{"id":"https://openalex.org/W2155976207","doi":"https://doi.org/10.1109/test.2002.1041835","title":"RTL level preparation of high-quality/low-energy/low-power BIST","display_name":"RTL level preparation of high-quality/low-energy/low-power BIST","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2155976207","doi":"https://doi.org/10.1109/test.2002.1041835","mag":"2155976207"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041835","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041835","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047445549","display_name":"Marcelino Santos","orcid":"https://orcid.org/0000-0002-2091-1165"},"institutions":[{"id":"https://openalex.org/I121345201","display_name":"Instituto de Engenharia de Sistemas e Computadores Investiga\u00e7\u00e3o e Desenvolvimento","ror":"https://ror.org/04mqy3p58","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I121345201","https://openalex.org/I4210125590"]}],"countries":["PT"],"is_corresponding":true,"raw_author_name":"M.B. Santos","raw_affiliation_strings":["IST, NESC-id, Lisboa, Portugal"],"affiliations":[{"raw_affiliation_string":"IST, NESC-id, Lisboa, Portugal","institution_ids":["https://openalex.org/I121345201"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039557784","display_name":"I.C. Teixeira","orcid":"https://orcid.org/0000-0002-2642-5619"},"institutions":[{"id":"https://openalex.org/I121345201","display_name":"Instituto de Engenharia de Sistemas e Computadores Investiga\u00e7\u00e3o e Desenvolvimento","ror":"https://ror.org/04mqy3p58","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I121345201","https://openalex.org/I4210125590"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"I.C. Teixeira","raw_affiliation_strings":["IST, NESC-id, Lisboa, Portugal"],"affiliations":[{"raw_affiliation_string":"IST, NESC-id, Lisboa, Portugal","institution_ids":["https://openalex.org/I121345201"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058862498","display_name":"J.P. Teixeira","orcid":"https://orcid.org/0000-0002-0379-6257"},"institutions":[{"id":"https://openalex.org/I121345201","display_name":"Instituto de Engenharia de Sistemas e Computadores Investiga\u00e7\u00e3o e Desenvolvimento","ror":"https://ror.org/04mqy3p58","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I121345201","https://openalex.org/I4210125590"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"J.P. Teixeira","raw_affiliation_strings":["IST, NESC-id, Lisboa, Portugal"],"affiliations":[{"raw_affiliation_string":"IST, NESC-id, Lisboa, Portugal","institution_ids":["https://openalex.org/I121345201"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076326268","display_name":"Salvador Manich","orcid":"https://orcid.org/0000-0001-5265-1209"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"S. Manich","raw_affiliation_strings":["University of Politecnica de Catalunya, Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"University of Politecnica de Catalunya, Barcelona, Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049713386","display_name":"Rosa Rodr\u00edguez","orcid":"https://orcid.org/0000-0002-4559-2332"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"R. Rodriguez","raw_affiliation_strings":["University of Politecnica de Catalunya, Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"University of Politecnica de Catalunya, Barcelona, Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012439108","display_name":"Joan Figueras","orcid":"https://orcid.org/0000-0003-4203-0788"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J. Figueras","raw_affiliation_strings":["University of Politecnica de Catalunya, Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"University of Politecnica de Catalunya, Barcelona, Spain","institution_ids":["https://openalex.org/I9617848"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5047445549"],"corresponding_institution_ids":["https://openalex.org/I121345201"],"apc_list":null,"apc_paid":null,"fwci":1.4855,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.83816651,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"814","last_page":"823"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.6192923188209534},{"id":"https://openalex.org/keywords/pseudorandom-number-generator","display_name":"Pseudorandom number generator","score":0.5941208004951477},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5642499327659607},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5506835579872131},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.5453105568885803},{"id":"https://openalex.org/keywords/overheating","display_name":"Overheating (electricity)","score":0.5002028942108154},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4989302158355713},{"id":"https://openalex.org/keywords/low-energy","display_name":"Low energy","score":0.4750773310661316},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.44923901557922363},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.444938987493515},{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.4352129101753235},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35456424951553345},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.32760506868362427},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.31517788767814636},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2604515254497528},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2537391185760498},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1138608455657959},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09723162651062012},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.07373946905136108}],"concepts":[{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.6192923188209534},{"id":"https://openalex.org/C140642157","wikidata":"https://www.wikidata.org/wiki/Q1623338","display_name":"Pseudorandom