{"id":"https://openalex.org/W2149602237","doi":"https://doi.org/10.1109/test.2002.1041868","title":"Use of DFT techniques in speed grading a 1 GHz+ microprocessor","display_name":"Use of DFT techniques in speed grading a 1 GHz+ microprocessor","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2149602237","doi":"https://doi.org/10.1109/test.2002.1041868","mag":"2149602237"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041868","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041868","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034983837","display_name":"D. Belete","orcid":null},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"D. Belete","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055581027","display_name":"A. Razdan","orcid":null},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Razdan","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072693032","display_name":"Willi Schwarz","orcid":null},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W. Schwarz","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068015411","display_name":"R. Raina","orcid":null},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Raina","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111892655","display_name":"C.F. Hawkins","orcid":null},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Hawkins","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025072921","display_name":"J.C. Morehead","orcid":null},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Morehead","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5034983837"],"corresponding_institution_ids":["https://openalex.org/I1333370159"],"apc_list":null,"apc_paid":null,"fwci":5.534,"has_fulltext":false,"cited_by_count":55,"citation_normalized_percentile":{"value":0.96229907,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1111","last_page":"1119"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.853885293006897},{"id":"https://openalex.org/keywords/grading","display_name":"Grading (engineering)","score":0.6585530042648315},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6137241125106812},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4266386032104492},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4141436219215393},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35341906547546387},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.34653717279434204},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25970882177352905},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1245269775390625}],"concepts":[{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.853885293006897},{"id":"https://openalex.org/C2777286243","wikidata":"https://www.wikidata.org/wiki/Q5591926","display_name":"Grading (engineering)","level":2,"score":0.6585530042648315},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6137241125106812},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4266386032104492},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4141436219215393},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35341906547546387},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.34653717279434204},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25970882177352905},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1245269775390625},{"id":"https://openalex.org/C147176958","wikidata":"https://www.wikidata.org/wiki/Q77590","display_name":"Civil engineering","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041868","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041868","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1537856804","https://openalex.org/W1565944832","https://openalex.org/W1874075800","https://openalex.org/W1915537987","https://openalex.org/W1954467151","https://openalex.org/W2073724604","https://openalex.org/W2110309493"],"related_works":["https://openalex.org/W39373273","https://openalex.org/W2098026815","https://openalex.org/W2390545901","https://openalex.org/W2351709090","https://openalex.org/W2735012529","https://openalex.org/W2387235933","https://openalex.org/W2123880708","https://openalex.org/W1987313229","https://openalex.org/W2001393705","https://openalex.org/W2357771869"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,15],"practical":[4],"case-study":[5],"of":[6,21,35,48],"using":[7,49],"DFT":[8,51],"techniques":[9],"for":[10,38],"speed-grading":[11,39],"the":[12,40,44,50],"Motorola":[13],"MPC7455,":[14],"1":[16],"GHz+":[17],"microprocessor.":[18],"The":[19],"effectiveness":[20],"transition":[22],"fault":[23],"detection,":[24],"path-delay":[25],"AC-scan":[26],"patterns":[27,37],"and":[28,46],"array":[29],"BIST":[30],"is":[31],"compared":[32],"with":[33],"that":[34],"functional":[36],"parts.":[41],"We":[42],"discuss":[43],"capabilities":[45],"challenges":[47],"methods":[52],"based":[53],"on":[54],"production":[55],"data.":[56]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}