{"id":"https://openalex.org/W1881765175","doi":"https://doi.org/10.1109/test.2002.1041817","title":"The manic depression of microprocessor debug","display_name":"The manic depression of microprocessor debug","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W1881765175","doi":"https://doi.org/10.1109/test.2002.1041817","mag":"1881765175"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041817","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041817","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052212619","display_name":"D. Josephson","orcid":null},"institutions":[{"id":"https://openalex.org/I1324840837","display_name":"Hewlett-Packard (United States)","ror":"https://ror.org/059rn9488","country_code":"US","type":"company","lineage":["https://openalex.org/I1324840837"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"D.D. Josephson","raw_affiliation_strings":["Hewlett Packard Company, Fort Collins, CO, USA","Hewlett Packard Co., Fort Collins, CO, USA"],"affiliations":[{"raw_affiliation_string":"Hewlett Packard Company, Fort Collins, CO, USA","institution_ids":["https://openalex.org/I1324840837"]},{"raw_affiliation_string":"Hewlett Packard Co., Fort Collins, CO, USA","institution_ids":["https://openalex.org/I1324840837"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5052212619"],"corresponding_institution_ids":["https://openalex.org/I1324840837"],"apc_list":null,"apc_paid":null,"fwci":3.1295,"has_fulltext":false,"cited_by_count":61,"citation_normalized_percentile":{"value":0.91107752,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"657","last_page":"663"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9847999811172485,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.951890230178833},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.8542377948760986},{"id":"https://openalex.org/keywords/background-debug-mode-interface","display_name":"Background debug mode interface","score":0.8084158897399902},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6858524680137634},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.56219482421875},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5202430486679077},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.4020555019378662}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.951890230178833},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.8542377948760986},{"id":"https://openalex.org/C124774103","wikidata":"https://www.wikidata.org/wiki/Q4839640","display_name":"Background debug mode interface","level":3,"score":0.8084158897399902},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6858524680137634},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.56219482421875},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5202430486679077},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.4020555019378662}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041817","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041817","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5600000023841858,"id":"https://metadata.un.org/sdg/8","display_name":"Decent work and economic growth"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1535528029","https://openalex.org/W2062190897","https://openalex.org/W2127795505","https://openalex.org/W2138551793","https://openalex.org/W2145314233","https://openalex.org/W6680258219"],"related_works":["https://openalex.org/W2361273971","https://openalex.org/W2385068581","https://openalex.org/W2381166695","https://openalex.org/W4241045879","https://openalex.org/W2366346238","https://openalex.org/W2351581202","https://openalex.org/W2978026406","https://openalex.org/W2366922255","https://openalex.org/W2399091034","https://openalex.org/W1999657508"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"the":[3,23,32,54],"sometimes":[4,6],"exhilarating,":[5],"depressing,":[7],"and":[8,26,37,40],"always":[9],"challenging":[10],"job":[11],"of":[12,20,34,44,53],"leading-edge":[13],"microprocessor":[14,58],"debug.":[15],"It":[16],"covers":[17],"an":[18],"overview":[19],"processor":[21],"debug,":[22,31],"flows,":[24],"tools":[25],"methods":[27],"used":[28],"to":[29],"perform":[30],"process":[33],"\"root":[35],"causing\"":[36],"fixing":[38],"bugs,":[39],"includes":[41],"case":[42],"studies":[43],"actual":[45],"bugs":[46],"from":[47],"recent":[48],"processors.":[49],"In":[50],"conclusion,":[51],"some":[52],"future":[55],"challenges":[56],"for":[57],"testing":[59],"are":[60],"presented.":[61]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}