number generator","level":2,"score":0.5941208004951477},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5642499327659607},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5506835579872131},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.5453105568885803},{"id":"https://openalex.org/C2778284599","wikidata":"https://www.wikidata.org/wiki/Q25340000","display_name":"Overheating (electricity)","level":2,"score":0.5002028942108154},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4989302158355713},{"id":"https://openalex.org/C2989164559","wikidata":"https://www.wikidata.org/wiki/Q15637420","display_name":"Low energy","level":2,"score":0.4750773310661316},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.44923901557922363},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.444938987493515},{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.4352129101753235},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35456424951553345},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32760506868362427},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.31517788767814636},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2604515254497528},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2537391185760498},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1138608455657959},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09723162651062012},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.07373946905136108},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2002.1041835","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041835","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.1.2970","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.1.2970","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://tahoe.inesc-id.pt/pt/Ficheiros/30.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8299999833106995,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1511688816","https://openalex.org/W1791686945","https://openalex.org/W1942759344","https://openalex.org/W1997182928","https://openalex.org/W2039507354","https://openalex.org/W2071864943","https://openalex.org/W2097208101","https://openalex.org/W2104052281","https://openalex.org/W2104478015","https://openalex.org/W2109172132","https://openalex.org/W2114980975","https://openalex.org/W2117041728","https://openalex.org/W2119000563","https://openalex.org/W2123535960","https://openalex.org/W2126641963","https://openalex.org/W2129327148","https://openalex.org/W2131807865","https://openalex.org/W2133762912","https://openalex.org/W2133867898","https://openalex.org/W2136204789","https://openalex.org/W2137045371","https://openalex.org/W2138549077","https://openalex.org/W2141624450","https://openalex.org/W2142304312","https://openalex.org/W2149690470","https://openalex.org/W2163881957","https://openalex.org/W2170510802","https://openalex.org/W2537440096","https://openalex.org/W2888824071","https://openalex.org/W3015409429","https://openalex.org/W4230343699","https://openalex.org/W4234587501","https://openalex.org/W4238120669","https://openalex.org/W6630623413","https://openalex.org/W6680193361"],"related_works":["https://openalex.org/W2523211787","https://openalex.org/W1600807921","https://openalex.org/W4288754393","https://openalex.org/W2139955070","https://openalex.org/W2129499974","https://openalex.org/W2071456813","https://openalex.org/W2786267147","https://openalex.org/W2119351822","https://openalex.org/W1540713932","https://openalex.org/W2154529098"],"abstract_inverted_index":{"While":[0],"high-quality":[1],"BIST":[2,17,75],"(built-in":[3],"self":[4],"test)":[5],"based":[6,16],"on":[7],"deterministic":[8],"vectors":[9,90],"often":[10],"has":[11],"a":[12,58],"prohibitive":[13],"cost,":[14],"pseudorandom":[15],"may":[18],"lead":[19,100],"to":[20,41,55,71,101,110,139],"low":[21],"DC":[22,103,130],"(defect":[23],"coverage)":[24],"values,":[25],"requiring":[26],"however":[27],"very":[28],"long":[29],"test":[30,47,65,78,89,117,141],"sequences":[31],"with":[32,132],"the":[33,84,112,116,125,146,151,158],"corresponding":[34],"energy":[35],"waste":[36],"and":[37,134,160],"possible":[38],"overheating":[39],"due":[40],"extra":[42],"switching":[43],"activity":[44],"caused":[45],"by":[46],"vectors.":[48],"The":[49,143],"purpose":[50],"of":[51,86,97,115,145,157],"this":[52],"paper":[53],"is":[54,80,108,122,148],"discuss":[56],"how":[57],"recently":[59],"proposed":[60,109,126],"RTL":[61,77,98,119],"(register":[62],"transfer":[63],"level)":[64],"preparation":[66],"methodology":[67,147],"can":[68],"be":[69],"reused":[70],"drive":[72],"innovative,":[73],"high-quality/low-energy/low-power":[74],"solutions.":[76],"generation":[79],"carried":[81],"out":[82],"through":[83],"definition":[85],"partially":[87],"defined":[88],"(masks)":[91],"that,":[92],"while":[93],"targeting":[94],"multiple":[95],"detection":[96],"faults":[99],"high":[102],"values.":[104],"An":[105],"energy/power":[106,113],"model":[107],"optimize":[111],"consumption":[114],"at":[118],"level.":[120],"It":[121],"shown":[123],"that":[124],"method":[127],"achieves":[128],"better":[129],"values":[131],"low-energy":[133],"low-power":[135],"consumption,":[136],"when":[137],"compared":[138],"pseudo-random":[140],"excitation.":[142],"usefulness":[144],"ascertained":[149],"using":[150],"VERIDOS":[152],"simulation":[153],"environment":[154],"in":[155],"modules":[156],"CMUDSP":[159],"TORCH":[161],"ITC'99":[162],"benchmark":[163],"circuits.":[164]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}