu","raw_affiliation_strings":["Intel, USA"],"affiliations":[{"raw_affiliation_string":"Intel, USA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5010647186"],"corresponding_institution_ids":["https://openalex.org/I1343180700"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14767802,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1199","last_page":"1199"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9801999926567078,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9722999930381775,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.7378261685371399},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7200690507888794},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6976990103721619},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6567791104316711},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.6122533082962036},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.5488666296005249},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5397568345069885},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4909539520740509},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.464699923992157},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.45783472061157227},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.45760416984558105},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3559607267379761},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.22403189539909363},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17959028482437134},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07862553000450134},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.06857094168663025}],"concepts":[{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.7378261685371399},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7200690507888794},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6976990103721619},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6567791104316711},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.6122533082962036},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.5488666296005249},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5397568345069885},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4909539520740509},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.464699923992157},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.45783472061157227},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.45760416984558105},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3559607267379761},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.22403189539909363},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17959028482437134},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07862553000450134},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.06857094168663025},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041906","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041906","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4256030018","https://openalex.org/W2147400189","https://openalex.org/W2340957901","https://openalex.org/W1555400249","https://openalex.org/W2031110496","https://openalex.org/W2157154381","https://openalex.org/W2568949342","https://openalex.org/W2037862379","https://openalex.org/W4253743993","https://openalex.org/W1923485359"],"abstract_inverted_index":{"The":[0,7,24],"benefits":[1],"of":[2,16,67,76,97],"scan":[3,21,68],"are":[4,80,143],"well":[5],"known.":[6],"intent":[8],"here":[9],"is":[10,48,70],"to":[11,88,93,105,146],"point":[12],"out":[13],"what":[14],"kind":[15,75],"trouble":[17],"we":[18,79,102,118,144],"have":[19],"with":[20],"and":[22,57,113],"BIST.":[23],"author":[25],"then":[26],"argues":[27],"that":[28],"functional":[29],"testing":[30],"methods":[31],"might":[32],"give":[33],"a":[34,137],"better":[35],"quality":[36,77],"if":[37,101],"one":[38],"can":[39,129],"afford":[40],"resources":[41],"for":[42,123],"manual":[43],"test":[44,121,131,139],"generation.":[45],"Scan":[46],"DFT":[47,69],"based":[49],"on":[50],"only":[51],"two":[52,62],"major":[53],"fault":[54,63,84,108,147],"models:":[55],"stuck-at-fault":[56],"transition":[58,114],"fault.":[59],"Beyond":[60],"these":[61,124,149],"models,":[64],"the":[65,74],"effectiveness":[66],"debatable.":[71],"To":[72],"achieve":[73],"level":[78],"looking":[81],"for,":[82],"more":[83],"models":[85,109],"will":[86,117],"need":[87],"be":[89],"applied":[90],"in":[91],"order":[92],"capture":[94],"all":[95],"types":[96],"defects.":[98],"But":[99],"even":[100],"know":[103],"how":[104,116,128],"create":[106],"additional":[107,125,150],"(other":[110],"than":[111],"stuck-at":[112],"faults),":[115],"automatically":[119],"generate":[120],"patterns":[122],"models?":[126],"And,":[127],"any":[130],"generator":[132],"or":[133],"tester":[134],"handle":[135],"such":[136],"huge":[138],"data":[140],"volume?":[141],"How":[142],"going":[145],"isolate":[148],"defect":[151],"types?.":[152]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}