{"id":"https://openalex.org/W1839452802","doi":"https://doi.org/10.1109/test.2002.1041858","title":"Test and evaluation of multiple embedded mixed-signal test cores","display_name":"Test and evaluation of multiple embedded mixed-signal test cores","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W1839452802","doi":"https://doi.org/10.1109/test.2002.1041858","mag":"1839452802"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041858","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041858","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075705685","display_name":"M.M. Hafed","orcid":null},"institutions":[{"id":"https://openalex.org/I5023651","display_name":"McGill University","ror":"https://ror.org/01pxwe438","country_code":"CA","type":"education","lineage":["https://openalex.org/I5023651"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"M. Hafed","raw_affiliation_strings":["Microelectronics and Computer Systems Laboratory, McGill University, Montreal, QUE, Canada","[Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada]"],"affiliations":[{"raw_affiliation_string":"Microelectronics and Computer Systems Laboratory, McGill University, Montreal, QUE, Canada","institution_ids":["https://openalex.org/I5023651"]},{"raw_affiliation_string":"[Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada]","institution_ids":["https://openalex.org/I5023651"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083312864","display_name":"Gordon W. Roberts","orcid":"https://orcid.org/0000-0002-4880-0272"},"institutions":[{"id":"https://openalex.org/I5023651","display_name":"McGill University","ror":"https://ror.org/01pxwe438","country_code":"CA","type":"education","lineage":["https://openalex.org/I5023651"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"G.W. Roberts","raw_affiliation_strings":["Microelectronics and Computer Systems Laboratory, McGill University, Montreal, QUE, Canada","[Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada]"],"affiliations":[{"raw_affiliation_string":"Microelectronics and Computer Systems Laboratory, McGill University, Montreal, QUE, Canada","institution_ids":["https://openalex.org/I5023651"]},{"raw_affiliation_string":"[Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada]","institution_ids":["https://openalex.org/I5023651"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5075705685"],"corresponding_institution_ids":["https://openalex.org/I5023651"],"apc_list":null,"apc_paid":null,"fwci":2.2639,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.88037019,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1022","last_page":"1030"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.6987042427062988},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6206536889076233},{"id":"https://openalex.org/keywords/signal-generator","display_name":"Signal generator","score":0.5693665742874146},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5556695461273193},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.5120804905891418},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.5024101734161377},{"id":"https://openalex.org/keywords/arbitrary-waveform-generator","display_name":"Arbitrary waveform generator","score":0.49938344955444336},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.4939590096473694},{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.44426995515823364},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.4270200729370117},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2442168891429901},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.22700276970863342},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.11298096179962158},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11066550016403198}],"concepts":[{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.6987042427062988},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6206536889076233},{"id":"https://openalex.org/C207912722","wikidata":"https://www.wikidata.org/wiki/Q1259123","display_name":"Signal generator","level":3,"score":0.5693665742874146},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5556695461273193},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.5120804905891418},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5024101734161377},{"id":"https://openalex.org/C108307224","wikidata":"https://www.wikidata.org/wiki/Q629983","display_name":"Arbitrary waveform generator","level":4,"score":0.49938344955444336},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.4939590096473694},{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.44426995515823364},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.4270200729370117},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2442168891429901},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.22700276970863342},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.11298096179962158},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11066550016403198},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041858","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041858","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7099999785423279,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320334593","display_name":"Natural Sciences and Engineering Research Council of Canada","ror":"https://ror.org/01h531d29"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W254007344","https://openalex.org/W1570203331","https://openalex.org/W1594101521","https://openalex.org/W1998284495","https://openalex.org/W2034714147","https://openalex.org/W2084128131","https://openalex.org/W2104554794","https://openalex.org/W2107555964","https://openalex.org/W2140823559","https://openalex.org/W2167896761","https://openalex.org/W4250742633"],"related_works":["https://openalex.org/W3128433826","https://openalex.org/W2359707571","https://openalex.org/W2366450121","https://openalex.org/W2096093687","https://openalex.org/W2391329216","https://openalex.org/W2355252359","https://openalex.org/W2168529281","https://openalex.org/W2365146735","https://openalex.org/W2387706796","https://openalex.org/W2348369620"],"abstract_inverted_index":{"The":[0,42],"simultaneous":[1],"operation":[2,63],"of":[3,25,70],"multiple":[4],"embedded":[5],"analog":[6],"test":[7,107],"cores":[8,94],"is":[9,64,95],"investigated":[10],"through":[11],"experiments":[12],"on":[13],"a":[14,26,33,80],"prototype":[15],"integrated":[16,36],"circuit":[17,43,54],"containing":[18],"eight":[19],"such":[20],"cores.":[21],"Each":[22],"core":[23,108],"consists":[24],"scan":[27],"memory,":[28],"some":[29],"passive":[30],"filters,":[31],"and":[32,49,51,73,88,106],"fully":[34,45],"synchronized":[35],"waveform":[37,99],"digitizer":[38,103],"for":[39],"signal":[40,47],"extraction.":[41],"supports":[44],"differential":[46],"generation":[48],"digitization":[50],"employs":[52],"common":[53],"techniques":[55],"to":[56,59,66],"enhance":[57],"robustness":[58],"process":[60],"variation.":[61],"Simultaneous":[62],"demonstrated":[65],"achieve":[67],"over":[68,79],"12-bits":[69],"amplitude":[71],"resolution":[72],"more":[74],"than":[75],"70":[76],"dB":[77],"SFDR":[78],"20":[81],"MHz":[82],"bandwidth.":[83],"Matching":[84],"issues":[85],"are":[86],"investigated,":[87],"instrument":[89],"uniformity":[90],"across":[91],"about":[92],"250":[93],"verified":[96],"by":[97],"measuring":[98],"generator":[100],"offset":[101,104],"errors,":[102,105],"frequency":[109],"response":[110],"variability.":[111]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}