{"id":"https://openalex.org/W1888190191","doi":"https://doi.org/10.1109/test.2002.1041902","title":"Good scan = good quality level? Well, it depends","display_name":"Good scan = good quality level? Well, it depends","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W1888190191","doi":"https://doi.org/10.1109/test.2002.1041902","mag":"1888190191"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041902","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041902","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037616315","display_name":"Anjna Vij","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"A.K. Vij","raw_affiliation_strings":["Texas Instruments, Inc., USA","Texas Instruments"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., USA","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Texas Instruments","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5037616315"],"corresponding_institution_ids":["https://openalex.org/I74760111"],"apc_list":null,"apc_paid":null,"fwci":0.2515,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.52089625,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1195","last_page":"1195"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9857000112533569,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9857000112533569,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9685999751091003,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.753185510635376},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.7181407809257507},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5921229124069214},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.5575796961784363},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5227711200714111},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5043483972549438},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.45216453075408936},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.34729236364364624},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.2076808512210846},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16697284579277039},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08926761150360107}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.753185510635376},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.7181407809257507},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5921229124069214},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.5575796961784363},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5227711200714111},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5043483972549438},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.45216453075408936},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.34729236364364624},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.2076808512210846},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16697284579277039},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08926761150360107},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041902","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041902","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5899999737739563,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4255837520","https://openalex.org/W2387011115","https://openalex.org/W4234808182","https://openalex.org/W2382043075","https://openalex.org/W2809151339","https://openalex.org/W2360673138","https://openalex.org/W2809370583","https://openalex.org/W2333722679","https://openalex.org/W4255628145","https://openalex.org/W2093320919"],"abstract_inverted_index":{"Summary":[0],"form":[1],"only":[2],"given.":[3],"Quality":[4],"can":[5,131,186],"be":[6,187],"defined":[7],"as":[8,18,85],"\"a":[9],"degree":[10],"of":[11,21,25,98,102,136,163,175],"excellence\".":[12],"In":[13,69],"practice,":[14],"we":[15,64,71,130],"use":[16],"testing":[17],"a":[19,34,43,137,160,170],"measure":[20],"the":[22,99,104,108,113,147,165,172],"outgoing":[23],"quality":[24,67],"devices.":[26],"The":[27],"problem":[28],"is":[29,32,45,51,94,177],"that":[30,49,78],"there":[31],"not":[33,156],"one-to-one":[35],"correlation":[36],"between":[37],"test":[38,181],"and":[39,126,185],"quality.":[40],"Just":[41],"because":[42,97],"unit":[44],"tested":[46],"doesn't":[47],"guarantee":[48],"it":[50,61],"defect-free.":[52],"Similarly,":[53],"\"guaranteed-by-design\"":[54],"functionality,":[55],"usually":[56],"isn't.":[57],"So,":[58],"what":[59],"does":[60],"mean":[62],"when":[63],"talk":[65],"about":[66],"level?":[68],"essence,":[70],"are":[72,143,155,183],"trying":[73,117],"to":[74,81,118,158,178],"increase":[75],"our":[76],"confidence":[77,121],"devices":[79,141],"shipped":[80],"customers":[82],"will":[83,167],"work":[84],"advertised":[86],"in":[87,107,116],"their":[88],"application.":[89],"For":[90,110],"existing":[91,100],"products,":[92],"this":[93,120],"relatively":[95],"straightforward":[96],"history":[101],"how":[103,164],"device":[105,166],"performed":[106],"field.":[109],"new":[111],"designs,":[112],"difficulty":[114],"lies":[115],"predict":[119],"level":[122],"based":[123],"on":[124,146],"simulations":[125],"engineering":[127],"data.":[128],"Sometimes":[129],"extrapolate":[132],"from":[133],"previous":[134],"generations":[135],"design":[138],"or":[139],"other":[140],"which":[142],"being":[144],"manufactured":[145],"same":[148],"process":[149],"technology":[150],"node.":[151],"But,":[152],"these":[153],"alone":[154],"enough":[157],"provide":[159],"perfect":[161],"forecast":[162],"succeed.":[168],"As":[169],"result,":[171],"usual":[173],"method":[174],"attack":[176],"apply":[179],"whatever":[180],"techniques":[182],"available":[184],"practically":[188],"implemented":[189],"for":[190],"first":[191],"silicon.":[192]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}