{"id":"https://openalex.org/W2073273733","doi":"https://doi.org/10.1109/test.2002.1041852","title":"Comparison of I/sub DDQ/ testing and very-low voltage testing","display_name":"Comparison of I/sub DDQ/ testing and very-low voltage testing","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2073273733","doi":"https://doi.org/10.1109/test.2002.1041852","mag":"2073273733"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041852","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041852","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013997501","display_name":"B. Kruseman","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"B. Kruseman","raw_affiliation_strings":["Philips Research Laboratories, Eindhoven, Netherlands"],"affiliations":[{"raw_affiliation_string":"Philips Research Laboratories, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I4210122849"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000035656","display_name":"S. van den Oetelaar","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"S. van den Oetelaar","raw_affiliation_strings":["Philips Research Laboratories, Eindhoven, Netherlands"],"affiliations":[{"raw_affiliation_string":"Philips Research Laboratories, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I4210122849"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066147613","display_name":"Juan M. Rius","orcid":"https://orcid.org/0000-0003-0606-5422"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]},{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]}],"countries":["ES","NL"],"is_corresponding":false,"raw_author_name":"J. Rius","raw_affiliation_strings":["DEE, Universitat Politecnica de Catalunya, Barcelona, Spain","Philips Research Laboratories, Eindhoven, Netherlands"],"affiliations":[{"raw_affiliation_string":"DEE, Universitat Politecnica de Catalunya, Barcelona, Spain","institution_ids":["https://openalex.org/I9617848"]},{"raw_affiliation_string":"Philips Research Laboratories, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I4210122849"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5013997501"],"corresponding_institution_ids":["https://openalex.org/I4210122849"],"apc_list":null,"apc_paid":null,"fwci":2.0863,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.87073268,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"964","last_page":"973"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.7357872128486633},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6442172527313232},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5580828785896301},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.5379738211631775},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4847102165222168},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.4819219410419464},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4378814697265625},{"id":"https://openalex.org/keywords/limit","display_name":"Limit (mathematics)","score":0.42773258686065674},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.41399484872817993},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37773072719573975},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3714476227760315},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3641870617866516},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3326641321182251},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10224086046218872}],"concepts":[{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.7357872128486633},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6442172527313232},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5580828785896301},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.5379738211631775},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4847102165222168},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.4819219410419464},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4378814697265625},{"id":"https://openalex.org/C151201525","wikidata":"https://www.wikidata.org/wiki/Q177239","display_name":"Limit (mathematics)","level":2,"score":0.42773258686065674},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.41399484872817993},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37773072719573975},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3714476227760315},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3641870617866516},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3326641321182251},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10224086046218872},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041852","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041852","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1488870485","https://openalex.org/W1527363716","https://openalex.org/W1690611602","https://openalex.org/W1781374518","https://openalex.org/W1868388016","https://openalex.org/W1909514346","https://openalex.org/W1913711070","https://openalex.org/W2069520100","https://openalex.org/W2100827158","https://openalex.org/W2114583855","https://openalex.org/W2115404539","https://openalex.org/W2115648995","https://openalex.org/W2115908547","https://openalex.org/W2116003598","https://openalex.org/W2123124971","https://openalex.org/W2129563753","https://openalex.org/W2140723188","https://openalex.org/W2143022120","https://openalex.org/W2143656109","https://openalex.org/W2145395384","https://openalex.org/W2154418718","https://openalex.org/W2156661581","https://openalex.org/W2167440813","https://openalex.org/W2536978283","https://openalex.org/W2542699699","https://openalex.org/W6676839581","https://openalex.org/W6677337090"],"related_works":["https://openalex.org/W3097847178","https://openalex.org/W609904040","https://openalex.org/W3125204845","https://openalex.org/W2021581299","https://openalex.org/W2483563543","https://openalex.org/W2250707195","https://openalex.org/W2963970486","https://openalex.org/W2971460101","https://openalex.org/W2048286674","https://openalex.org/W4302773373"],"abstract_inverted_index":{"I/sub":[0,71,156,166],"DDQ/":[1,72,157,167],"testing":[2,68],"is":[3,18,36,161],"a":[4,47,76,85,95,151],"well-known":[5],"test":[6,16,42],"method":[7,17,43,110],"to":[8,117,124,164],"filter":[9],"dies":[10,45],"with":[11,104,127,142],"reliability":[12],"risks.":[13],"However,":[14,140],"the":[15,21,54,57,59,93,109,132,136,155],"endangered":[19],"by":[20],"increase":[22,78],"in":[23,26,79],"off-state":[24],"current":[25],"advanced":[27],"process":[28],"technologies.":[29],"An":[30],"alternative":[31],"for":[32,61],"detecting":[33,150],"resistive":[34],"shorts":[35,126],"very-low":[37],"voltage":[38,87,97],"(VLV)":[39],"testing.":[40,73,168],"This":[41,63,107],"tests":[44],"at":[46,135],"strongly":[48],"reduced":[49],"supply":[50,55,86,96,138],"voltage.":[51,139],"The":[52],"smaller":[53],"voltage,":[56],"higher":[58],"sensitivity":[60],"defects.":[62],"paper":[64],"investigates":[65],"if":[66],"VLV":[67,160],"can":[69],"replace":[70,165],"To":[74],"obtain":[75],"significant":[77],"defect":[80],"coverage,":[81],"one":[82,123],"must":[83],"use":[84],"below":[88],"2/spl":[89,118],"times/V/sub":[90,100,119],"T/.":[91],"In":[92],"experiments,":[94],"of":[98,129,149,154],"1.5/spl":[99],"T/":[101,120],"was":[102],"used":[103],"relaxed":[105],"timing.":[106],"makes":[108],"more":[111],"than":[112],"twice":[113],"as":[114],"sensitive":[115],"compared":[116],"and":[121],"allows":[122],"detect":[125],"resistance":[128],"five":[130],"times":[131],"detection":[133],"limit":[134],"nominal":[137],"even":[141],"these":[143],"settings":[144],"we":[145],"were":[146],"only":[147],"capable":[148],"small":[152],"fraction":[153],"anomalies.":[158],"Therefore":[159],"not":[162],"suited":[163]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}