{"id":"https://openalex.org/W2137365119","doi":"https://doi.org/10.1109/test.2002.1041873","title":"Architecting millisecond test solutions for wireless phone RFICs","display_name":"Architecting millisecond test solutions for wireless phone RFICs","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2137365119","doi":"https://doi.org/10.1109/test.2002.1041873","mag":"2137365119"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041873","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041873","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034958759","display_name":"John Ferrario","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"J. Ferrario","raw_affiliation_strings":["IBM RF and Analog Test Development, Essex Junction, VT, USA","IBM RF & Analog Test Dev., Essex Junction, VT, USA"],"affiliations":[{"raw_affiliation_string":"IBM RF and Analog Test Development, Essex Junction, VT, USA","institution_ids":["https://openalex.org/I117023288"]},{"raw_affiliation_string":"IBM RF & Analog Test Dev., Essex Junction, VT, USA","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050244188","display_name":"Randy Wolf","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Wolf","raw_affiliation_strings":["IBM RF and Analog Test Development, Essex Junction, VT, USA","IBM RF & Analog Test Dev., Essex Junction, VT, USA"],"affiliations":[{"raw_affiliation_string":"IBM RF and Analog Test Development, Essex Junction, VT, USA","institution_ids":["https://openalex.org/I117023288"]},{"raw_affiliation_string":"IBM RF & Analog Test Dev., Essex Junction, VT, USA","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011539539","display_name":"Scott D. Moss","orcid":"https://orcid.org/0000-0002-0453-5390"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Moss","raw_affiliation_strings":["IBM RF and Analog Test Development, Essex Junction, VT, USA","IBM RF & Analog Test Dev., Essex Junction, VT, USA"],"affiliations":[{"raw_affiliation_string":"IBM RF and Analog Test Development, Essex Junction, VT, USA","institution_ids":["https://openalex.org/I117023288"]},{"raw_affiliation_string":"IBM RF & Analog Test Dev., Essex Junction, VT, USA","institution_ids":["https://openalex.org/I117023288"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5034958759"],"corresponding_institution_ids":["https://openalex.org/I117023288"],"apc_list":null,"apc_paid":null,"fwci":4.5278,"has_fulltext":false,"cited_by_count":42,"citation_normalized_percentile":{"value":0.94924501,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1151","last_page":"1158"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.5529732704162598},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.5198931694030762},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5106781125068665},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.47454723715782166},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.46354788541793823},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.434353768825531},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42629197239875793},{"id":"https://openalex.org/keywords/cost-reduction","display_name":"Cost reduction","score":0.4259486794471741},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.4147474467754364},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2609241008758545},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.2487773895263672},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.10201197862625122}],"concepts":[{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.5529732704162598},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.5198931694030762},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5106781125068665},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.47454723715782166},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.46354788541793823},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.434353768825531},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42629197239875793},{"id":"https://openalex.org/C2778820799","wikidata":"https://www.wikidata.org/wiki/Q3454688","display_name":"Cost reduction","level":2,"score":0.4259486794471741},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.4147474467754364},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2609241008758545},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2487773895263672},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.10201197862625122},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C187736073","wikidata":"https://www.wikidata.org/wiki/Q2920921","display_name":"Management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041873","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041873","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6499999761581421,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2106903051","https://openalex.org/W2107555964"],"related_works":["https://openalex.org/W1993178475","https://openalex.org/W1999617696","https://openalex.org/W2886943583","https://openalex.org/W1484726954","https://openalex.org/W2273869358","https://openalex.org/W2106949566","https://openalex.org/W2119346672","https://openalex.org/W2159830536","https://openalex.org/W2133803721","https://openalex.org/W2058431428"],"abstract_inverted_index":{"Today's":[0],"low":[1],"cost":[2,26,57,96,122],"wireless":[3,47],"phones":[4],"have":[5],"driven":[6],"a":[7,22,40,53],"need":[8],"to":[9,12,44,93,105],"be":[10],"able":[11],"economically":[13],"test":[14,36,45,66,100,121,140],"high":[15],"volumes":[16],"of":[17,24,27,32,55,58,73,82,97,101,107,120,127,129,145],"complex":[18,46,98],"RF":[19,102,139,155],"ICs":[20,103],"at":[21],"fraction":[23,54],"the":[25,28,34,56,71,74,83,95,117,124,135,143,153,158],"IC.":[29],"In":[30,68],"June":[31],"2001":[33],"IBM":[35],"development":[37],"group":[38],"developed":[39],"strategy":[41],"and":[42,64,86,123],"design":[43],"phone":[48],"front":[49],"end":[50],"components":[51,110],"for":[52,137],"using":[59],"traditional":[60],"ATE":[61],"or":[62,114],"rack":[63],"stack":[65],"solutions.":[67,141],"this":[69,130,132,148],"paper,":[70],"architecture":[72,133,149],"system":[75,90],"is":[76,91],"described":[77],"as":[78,80,112],"well":[79],"some":[81],"design,":[84],"maintenance":[85],"implementation":[87,128],"considerations.":[88],"The":[89],"designed":[92],"bring":[94],"manufacturing":[99],"equivalent":[104],"that":[106],"testing":[108],"discrete":[109],"such":[111],"resistors":[113],"capacitors.":[115],"Given":[116],"drastic":[118],"reduction":[119],"relative":[125],"ease":[126],"solution,":[131],"sets":[134],"bar":[136],"future":[138],"To":[142],"best":[144],"our":[146],"knowledge,":[147],"has":[150],"resulted":[151],"in":[152,157],"fastest":[154],"tester":[156],"world.":[159]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}