{"id":"https://openalex.org/W2122759143","doi":"https://doi.org/10.1109/test.2002.1041799","title":"On-line testing of multi-source noise-induced errors on the interconnects and buses of system-on-chips","display_name":"On-line testing of multi-source noise-induced errors on the interconnects and buses of system-on-chips","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2122759143","doi":"https://doi.org/10.1109/test.2002.1041799","mag":"2122759143"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041799","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041799","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037994687","display_name":"Zhao Yi","orcid":"https://orcid.org/0000-0002-0723-2301"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Yi Zhao","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of California, San Diego, CA, USA","Dept of Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]},{"raw_affiliation_string":"Dept of Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100379207","display_name":"Li Chen","orcid":"https://orcid.org/0000-0002-0582-1903"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Li Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of California, San Diego, CA, USA","Dept of Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]},{"raw_affiliation_string":"Dept of Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025308099","display_name":"S. Dey","orcid":null},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Dey","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of California, San Diego, CA, USA","Dept of Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]},{"raw_affiliation_string":"Dept of Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5037994687"],"corresponding_institution_ids":["https://openalex.org/I36258959"],"apc_list":null,"apc_paid":null,"fwci":2.0863,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.87460842,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"491","last_page":"499"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.7462603449821472},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6454835534095764},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5390199422836304},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.5302757024765015},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5225443243980408},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.515487015247345},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.43284353613853455},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3318623900413513},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.32048726081848145},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24441391229629517},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.22212734818458557},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12052136659622192},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09290260076522827}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.7462603449821472},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6454835534095764},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5390199422836304},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.5302757024765015},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5225443243980408},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.515487015247345},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.43284353613853455},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3318623900413513},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.32048726081848145},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24441391229629517},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.22212734818458557},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12052136659622192},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09290260076522827},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041799","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041799","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1502477161","https://openalex.org/W1541483005","https://openalex.org/W1544623790","https://openalex.org/W1930731203","https://openalex.org/W2013185880","https://openalex.org/W2066910438","https://openalex.org/W2070061538","https://openalex.org/W2090178447","https://openalex.org/W2100783269","https://openalex.org/W2121190650","https://openalex.org/W2150153665","https://openalex.org/W2153186550","https://openalex.org/W2165165066","https://openalex.org/W2165437459","https://openalex.org/W2168926101","https://openalex.org/W4229966209","https://openalex.org/W4242674290","https://openalex.org/W4245684140","https://openalex.org/W6675620916"],"related_works":["https://openalex.org/W2317123011","https://openalex.org/W2036193034","https://openalex.org/W2015460441","https://openalex.org/W2037330166","https://openalex.org/W1995066794","https://openalex.org/W916489235","https://openalex.org/W2090256089","https://openalex.org/W2065289416","https://openalex.org/W2115579119","https://openalex.org/W2017236304"],"abstract_inverted_index":{"With":[0],"processors":[1],"and":[2,9,18,48,68,107,157],"system-on-chips":[3],"using":[4],"nano-meter":[5],"technologies,":[6],"several":[7],"design":[8,141],"test":[10,19,92],"efforts":[11],"have":[12],"been":[13,112],"recently":[14],"developed":[15,113],"to":[16,45,74,91,114],"eliminate":[17],"for":[20,71,93,118,150],"many":[21],"emerging":[22],"DSM":[23,41],"(deep":[24],"sub-micron)":[25],"noise":[26,37,42,55,77,95],"effects.":[27],"In":[28],"this":[29,125],"paper,":[30],"we":[31],"show":[32,61],"the":[33,62,69,102,131,143,146],"emergence":[34],"of":[35,65,124,145],"multi-source":[36,66,151],"effects,":[38],"where":[39],"multiple":[40],"sources":[43],"combine":[44],"produce":[46],"functional":[47],"timing":[49],"errors":[50,153],"even":[51],"when":[52],"each":[53],"separate":[54],"source":[56],"itself":[57],"does":[58],"not.":[59],"We":[60,79],"dynamic":[63],"nature":[64],"noise,":[67],"need":[70],"on-line":[72,87,132],"testing":[73,109,117,148],"detect":[75],"such":[76,94],"errors.":[78],"propose":[80],"a":[81,136],"double-sampling":[82],"data":[83],"checking":[84],"based":[85],"low-cost":[86],"error":[88],"detection":[89,133],"circuit":[90,134],"effects":[96],"in":[97,135,154],"on-chip":[98,120],"buses.":[99,121,158],"Based":[100],"on":[101],"proposed":[103,147],"circuit,":[104],"an":[105],"effective":[106],"efficient":[108],"methodology":[110,126,149],"has":[111],"facilitate":[115],"online":[116],"generic":[119],"The":[122,139],"applicability":[123],"is":[127],"demonstrated":[128],"through":[129],"embedding":[130],"bus":[137],"design.":[138],"validated":[140],"shows":[142],"effectiveness":[144],"noise-induced":[152],"global":[155],"interconnects":[156]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}