{"id":"https://openalex.org/W2149678113","doi":"https://doi.org/10.1109/test.2002.1041786","title":"Analysis of delay test effectiveness with a multiple-clock scheme","display_name":"Analysis of delay test effectiveness with a multiple-clock scheme","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2149678113","doi":"https://doi.org/10.1109/test.2002.1041786","mag":"2149678113"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041786","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041786","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110204273","display_name":"Jing-Jia Liou","orcid":null},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Jing-Jia Liou","raw_affiliation_strings":["Department of ECE, University of California,\uc2a0Santa Barbara, Santa Barbara, USA"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of California,\uc2a0Santa Barbara, Santa Barbara, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100369642","display_name":"Li-C. Wang","orcid":"https://orcid.org/0000-0003-4851-8004"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L.-C. Wang","raw_affiliation_strings":["Department of ECE, University of California,\uc2a0Santa Barbara, Santa Barbara, USA"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of California,\uc2a0Santa Barbara, Santa Barbara, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077687075","display_name":"Kwang\u2010Ting Cheng","orcid":"https://orcid.org/0000-0002-3885-4912"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kwang-Ting Cheng","raw_affiliation_strings":["Department of ECE, University of California,\uc2a0Santa Barbara, Santa Barbara, USA"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of California,\uc2a0Santa Barbara, Santa Barbara, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044465911","display_name":"Jennifer Dworak","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Dworak","raw_affiliation_strings":["Department of EE, Texas A and M University, USA"],"affiliations":[{"raw_affiliation_string":"Department of EE, Texas A and M University, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023642611","display_name":"M.R. Mercer","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.R. Mercer","raw_affiliation_strings":["Department of EE, Texas A and M University, USA"],"affiliations":[{"raw_affiliation_string":"Department of EE, Texas A and M University, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113108497","display_name":"R. Kapur","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"R. Kapur","raw_affiliation_strings":["Synopsys Inc"],"affiliations":[{"raw_affiliation_string":"Synopsys Inc","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109761500","display_name":"T.W. Williams","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"T.W. Williams","raw_affiliation_strings":["Synopsys Inc"],"affiliations":[{"raw_affiliation_string":"Synopsys Inc","institution_ids":["https://openalex.org/I1335490905"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5110204273"],"corresponding_institution_ids":["https://openalex.org/I154570441"],"apc_list":null,"apc_paid":null,"fwci":0.9904,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.77661366,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"407","last_page":"416"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6039297580718994},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5829663872718811},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.5006833076477051},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.4826089143753052},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.4789162874221802},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4777764081954956},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.44755131006240845},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.4460684061050415},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.361491322517395},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2523770332336426},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.17650353908538818},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09311401844024658}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6039297580718994},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5829663872718811},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.5006833076477051},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.4826089143753052},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.4789162874221802},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4777764081954956},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.44755131006240845},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.4460684061050415},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.361491322517395},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2523770332336426},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.17650353908538818},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09311401844024658},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/test.2002.1041786","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041786","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.104.1234","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.104.1234","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.gigascale.org/pubs/212/itc02_1.pdf","raw_type":"text"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-77798","is_oa":false,"landing_page_url":"http://repository.hkust.edu.hk/ir/Record/1783.1-77798","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference paper"},{"id":"pmh:oai:repository.ust.hk:1783.1-77798","is_oa":false,"landing_page_url":"http://repository.ust.hk/ir/Record/1783.1-77798","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference paper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W163757519","https://openalex.org/W1568258340","https://openalex.org/W1583304273","https://openalex.org/W1823801491","https://openalex.org/W1957706211","https://openalex.org/W1985476435","https://openalex.org/W2014484422","https://openalex.org/W2043411903","https://openalex.org/W2098598480","https://openalex.org/W2108812492","https://openalex.org/W2111670167","https://openalex.org/W2116391920","https://openalex.org/W2127676287","https://openalex.org/W2129212061","https://openalex.org/W2139496816","https://openalex.org/W2147973376","https://openalex.org/W2149342513","https://openalex.org/W2543989790","https://openalex.org/W3148660165","https://openalex.org/W4230592135","https://openalex.org/W4236674018","https://openalex.org/W4242308193","https://openalex.org/W4256080835","https://openalex.org/W6638244836","https://openalex.org/W6793581205","https://openalex.org/W7111183471"],"related_works":["https://openalex.org/W2110367374","https://openalex.org/W3151506308","https://openalex.org/W1975289146","https://openalex.org/W2105887828","https://openalex.org/W2794688131","https://openalex.org/W2122599759","https://openalex.org/W2136310485","https://openalex.org/W4236520801","https://openalex.org/W4229446324","https://openalex.org/W2014777185"],"abstract_inverted_index":{"In":[0,130],"conventional":[1],"delay":[2,12,81,109,140,172,175],"testing,":[3],"two":[4,53],"types":[5],"of":[6,39,79,107,121,137,148,162],"tests,":[7,13],"transition":[8],"tests":[9],"and":[10,73,114,151,160,167,174],"path":[11],"are":[14,58],"often":[15],"considered.":[16],"The":[17,52],"test":[18,41,46,61,66,71,102,110,141],"clock":[19,50,86],"frequency":[20],"is":[21],"usually":[22],"set":[23,78],"to":[24,30,92,145,152],"a":[25,69,76,83,170],"single":[26,70],"pre-determined":[27],"parameter":[28],"equal":[29],"the":[31,37,104,119,123,135,158],"system":[32],"clock.":[33],"This":[34],"paper":[35],"discusses":[36],"potential":[38],"enhancing":[40],"effectiveness":[42,91],"by":[43,99,115],"using":[44,100,116,169],"multiple":[45,49,60,101],"sets":[47,62,126,150],"with":[48,143],"frequencies.":[51],"intuitions":[54],"motivating":[55],"our":[56],"analysis":[57,166],"1)":[59],"can":[63,111,127],"deliver":[64],"higher":[65,90],"quality":[67,106],"than":[68],"set,":[72],"2)":[74],"for":[75],"given":[77],"AC":[80,108],"patterns,":[82],"carefully-selected,":[84],"tighter":[85],"would":[87],"result":[88],"in":[89],"screen":[93],"out":[94],"potentially":[95],"defective":[96],"chips.":[97],"Hence,":[98],"sets,":[103],"overall":[105],"be":[112,128],"enhanced,":[113],"multiple-clock":[117,163],"schemes":[118,164],"cost":[120],"adding":[122],"additional":[124],"pattern":[125,149],"minimized.":[129],"this":[131,138],"paper,":[132],"we":[133],"analyze":[134],"feasibility":[136],"new":[139],"methodology":[142],"respect":[144],"different":[146,153],"combinations":[147],"circuit":[154],"characteristics.":[155],"We":[156],"discuss":[157],"pros":[159],"cons":[161],"through":[165],"experiments":[168],"statistical":[171],"evaluation":[173],"defect-injected":[176],"framework.":[177]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}