{"id":"https://openalex.org/W2125196703","doi":"https://doi.org/10.1109/test.2002.1041862","title":"IEEE P1149.6: a boundary-scan standard for advanced digital networks","display_name":"IEEE P1149.6: a boundary-scan standard for advanced digital networks","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2125196703","doi":"https://doi.org/10.1109/test.2002.1041862","mag":"2125196703"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041862","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041862","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055791424","display_name":"Bill Eklow","orcid":null},"institutions":[{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"B. Eklow","raw_affiliation_strings":["Cisco Systems, Inc., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Cisco Systems, Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I135428043"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014786517","display_name":"C. Barnhart","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C.F. Barnhart","raw_affiliation_strings":["IBM, Tucson, AZ, USA"],"affiliations":[{"raw_affiliation_string":"IBM, Tucson, AZ, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074637494","display_name":"Kenneth P. Parker","orcid":null},"institutions":[{"id":"https://openalex.org/I138285227","display_name":"Agilent Technologies (United States)","ror":"https://ror.org/02tryst02","country_code":"US","type":"company","lineage":["https://openalex.org/I138285227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Parker","raw_affiliation_strings":["Lovel and Company, Agilent"],"affiliations":[{"raw_affiliation_string":"Lovel and Company, Agilent","institution_ids":["https://openalex.org/I138285227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5055791424"],"corresponding_institution_ids":["https://openalex.org/I135428043"],"apc_list":null,"apc_paid":null,"fwci":2.5154,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.89673648,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1056","last_page":"1065"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.738898754119873},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6508232355117798},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.49752500653266907},{"id":"https://openalex.org/keywords/boundary","display_name":"Boundary (topology)","score":0.4655248820781708},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.42235293984413147},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.37641939520835876},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37073272466659546},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.3529922366142273},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3493254780769348},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3459349274635315},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2887365221977234},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11356672644615173},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.09204995632171631}],"concepts":[{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.738898754119873},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6508232355117798},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.49752500653266907},{"id":"https://openalex.org/C62354387","wikidata":"https://www.wikidata.org/wiki/Q875399","display_name":"Boundary (topology)","level":2,"score":0.4655248820781708},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.42235293984413147},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.37641939520835876},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37073272466659546},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.3529922366142273},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3493254780769348},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3459349274635315},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2887365221977234},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11356672644615173},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.09204995632171631},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041862","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041862","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/17","display_name":"Partnerships for the goals","score":0.49000000953674316}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W129563581","https://openalex.org/W1502837022","https://openalex.org/W1885016154","https://openalex.org/W2166669936","https://openalex.org/W2169165564","https://openalex.org/W6605196464","https://openalex.org/W6685114274"],"related_works":["https://openalex.org/W2204879205","https://openalex.org/W2096437374","https://openalex.org/W1943174035","https://openalex.org/W1928481607","https://openalex.org/W3135165657","https://openalex.org/W1485582195","https://openalex.org/W3151669388","https://openalex.org/W1497704817","https://openalex.org/W2162740853","https://openalex.org/W2373135325"],"abstract_inverted_index":{"Very":[0],"high-speed,":[1],"digital":[2,51],"technology":[3],"is":[4,24],"imposing":[5],"new":[6,132],"requirements":[7],"on":[8,135],"test":[9],"logic":[10],"that":[11,30,75],"will":[12,71,117,130],"limit":[13],"the":[14,34,73,82,92,100,122,126,137,141,144],"effectiveness":[15],"of":[16,49,105,121,143],"current":[17],"IEEE":[18,22,28],"1149.1":[19,29],"based":[20],"testing.":[21],"P1149.6":[23,83],"an":[25],"extension":[26],"to":[27,32,40,88],"attempts":[31],"standardize":[33],"boundary-scan":[35,47],"structures":[36],"and":[37,44,102,112,129],"methods":[38],"required":[39],"ensure":[41],"simple,":[42],"robust":[43],"minimally":[45],"intrusive":[46],"testing":[48],"advanced":[50],"networks":[52,66],"which":[53],"are":[54],"not":[55],"adequately":[56],"addressed":[57],"by":[58,81,91,125,136],"existing":[59],"standards.":[60],"This":[61,69],"includes":[62],"AC-coupled":[63],"networks,":[64],"differential":[65],"or":[67],"both.":[68],"paper":[70,116],"describe":[72],"work":[74],"has":[76],"been":[77],"done":[78],"thus":[79],"far":[80],"working":[84,127,138],"group":[85,128,139],"including:":[86],"defects":[87],"be":[89],"targeted":[90],"proposed":[93,106,145],"standard,":[94],"physical":[95],"layer":[96],"implementation":[97],"for":[98],"both":[99],"driver":[101],"receiver,":[103],"verification":[104],"solutions":[107],"through":[108],"SPICE":[109],"modeling,":[110],"BSDL":[111],"tools":[113],"implications.":[114],"The":[115],"also":[118],"discuss":[119,131],"some":[120],"challenges":[123],"faced":[124],"approaches":[133],"taken":[134],"in":[140],"development":[142],"standard.":[146]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}