{"id":"https://openalex.org/W2165601670","doi":"https://doi.org/10.1109/test.2002.1041856","title":"Application of high-quality built-in test to industrial designs","display_name":"Application of high-quality built-in test to industrial designs","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2165601670","doi":"https://doi.org/10.1109/test.2002.1041856","mag":"2165601670"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041856","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041856","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101930271","display_name":"Kazumi Hatayama","orcid":"https://orcid.org/0000-0001-8416-8609"},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"K. Hatayama","raw_affiliation_strings":["Central Research Laboratory, Hitachi and Limited, Japan"],"affiliations":[{"raw_affiliation_string":"Central Research Laboratory, Hitachi and Limited, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020353889","display_name":"M. Nakao","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Nakao","raw_affiliation_strings":["Central Research Laboratory, Hitachi and Limited, Japan"],"affiliations":[{"raw_affiliation_string":"Central Research Laboratory, Hitachi and Limited, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059711623","display_name":"Yoshikazu Kiyoshige","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Kiyoshige","raw_affiliation_strings":["Central Research Laboratory, Hitachi and Limited, Japan"],"affiliations":[{"raw_affiliation_string":"Central Research Laboratory, Hitachi and Limited, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076411288","display_name":"Koichiro Natsume","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Natsume","raw_affiliation_strings":["Central Research Laboratory, Hitachi and Limited, Japan"],"affiliations":[{"raw_affiliation_string":"Central Research Laboratory, Hitachi and Limited, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101964875","display_name":"Yasuo Sat\u00f4","orcid":"https://orcid.org/0000-0001-9610-1583"},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Sato","raw_affiliation_strings":["Device Development Center, Hitachi and Limited, Japan"],"affiliations":[{"raw_affiliation_string":"Device Development Center, Hitachi and Limited, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088987289","display_name":"T. Nagumo","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Nagumo","raw_affiliation_strings":["Enterprise Server Division, Hitachi and Limited, Japan"],"affiliations":[{"raw_affiliation_string":"Enterprise Server Division, Hitachi and Limited, Japan","institution_ids":["https://openalex.org/I65143321"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5101930271"],"corresponding_institution_ids":["https://openalex.org/I65143321"],"apc_list":null,"apc_paid":null,"fwci":1.7608,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.86000974,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1003","last_page":"1012"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.7132648825645447},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6662989854812622},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6019126176834106},{"id":"https://openalex.org/keywords/encode","display_name":"ENCODE","score":0.5771930813789368},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5222735404968262},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.515710175037384},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5054588317871094},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5032114386558533},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4441906213760376},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3580649793148041},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25520896911621094},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.25453630089759827},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1303207278251648},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.06814098358154297}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.7132648825645447},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6662989854812622},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6019126176834106},{"id":"https://openalex.org/C66746571","wikidata":"https://www.wikidata.org/wiki/Q1134833","display_name":"ENCODE","level":3,"score":0.5771930813789368},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5222735404968262},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.515710175037384},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5054588317871094},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5032114386558533},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4441906213760376},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3580649793148041},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25520896911621094},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.25453630089759827},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1303207278251648},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.06814098358154297},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041856","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041856","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4399999976158142,"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1537268039","https://openalex.org/W1566868423","https://openalex.org/W1582825744","https://openalex.org/W1592515516","https://openalex.org/W1905213452","https://openalex.org/W1934808766","https://openalex.org/W2025145240","https://openalex.org/W2046314918","https://openalex.org/W2046461297","https://openalex.org/W2097973512","https://openalex.org/W2104892071","https://openalex.org/W2105282021","https://openalex.org/W2111761265","https://openalex.org/W2112529780","https://openalex.org/W2117154146","https://openalex.org/W2117627749","https://openalex.org/W2120399412","https://openalex.org/W2124629389","https://openalex.org/W2127428898","https://openalex.org/W2137045371","https://openalex.org/W2137549092","https://openalex.org/W2138530143","https://openalex.org/W2144033909","https://openalex.org/W2146410394","https://openalex.org/W2147744228","https://openalex.org/W2150148421","https://openalex.org/W2152406824","https://openalex.org/W2164418022","https://openalex.org/W4236886519","https://openalex.org/W4246972245","https://openalex.org/W4256404229","https://openalex.org/W6681008240","https://openalex.org/W6818562934"],"related_works":["https://openalex.org/W2468279273","https://openalex.org/W2354198838","https://openalex.org/W1989130879","https://openalex.org/W2104478015","https://openalex.org/W4230343699","https://openalex.org/W1958365305","https://openalex.org/W2154529098","https://openalex.org/W2137475190","https://openalex.org/W2109319621","https://openalex.org/W2137702935"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"an":[3],"approach":[4],"for":[5,51,63],"high-quality":[6],"built-in":[7],"test":[8,47],"using":[9],"a":[10],"neighborhood":[11],"pattern":[12],"generator":[13],"(NPG).":[14],"The":[15],"proposed":[16,72],"NPG":[17],"is":[18,25],"practically":[19],"acceptable":[20],"because":[21],"(a)":[22],"its":[23],"structure":[24],"independent":[26],"of":[27,70],"circuit":[28],"under":[29],"test,":[30],"(b)":[31],"it":[32,43],"requires":[33],"low":[34],"area":[35],"overhead":[36],"and":[37,41],"no":[38],"performance":[39],"degradation,":[40],"(c)":[42],"can":[44],"encode":[45],"deterministic":[46],"cubes,":[48],"not":[49],"only":[50],"stuck-at":[52],"faults":[53],"but":[54],"also":[55],"transition":[56],"faults,":[57],"with":[58],"high":[59],"probability.":[60],"Experimental":[61],"results":[62],"large":[64],"industrial":[65],"circuits":[66],"illustrate":[67],"the":[68,71],"efficiency":[69],"approach.":[73]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}